X Ray Topography And Crystal Characterization

DOWNLOAD

Download X Ray Topography And Crystal Characterization PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get X Ray Topography And Crystal Characterization book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page

X Ray Topography And Crystal Characterization

DOWNLOAD
Author : David Keith Bowen
language : en
Publisher:
Release Date : 1999

X Ray Topography And Crystal Characterization written by David Keith Bowen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with X-ray crystallography categories.

Characterization Of Crystal Growth Defects By X Ray Methods

DOWNLOAD
Author : B.K. Tanner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.

This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

X Ray Diffraction Topography

DOWNLOAD
Author : B. K. Tanner
language : en
Publisher: Elsevier
Release Date : 2013-10-22

X Ray Diffraction Topography written by B. K. Tanner and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.

X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.

Structural Characterization Of Doped Gasb Single Crystals By X Ray Topography

DOWNLOAD
Author :
language : en
Publisher:
Release Date : 2009

Structural Characterization Of Doped Gasb Single Crystals By X Ray Topography written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with categories.

We characterized GaSb single crystals containing different dopants (Al, Cd and Te), grown by the Czochralski method, by x-ray topography and high angular resolution x-ray diffraction. Lang topography revealed dislocations parallel and perpendicular to the crystal's surface. Double-crystal GaSb 333 x-ray topography shows dislocations and vertical stripes than can be associated with circular growth bands. We compared our high-angular resolution x-ray diffraction measurements (rocking curves) with the findings predicted by the dynamical theory of x-ray diffraction. These measurements show that our GaSb single crystals have a relative variation in the lattice parameter ([Delta]d/d) on the order of 10−5. This means that they can be used as electronic devices (detectors, for example) and as x-ray monochromators.

Characterization Of Crystal Growth Defects By X Ray Methods

DOWNLOAD
Author : B.K. Tanner
language : en
Publisher: Springer
Release Date : 1981-01-01

Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981-01-01 with Science categories.

This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

High Resolution X Ray Diffractometry And Topography

DOWNLOAD
Author : D.K. Bowen
language : en
Publisher: CRC Press
Release Date : 1998-02-05

High Resolution X Ray Diffractometry And Topography written by D.K. Bowen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-02-05 with Technology & Engineering categories.

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

White Beam Synchrotron X Ray Topography And Micro Raman Spectroscopy Characterization Of Crystal Materials

DOWNLOAD
Author : Weimin Chen
language : en
Publisher:
Release Date : 2003

White Beam Synchrotron X Ray Topography And Micro Raman Spectroscopy Characterization Of Crystal Materials written by Weimin Chen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Crystals categories.

Defect Characterization And Stress Analysis By White Beam Synchrotron X Ray Topography In Single Crystal Semiconducting Materials

DOWNLOAD
Author : Vishwanath Sarkar
language : en
Publisher:
Release Date : 2011

Defect Characterization And Stress Analysis By White Beam Synchrotron X Ray Topography In Single Crystal Semiconducting Materials written by Vishwanath Sarkar and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Materials science categories.

X Ray Diffraction

DOWNLOAD
Author : S. K. CHATTERJEE
language : en
Publisher: PHI Learning Pvt. Ltd.
Release Date : 2010-09-27

X Ray Diffraction written by S. K. CHATTERJEE and has been published by PHI Learning Pvt. Ltd. this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-27 with Science categories.

Designed for the undergraduate and postgraduate students of physics, materials science and metallurgical engineering, this text explains the theory of X-ray diffraction starting from diffraction by an electron to that by an atom, a crystal, and finally ending with a diffraction by a conglomerate of atoms either in the single crystal or in the polycrystal stage. This Second Edition of the book includes a new chapter on Electron Diffraction as electron diffraction along with X-ray diffraction are complementary to each other and are also included in the curriculum. The book amply blends the theory with major applications of X-ray diffraction, including those of direct analysis of lattice defects by X-ray topography, orientation texture analysis, chemical analysis by diffraction as well as by fluorescence. KEY FEATURES : Set of numerical problems along with solutions Details of some different experimental techniques Unsolved problems and Review Questions to grasp the concepts.

Applications Of X Ray Topographic Methods To Materials Science

DOWNLOAD
Author : Sigmund Weissmann
language : en
Publisher: Springer
Release Date : 1984-12

Applications Of X Ray Topographic Methods To Materials Science written by Sigmund Weissmann and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984-12 with Technology & Engineering categories.