Dynamical Theory Of X Ray Diffraction
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Dynamical Theory Of X Ray Diffraction
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Author : André Authier
language : en
Publisher: Oxford University Press, USA
Release Date : 2004
Dynamical Theory Of X Ray Diffraction written by André Authier and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Science categories.
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Theoretical Concepts Of X Ray Nanoscale Analysis
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Author : Andrei Benediktovich
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-09-07
Theoretical Concepts Of X Ray Nanoscale Analysis written by Andrei Benediktovich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-09-07 with Technology & Engineering categories.
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
X Ray Optics
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Author : Yuri Shvyd'ko
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-06-25
X Ray Optics written by Yuri Shvyd'ko and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-06-25 with Science categories.
The generation of radiation with well-defined frequency and wavelength, and the ability to precisely determine these quantities, are of fundamental importance in physics and other natural sciences. Monochromatic radiation enables both very accurate structure determinations and studies of the dynamics of living and non-living matter. It is crucial for the realization of standards of time and length, for the determination of fundamental constants, and for many other aspects of basic research. Bragg backscattering from perfect crystals is a tool for creating, manipulating, and analyzing x-rays with highest spectral purity. It has the unique feature of selecting x-rays with narrow spectral bandwidth. This book describes the theoretical foundations and principles of x-ray crystal optics with high spectral resolution. Various experimental studies and applications are presented and the author also addresses the development of instrumentation, such as high-resolution x-ray monochromators, analyzers, wavelength meters, resonators, and interferometers. The book will be a valuable source of information for all students and researchers working in the field of x-ray optics.
High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-08-27
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-08-27 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Dynamical Scattering Of X Rays In Crystals
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Author : Z. G. Pinsker
language : en
Publisher: Reactivity and Structure
Release Date : 1978
Dynamical Scattering Of X Rays In Crystals written by Z. G. Pinsker and has been published by Reactivity and Structure this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Science categories.
X Ray Diffraction Crystallography
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Author : Yoshio Waseda
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-18
X Ray Diffraction Crystallography written by Yoshio Waseda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-18 with Technology & Engineering categories.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Dynamical Theory Of X Ray Diffraction
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Author :
language : en
Publisher:
Release Date : 2004
Dynamical Theory Of X Ray Diffraction written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with X-ray crystallography categories.
Characterization Of Crystal Growth Defects By X Ray Methods
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Author : B.K. Tanner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
X Ray Diffraction By Polycrystalline Materials
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Author : René Guinebretière
language : en
Publisher: John Wiley & Sons
Release Date : 2013-03-01
X Ray Diffraction By Polycrystalline Materials written by René Guinebretière and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-01 with Technology & Engineering categories.
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Landmark Papers On Photorefractive Nonlinear Optics
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Author : Pochi Yeh
language : en
Publisher: World Scientific
Release Date : 1995
Landmark Papers On Photorefractive Nonlinear Optics written by Pochi Yeh and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Science categories.
This book, intended for students, researchers and engineers, is a collection of classic papers on photorefractive nonlinear optics. Included are landmark papers on fundamental photorefractive phenomena, two-wave mixing, four-wave mixing, phase conjugators and resonators, material growth and physics, and applications in image processing, optical storage and optical computing.