Transmission Electron Microscopy And Diffractometry Of Materials

DOWNLOAD

Download Transmission Electron Microscopy And Diffractometry Of Materials PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Transmission Electron Microscopy And Diffractometry Of Materials book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page

Transmission Electron Microscopy And Diffractometry Of Materials

DOWNLOAD
Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-14

Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-14 with Science categories.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Transmission Electron Microscopy And Diffractometry Of Materials

DOWNLOAD
Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-13

Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-13 with Science categories.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Introduction To Conventional Transmission Electron Microscopy

DOWNLOAD
Author : Marc De Graef
language : en
Publisher: Cambridge University Press
Release Date : 2003-03-27

Introduction To Conventional Transmission Electron Microscopy written by Marc De Graef and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-03-27 with Science categories.

A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

Transmission Electron Microscopy

DOWNLOAD
Author : C. Barry Carter
language : en
Publisher: Springer
Release Date : 2016-08-24

Transmission Electron Microscopy written by C. Barry Carter and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-24 with Technology & Engineering categories.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Transmission Electron Microscopy

DOWNLOAD
Author : David Bernard Williams
language : en
Publisher: Taylor & Francis US
Release Date : 1996

Transmission Electron Microscopy written by David Bernard Williams and has been published by Taylor & Francis US this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Science categories.

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Transmission Electron Microscopy And Diffractometry Of Materials

DOWNLOAD
Author : Brent Fultz
language : en
Publisher:
Release Date : 2014-01-15

Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.

Field Emission Scanning Electron Microscopy

DOWNLOAD
Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25

Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Aberration Corrected Analytical Transmission Electron Microscopy

DOWNLOAD
Author : Rik Brydson
language : en
Publisher: John Wiley & Sons
Release Date : 2011-08-02

Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-02 with Science categories.

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Materials Characterization

DOWNLOAD
Author : Yang Leng
language : en
Publisher: John Wiley & Sons
Release Date : 2008-06-02

Materials Characterization written by Yang Leng and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-06-02 with Science categories.

Part One - Microstructure Examinations Light microscopy X-ray diffraction Transmission electron microscopy Scanning electron microscopy Scanning probe microscopy Part Two--Chemical and Thermal Analysis X-Ray Spectroscopy for Elemental Analysis Electron Spectroscopy for Surface Analysis Secondary Ion Mass Spectrometry for Surface Analysis Vibrational Spectroscopy for Molecular Analysis Thermal analysis.

Scanning Microscopy For Nanotechnology

DOWNLOAD
Author : Weilie Zhou
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-03-09

Scanning Microscopy For Nanotechnology written by Weilie Zhou and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-03-09 with Technology & Engineering categories.

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.