Microcantilevers For Atomic Force Microscope Data Storage
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Microcantilevers For Atomic Force Microscope Data Storage
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Author : Benjamin W. Chui
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Microcantilevers For Atomic Force Microscope Data Storage written by Benjamin W. Chui and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Microcantilevers for Atomic Force Microscope Data Storage describes a research collaboration between IBM Almaden and Stanford University in which a new mass data storage technology was evaluated. This technology is based on the use of heated cantilevers to form submicron indentations on a polycarbonate surface, and piezoresistive cantilevers to read those indentations. Microcantilevers for Atomic Force Microscope Data Storage describes how silicon micromachined cantilevers can be used for high-density topographic data storage on a simple substrate such as polycarbonate. The cantilevers can be made to incorporate resistive heaters (for thermal writing) or piezoresistive deflection sensors (for data readback). The primary audience for Microcantilevers for Atomic Force Microscope Data Storage is industrial and academic workers in the microelectromechanical systems (MEMS) area. It will also be of interest to researchers in the data storage industry who are investigating future storage technologies.
Scanning Force Microscopy
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Author : Dror Sarid
language : en
Publisher: Oxford University Press, USA
Release Date : 1994
Scanning Force Microscopy written by Dror Sarid and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Scanning force microscopy categories.
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
Nanotribology And Nanomechanics I
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-05-30
Nanotribology And Nanomechanics I written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-05-30 with Technology & Engineering categories.
The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Nanotribology And Nanomechanics
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-05-10
Nanotribology And Nanomechanics written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-10 with Technology & Engineering categories.
This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems and MEMS/NEMS. Assuming some familiarity with macrotribology/mechanics, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. Graduate students, research workers, and practicing engineers will find the book of value.
Atomic Force Microscopy
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Author : Bert Voigtländer
language : en
Publisher: Springer
Release Date : 2019-05-23
Atomic Force Microscopy written by Bert Voigtländer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-05-23 with Science categories.
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Quantum Materials Devices And Applications
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Author : Mohamed Henini
language : en
Publisher: Elsevier
Release Date : 2022-08-24
Quantum Materials Devices And Applications written by Mohamed Henini and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-08-24 with Technology & Engineering categories.
Quantum Materials, Devices, and Applications covers the advances made in quantum technologies, both in research and mass production for applications in electronics, photonics, sensing, biomedical, environmental and agricultural applications. The book includes new materials, new device structures that are commercially available, and many more at the advanced research stage. It reviews the most relevant, current and emerging materials and device structures, organized by key applications and covers existing devices, technologies and future possibilities within a common framework of high-performance quantum devices. This book will be ideal for researchers and practitioners in academia, industry and those in materials science and engineering, electrical engineering and physics disciplines. Comprehensively covers the important and rapidly growing area of quantum technologies by focusing on current and emerging materials, devices and applications Takes an applied approach to the topic by addressing key applications in electronics, optoelectronics, photonics, sensing and the environment Addresses ethical considerations, remaining challenges and future opportunities for quantum materials and devices
Atomic Force Microscopy
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Author : Victor Bellitto
language : en
Publisher: BoD – Books on Demand
Release Date : 2012-03-23
Atomic Force Microscopy written by Victor Bellitto and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-23 with Science categories.
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Mass Metrology
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Author : S. V. Gupta
language : en
Publisher: Springer
Release Date : 2019-03-25
Mass Metrology written by S. V. Gupta and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-03-25 with Technology & Engineering categories.
This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Force Microscopy
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Author : Bhanu P. Jena
language : en
Publisher: John Wiley & Sons
Release Date : 2006-07-11
Force Microscopy written by Bhanu P. Jena and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-07-11 with Science categories.
A complete examination of the uses of the atomic force microscope in biology and medicine This cutting-edge text, written by a team of leading experts, is the first detailed examination of the latest, most powerful scanning probe microscope, the atomic force microscope (AFM). Using the AFM, in combination with conventional tools and techniques, readers gain a profound understanding of the cell, subcellular organelles, and biomolecular structure and function. The text begins with three chapters describing the molecular machinery and mechanism of cell secretion and membrane fusion in cells, using approaches that combine AFM, electron microscopy, X-ray diffraction, photon correlation spectroscopy, molecular biology, biochemistry, and electrophysiology. The discovery of a new cellular structure the "porosome" or fusion pore--the cells secretory machinery, the molecular mechanism of membrane fusion in cells, and the expulsion of intravesicular contents during cell secretion are outlined in the first three chapters. The book also covers: * Identification of the "porosome" in the growth hormone secreting cell of the pituitary gland * Probing the structural and physical properties of microbial cell surfaces * Scanning probe microscopic characterization of the higher plant cell wall and its components * Case studies of nano drug delivery systems using engineered dendrimers * AFM techniques for studying living cells * Investigating the intermolecular forces of leukocyte adhesion molecules * Protein-protein interactions * Micromechanical properties of lipid bilayers and vesicles The text concludes with four chapters that examine new and emerging approaches in the use of force microscopy in biology and medicine. This text is ideal for advanced undergraduate and graduate students and researchers in cell and molecular biology, genetics, genomics, physiology, neuroscience, biophysics, and biochemistry. Not only does it provide the theory, but also practical considerations such as the selection of the right tools and approach.
Atomic Force Microscopy
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Author : Greg Haugstad
language : en
Publisher: John Wiley & Sons
Release Date : 2012-09-04
Atomic Force Microscopy written by Greg Haugstad and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-04 with Science categories.
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”