High Resolution X Ray Scattering From Thin Films And Multilayers
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High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
High Resolution X Ray Scattering From Thin Films And Multilayers
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Author : Vaclav Holy
language : en
Publisher:
Release Date : 1999
High Resolution X Ray Scattering From Thin Films And Multilayers written by Vaclav Holy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.
X Ray Scattering
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Author : Alicia Esther Ares
language : en
Publisher: BoD – Books on Demand
Release Date : 2017-01-25
X Ray Scattering written by Alicia Esther Ares and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-01-25 with Technology & Engineering categories.
X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.
Thin Film Analysis By X Ray Scattering
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Author : Mario Birkholz
language : en
Publisher: John Wiley & Sons
Release Date : 2006-05-12
Thin Film Analysis By X Ray Scattering written by Mario Birkholz and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-12 with Technology & Engineering categories.
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Thin Film Analysis By X Ray Scattering
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Author : Mario Birkholz
language : en
Publisher: Wiley-VCH
Release Date : 2005-12-23
Thin Film Analysis By X Ray Scattering written by Mario Birkholz and has been published by Wiley-VCH this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-23 with Technology & Engineering categories.
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
X Ray Diffuse Scattering From Self Organized Mesoscopic Semiconductor Structures
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Author : Martin Schmidbauer
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-01-09
X Ray Diffuse Scattering From Self Organized Mesoscopic Semiconductor Structures written by Martin Schmidbauer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-09 with Science categories.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
X Ray Scattering From Soft Matter Thin Films
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Author : Metin Tolan
language : en
Publisher: Springer
Release Date : 1999
X Ray Scattering From Soft Matter Thin Films written by Metin Tolan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Science categories.
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
X Ray And Neutron Reflectivity
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Author : Jean Daillant
language : en
Publisher: Springer
Release Date : 2008-11-19
X Ray And Neutron Reflectivity written by Jean Daillant and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-19 with Science categories.
ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .
High Temperature Superconductor Thin Films At Microwave Frequencies
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Author : Matthias Hein
language : en
Publisher: Springer Science & Business Media
Release Date : 1999-07-02
High Temperature Superconductor Thin Films At Microwave Frequencies written by Matthias Hein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-07-02 with Technology & Engineering categories.
The book develops a comprehensive understanding of the surface impedance of the oxide high-temperature superconductors in comparison with the conventional superconductor Nb3Sn. Linear and nonlinear microwave responses are treated separately, both in terms of models, theories or numerical approaches and in terms of experimental results. The theoretical treatment connects fundamental aspects of superconductivity to the specific high-frequency properties. The experimental data review the state of the art, as reported by many international groups. The book describes further the main features of appropriate preparation, handling, mounting, and refrigeration techniques, and finally discusses possible applications in passive and active microwave devices.
X Ray Scattering From Semiconductors
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Author : Paul F. Fewster
language : en
Publisher: World Scientific
Release Date : 2000
X Ray Scattering From Semiconductors written by Paul F. Fewster and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Science categories.
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.