Diffraction And Imaging Techniques In Material Science P2
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Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Diffraction And Imaging Techniques In Material Science P1
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Diffraction And Imaging Techniques In Material Science P1 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.
Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques
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Author : Severin Amelinckx
language : en
Publisher:
Release Date : 1978
Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques written by Severin Amelinckx and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Electron microscopy categories.
Diffraction And Imaging Techniques In Material Science
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Author : R. Gevers
language : en
Publisher: North Holland
Release Date : 1978
Diffraction And Imaging Techniques In Material Science written by R. Gevers and has been published by North Holland this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Technology & Engineering categories.
Modern Diffraction And Imaging Techniques In Material Science
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Author : Severin Amelinckx
language : en
Publisher:
Release Date : 1970
Modern Diffraction And Imaging Techniques In Material Science written by Severin Amelinckx and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970 with Crystals categories.
Real Time Radiologic Imaging
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Author : D. A. Garrett
language : en
Publisher: ASTM International
Release Date : 1980
Real Time Radiologic Imaging written by D. A. Garrett and has been published by ASTM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Imaging systems categories.
Characterization Of Solid Surfaces
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Author : Philip F. Kane
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-27
Characterization Of Solid Surfaces written by Philip F. Kane and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-27 with Technology & Engineering categories.
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Publications Of The National Institute Of Standards And Technology Catalog
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Author : National Institute of Standards and Technology (U.S.)
language : en
Publisher:
Release Date : 1987
Publications Of The National Institute Of Standards And Technology Catalog written by National Institute of Standards and Technology (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with categories.
International Tables For Crystallography Volume B
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Author : U. Shmueli
language : en
Publisher: John Wiley & Sons
Release Date : 2008-08-25
International Tables For Crystallography Volume B written by U. Shmueli and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-08-25 with Science categories.
International Tables for Crystallography is the definitive resource and reference work for crystallography and structural science. Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. This volume is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature. New to this edition: A new chapter on modern extensions of the Ewald method for Coulomb interactions in crystals. Three new sections on electron diffraction and electron microscopy in structure determination, describing point-group and space-group determination by convergent-beam electron diffraction, three-dimensional reconstruction, and single-particle reconstruction. Substantial revisions to the chapters on space-group representations in reciprocal space, direct methods, Patterson and molecular replacement techniques, and disorder diffuse scattering More information on the series can be found at: http://it.iucr.org
Publications Of The National Bureau Of Standards 1986 Catalog
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1987
Publications Of The National Bureau Of Standards 1986 Catalog written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Government publications categories.