Materials Characterization
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Materials Characterization
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Author : Yang Leng
language : en
Publisher: John Wiley & Sons
Release Date : 2008-06-02
Materials Characterization written by Yang Leng and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-06-02 with Science categories.
Part One - Microstructure Examinations Light microscopy X-ray diffraction Transmission electron microscopy Scanning electron microscopy Scanning probe microscopy Part Two--Chemical and Thermal Analysis X-Ray Spectroscopy for Elemental Analysis Electron Spectroscopy for Surface Analysis Secondary Ion Mass Spectrometry for Surface Analysis Vibrational Spectroscopy for Molecular Analysis Thermal analysis.
Encyclopedia Of Materials Characterization
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Author : Charles A. Evans
language : en
Publisher: Gulf Professional Publishing
Release Date : 1992
Encyclopedia Of Materials Characterization written by Charles A. Evans and has been published by Gulf Professional Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Science categories.
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
In Situ Materials Characterization
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Author : Alexander Ziegler
language : en
Publisher: Springer Science & Business Media
Release Date : 2014-04-01
In Situ Materials Characterization written by Alexander Ziegler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-04-01 with Science categories.
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Materials Characterization Techniques
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Author : Sam Zhang
language : en
Publisher: CRC Press
Release Date : 2008-12-22
Materials Characterization Techniques written by Sam Zhang and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-22 with Science categories.
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
A Guide To Materials Characterization And Chemical Analysis
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Author : John P. Sibilia
language : en
Publisher: John Wiley & Sons
Release Date : 1996-12-17
A Guide To Materials Characterization And Chemical Analysis written by John P. Sibilia and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-12-17 with Science categories.
Diese sowohl für den Neuling als auch für den erfahrenen Wissenschaftler verfaßte Miniatur-Enzyklopädie behandelt über 100 Untersuchungsmethoden zur Charakterisierung von Werkstoffen - von Bewertungen und chemischen Analysen bis zu physikalischen Verfahren. Der Autor beschreibt jede der Methoden nach Art und Weise ihres Einsatzes, der Probenvorbereitung und dem zugrundeliegenden wissenschaftlich-technischen Prinzip. Er bringt Anwendungsbeispiele aus dem akademischen und dem industriellen Bereich, um dem Leser eine Vorstellung von der Bedeutung dieser Techniken zu geben. Methoden zur Polymer-Analyse mit Qualitätstests und Auswertungsverfahren sowie aus den Bereichen Oberflächenanalyse und Mikroskopie bilden, unterstützt durch anschauliche Abbildungen und Beispiele, den Schwerpunkt des Buches.
Materials Characterization Using Nondestructive Evaluation Nde Methods
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Author : Gerhard Huebschen
language : en
Publisher: Woodhead Publishing
Release Date : 2016-03-23
Materials Characterization Using Nondestructive Evaluation Nde Methods written by Gerhard Huebschen and has been published by Woodhead Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-03-23 with Technology & Engineering categories.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Materials Characterization Techniques Methods And Applications
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Author : Dr. Subash Chandra Sahu
language : en
Publisher: Academic Guru Publishing House
Release Date : 2024-09-24
Materials Characterization Techniques Methods And Applications written by Dr. Subash Chandra Sahu and has been published by Academic Guru Publishing House this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-09-24 with Study Aids categories.
“Materials Characterization Techniques: Methods and Applications” is an authoritative resource that provides a detailed exploration of various methods employed in materials characterization. This book covers a broad spectrum of techniques, including microscopy, spectroscopy, diffraction, and thermal analysis, among others. Each chapter offers a comprehensive overview of the principles behind the techniques, instrumentation details, and their applications in real-world scenarios. Designed for both academic and industry professionals, this book emphasizes the importance of selecting the appropriate characterization method based on the material properties under investigation. Additionally, it discusses emerging trends and challenges in the field, preparing readers for future advancements in materials characterization. Whether you are a student aiming to deepen your understanding or a seasoned researcher looking for updated methodologies, this book serves as a vital reference that will enhance your capabilities in the rapidly evolving landscape of materials science.
Practical Guide To Materials Characterization
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Author : Khalid Sultan
language : en
Publisher: John Wiley & Sons
Release Date : 2022-09-08
Practical Guide To Materials Characterization written by Khalid Sultan and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-09-08 with Technology & Engineering categories.
Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.
2d Materials
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Author : Craig E. Banks
language : en
Publisher: CRC Press
Release Date : 2018-06-27
2d Materials written by Craig E. Banks and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-27 with Science categories.
Most reference texts covering two-dimensional materials focus specifically on graphene, when in reality, there are a host of new two-dimensional materials poised to overtake graphene. This book provides an authoritative source of information on twodimensional materials covering a plethora of fields and subjects and outlining all two-dimensional materials in terms of their fundamental understanding, synthesis, and applications.
Semiconductor Material And Device Characterization
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Author : Dieter K. Schroder
language : en
Publisher: John Wiley & Sons
Release Date : 2015-06-29
Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-29 with Technology & Engineering categories.
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.