Materials Analysis By Ion Channeling

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Materials Analysis By Ion Channeling

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Author : Leonard C. Feldman
language : en
Publisher: Academic Press
Release Date : 2012-12-02

Materials Analysis By Ion Channeling written by Leonard C. Feldman and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.

Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts.

Ion Beam Handbook For Material Analysis

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Author : James W. Mayer
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Ion Beam Handbook For Material Analysis written by James W. Mayer and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.

Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.

Ion Beams For Materials Analysis

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Author : J. R. Bird
language : en
Publisher: Academic Press
Release Date : 1989

Ion Beams For Materials Analysis written by J. R. Bird and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Science categories.

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Ion Beams In Materials Processing And Analysis

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Author : Bernd Schmidt
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-13

Ion Beams In Materials Processing And Analysis written by Bernd Schmidt and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-13 with Technology & Engineering categories.

A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.

Ion Beams For Materials Analysis

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Author : R. Curtis Bird
language : en
Publisher: Elsevier
Release Date : 1989-11-28

Ion Beams For Materials Analysis written by R. Curtis Bird and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-11-28 with Technology & Engineering categories.

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Elemental Analysis By Particle Accelerators

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Author : Zeev Alfassi
language : en
Publisher: CRC Press
Release Date : 2020-11-26

Elemental Analysis By Particle Accelerators written by Zeev Alfassi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-26 with Science categories.

Elemental Analysis by Particle Accelerators describes the theory, methodology, and applications for a wide variety of sensitive, non-destructive methods of analysis capable of both high selectivity and multielemental determinations. Specific methods discussed include radioactive methods, particle backscatter analysis, recoil techniques, and nuclear reaction analysis. The use of multielemental PIXE and PIGME analyses of "real world" thick samples in environmental studies, trace element applications in biology, and provenance studies in archaeology are also covered. The book is a useful reference for practicing specialists and an essential text for students.

Physics Materials And Applications Proceedings Of The 10th Anniversary Hts Workshop

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Author : Bertram Batlogg
language : en
Publisher: World Scientific
Release Date : 1996-12-15

Physics Materials And Applications Proceedings Of The 10th Anniversary Hts Workshop written by Bertram Batlogg and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-12-15 with categories.

This volume commemorates the 10th anniversary of the discovery of high temperature superconductors (HTS). The historical framework and present status of HTS are reviewed, and the future of the field contemplated so that the HTS science can be unraveled and the HTS technology developed. This book contains the works of about 200 members of the international HTS community — from universities, government centers and laboratories, major industries and small businesses. It focuses on early and major new findings in the physics and mechanisms, materials and applications of HTS, with a projection to the emerging and future areas in science and technology.

Ion Beam Applications

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Author : Ishaq Ahmad
language : en
Publisher: BoD – Books on Demand
Release Date : 2018-07-18

Ion Beam Applications written by Ishaq Ahmad and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-18 with Science categories.

Ion beam of various energies is a standard research tool in many areas of science, from basic physics to diverse areas in space science and technology, device fabrications, materials science, environment science, and medical sciences. It is an advance and versatile tool to frequently discover applications across a broad range of disciplines and fields. Moreover, scientists are continuously improving the ion beam sources and accelerators to explore ion beam at the forefront of scientific endeavours. This book provides a glance view on MeV ion beam applications, focused ion beam generation and its applications as well as practical applications of ion implantation.

Introduction To Focused Ion Beams

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Author : Lucille A. Giannuzzi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-05-18

Introduction To Focused Ion Beams written by Lucille A. Giannuzzi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-18 with Science categories.

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Concise Encyclopedia Of Materials Characterization

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Author : R.W. Cahn
language : en
Publisher: Elsevier
Release Date : 2016-01-22

Concise Encyclopedia Of Materials Characterization written by R.W. Cahn and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-01-22 with Technology & Engineering categories.

To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general.The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.