Applications Of X Ray Topographic Methods To Materials Science
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Applications Of X Ray Topographic Methods To Materials Science
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Author : Sigmund Weissmann
language : en
Publisher: Springer
Release Date : 1984-12
Applications Of X Ray Topographic Methods To Materials Science written by Sigmund Weissmann and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984-12 with Technology & Engineering categories.
Applications Of X Ray Topographic Methods To Materials Science
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Author :
language : en
Publisher:
Release Date : 1984
Applications Of X Ray Topographic Methods To Materials Science written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with categories.
Applications Of X Ray Topographic Methods To Materials Science
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Author : Sigmund Weissmann
language : en
Publisher: Springer
Release Date : 1984-12
Applications Of X Ray Topographic Methods To Materials Science written by Sigmund Weissmann and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984-12 with Science categories.
Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
X Ray Diffraction Topography
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Author : B. K. Tanner
language : en
Publisher: Elsevier
Release Date : 2013-10-22
X Ray Diffraction Topography written by B. K. Tanner and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
X Ray Characterization Of Materials
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Author : Eric Lifshin
language : en
Publisher: John Wiley & Sons
Release Date : 2008-07-11
X Ray Characterization Of Materials written by Eric Lifshin and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-07-11 with Technology & Engineering categories.
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Research Report
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Author : Rutgers University. Bureau of Engineering Research
language : en
Publisher:
Release Date : 1985
Research Report written by Rutgers University. Bureau of Engineering Research and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Engineering categories.
Applications Of Synchrotron Radiation Techniques To Materials Science
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Author :
language : en
Publisher:
Release Date : 1998
Applications Of Synchrotron Radiation Techniques To Materials Science written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Materials categories.
Applications Of Synchrotron Radiation Techniques To Materials Science Iv Volume 524
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Author : Susan M. Mini
language : en
Publisher:
Release Date : 1998-08-17
Applications Of Synchrotron Radiation Techniques To Materials Science Iv Volume 524 written by Susan M. Mini and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-08-17 with Technology & Engineering categories.
The 57 papers update the status of characterization techniques that use synchrotron radiation since the previous symposium on the subject in the spring of 1996. The techniques considered include X-ray absorption and scattering, imaging, tomography, microscopy, and topographic methods. Among the materials are surfaces, interfaces, electronic materials, metal oxides, solar cells, thin films, carbides, polymers, alloys, nanoparticles, and graphitic materials. Some of the papers are doubled spaced. Annotation copyrighted by Book News, Inc., Portland, OR
Dynamical Theory Of X Ray Diffraction
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Author : André Authier
language : en
Publisher: Oxford University Press, USA
Release Date : 2004
Dynamical Theory Of X Ray Diffraction written by André Authier and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Science categories.
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