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High Resolution X Ray Diffraction And Topography


High Resolution X Ray Diffraction And Topography
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High Resolution X Ray Diffractometry And Topography


High Resolution X Ray Diffractometry And Topography
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Author : D.K. Bowen
language : en
Publisher: CRC Press
Release Date : 1998-02-05

High Resolution X Ray Diffractometry And Topography written by D.K. Bowen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-02-05 with Technology & Engineering categories.


The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization



High Resolution X Ray Diffraction And Topography


High Resolution X Ray Diffraction And Topography
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Author : J. Gronkowski
language : en
Publisher:
Release Date : 2001

High Resolution X Ray Diffraction And Topography written by J. Gronkowski and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.




High Resolution X Ray Diffraction And Topography


High Resolution X Ray Diffraction And Topography
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Author : Brian Keith Tanner
language : en
Publisher:
Release Date : 1999

High Resolution X Ray Diffraction And Topography written by Brian Keith Tanner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.




Special Issue On High Resolution X Ray Diffraction And Topography


Special Issue On High Resolution X Ray Diffraction And Topography
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Author : Conference on High Resolution X-Ray Diffraction and Topography. 5, 2000, Ustroń
language : en
Publisher:
Release Date : 2001

Special Issue On High Resolution X Ray Diffraction And Topography written by Conference on High Resolution X-Ray Diffraction and Topography. 5, 2000, Ustroń and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.




High Resolution X Ray Diffraction And Topography For The Characterization Of Advanced Materials


High Resolution X Ray Diffraction And Topography For The Characterization Of Advanced Materials
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Author : Brian Keith Tanner
language : en
Publisher:
Release Date : 2001

High Resolution X Ray Diffraction And Topography For The Characterization Of Advanced Materials written by Brian Keith Tanner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Materials categories.




European Symposium On X Ray Topography And High Resolution Diffraction 2nd Held In Berlin Germany On 5 7 September 1994 Programme And Abstracts


European Symposium On X Ray Topography And High Resolution Diffraction 2nd Held In Berlin Germany On 5 7 September 1994 Programme And Abstracts
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Author :
language : en
Publisher:
Release Date : 1994

European Symposium On X Ray Topography And High Resolution Diffraction 2nd Held In Berlin Germany On 5 7 September 1994 Programme And Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.


Partial Contents: Early experimental proofs of the dynamical theory; Topography in magnetism: domain and phase transition investigations; Diffraction topographic investigations of crystals under applied electric fields; Dependence of defect arrangement in crystals on surface morphology and on conditions of growth from solution; Interaction of slip bands with grain boundaries - observation by white beam SR topography; In-situ X-ray topography studies during the MBE growth process of InGaAs strained layers; Double- and triple-crystal X- ray diffraction analysis of semiconductor quantum wires; Applications in multiple crystal diffractometry; Interpretation of the diffraction profile resulting from strain relaxation in epilayers; Study of thin buried interfaces in III-V compound hetero-structures by high resolution X-ray diffraction.



X Ray And Neutron Dynamical Diffraction


X Ray And Neutron Dynamical Diffraction
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Author : André Authier
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

X Ray And Neutron Dynamical Diffraction written by André Authier and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.


This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.



3rd European Symposium On X Ray Topography And High Resolution X Ray Diffraction X Top 96


3rd European Symposium On X Ray Topography And High Resolution X Ray Diffraction X Top 96
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Author :
language : en
Publisher:
Release Date : 1997

3rd European Symposium On X Ray Topography And High Resolution X Ray Diffraction X Top 96 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with categories.




X Ray Topography And Crystal Characterization


X Ray Topography And Crystal Characterization
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Author : David Keith Bowen
language : en
Publisher:
Release Date : 1999

X Ray Topography And Crystal Characterization written by David Keith Bowen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with X-ray crystallography categories.




X Ray Topography And High Resolution Diffraction


X Ray Topography And High Resolution Diffraction
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Author : Rainer Köhler
language : en
Publisher:
Release Date : 1995

X Ray Topography And High Resolution Diffraction written by Rainer Köhler and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with categories.