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Diffraction And Imaging Techniques In Material Science


Diffraction And Imaging Techniques In Material Science
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Diffraction And Imaging Techniques In Material Science P1


Diffraction And Imaging Techniques In Material Science P1
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Diffraction And Imaging Techniques In Material Science P1 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.


Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.



Diffraction And Imaging Techniques In Material Science P2


Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.


Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.



Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques


Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques
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Author : Severin Amelinckx
language : en
Publisher:
Release Date : 1978

Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques written by Severin Amelinckx and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Electron microscopy categories.




Diffraction And Imaging Techniques In Material Science


Diffraction And Imaging Techniques In Material Science
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Author :
language : en
Publisher:
Release Date : 1978

Diffraction And Imaging Techniques In Material Science written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Diffraction categories.




Modern Diffraction And Imaging Techniques In Material Science


Modern Diffraction And Imaging Techniques In Material Science
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Author : Severin Amelinckx
language : en
Publisher:
Release Date : 1970

Modern Diffraction And Imaging Techniques In Material Science written by Severin Amelinckx and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970 with Crystals categories.




Transmission Electron Microscopy And Diffractometry Of Materials


Transmission Electron Microscopy And Diffractometry Of Materials
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Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-14

Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-14 with Science categories.


This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.



Advanced Transmission Electron Microscopy


Advanced Transmission Electron Microscopy
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Author : Jian Min Zuo
language : en
Publisher: Springer
Release Date : 2016-10-26

Advanced Transmission Electron Microscopy written by Jian Min Zuo and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-10-26 with Technology & Engineering categories.


This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.



Diffraction And Imaging Techniques In Material Science


Diffraction And Imaging Techniques In Material Science
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Author :
language : en
Publisher:
Release Date : 1978

Diffraction And Imaging Techniques In Material Science written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Diffraction categories.




Treatise On Materials Science And Technology


Treatise On Materials Science And Technology
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Author : Herbert Herman
language : en
Publisher: Elsevier
Release Date : 2013-10-22

Treatise On Materials Science And Technology written by Herbert Herman and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Technology & Engineering categories.


Treatise on Materials Science and Technology, Volume 4 covers the fundamental properties and characterization of materials, ranging from simple solids to complex heterophase systems. The book covers articles on advanced techniques by which thin films may be characterized; on diffusion in substitutional alloys; and on solid solution strengthening in face-centered cubic alloys. The text also includes articles on the thermodynamics of binary ordered intermetallic phases; and the major aspects of metal powder processing. Professional scientists and engineers, as well as graduate students in materials science and associated fields will find the book invaluable.



Materials Characterization Using Nondestructive Evaluation Nde Methods


Materials Characterization Using Nondestructive Evaluation Nde Methods
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Author : Gerhard Huebschen
language : en
Publisher: Woodhead Publishing
Release Date : 2016-03-23

Materials Characterization Using Nondestructive Evaluation Nde Methods written by Gerhard Huebschen and has been published by Woodhead Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-03-23 with Technology & Engineering categories.


Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials