Mixed Signal And Dsp Design Techniques

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Mixed Signal And Dsp Design Techniques

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Author : Analog Devices Inc. Analog Devices Inc. Engineeri
language : en
Publisher: Elsevier
Release Date : 2003-01-10

Mixed Signal And Dsp Design Techniques written by Analog Devices Inc. Analog Devices Inc. Engineeri and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-01-10 with Technology & Engineering categories.

The reader is provided with information on how to choose between the techniques and how to design a system that takes advantage of the best features of each of them. Imminently practical in approach, the book covers sampled data systems, choosing A-to-D and D-to-A converters for DSP applications, fast Fourier transforms, digital filters, selecting DSP hardware, interfacing to DSP chips, and hardware design techniques. It contains a number of application designs with thorough explanations. Heavily illustrated, the book contains all the design reference information that engineers need when developing mixed and digital signal processing systems.*Brought to you from the experts at Analog Devices, Inc.*A must for any electrical, electronics or mechanical engineer's reference shelf*Design-oriented, practical volume

Mixed Signal And Dsp Design Techniques

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Author : Walt Kester
language : en
Publisher:
Release Date : 2000

Mixed Signal And Dsp Design Techniques written by Walt Kester and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Signal processing categories.

Dsp Based Testing Of Analog And Mixed Signal Circuits

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Author : Matthew Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 1987-05-11

Dsp Based Testing Of Analog And Mixed Signal Circuits written by Matthew Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-05-11 with Science categories.

Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.

Digital Signal Processing A Practical Guide For Engineers And Scientists

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Author : Steven Smith
language : en
Publisher: Elsevier
Release Date : 2013-10-22

Digital Signal Processing A Practical Guide For Engineers And Scientists written by Steven Smith and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Technology & Engineering categories.

In addition to its thorough coverage of DSP design and programming techniques, Smith also covers the operation and usage of DSP chips. He uses Analog Devices' popular DSP chip family as design examples. - Covers all major DSP topics - Full of insider information and shortcuts - Basic techniques and algorithms explained without complex numbers

Test And Design For Testability In Mixed Signal Integrated Circuits

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Author : Jose Luis Huertas Díaz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-23

Test And Design For Testability In Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-23 with Technology & Engineering categories.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Digital Design Of Signal Processing Systems

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Author : Shoab Ahmed Khan
language : en
Publisher: John Wiley & Sons
Release Date : 2011-02-02

Digital Design Of Signal Processing Systems written by Shoab Ahmed Khan and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-02-02 with Science categories.

Digital Design of Signal Processing Systems discusses a spectrum of architectures and methods for effective implementation of algorithms in hardware (HW). Encompassing all facets of the subject this book includes conversion of algorithms from floating-point to fixed-point format, parallel architectures for basic computational blocks, Verilog Hardware Description Language (HDL), SystemVerilog and coding guidelines for synthesis. The book also covers system level design of Multi Processor System on Chip (MPSoC); a consideration of different design methodologies including Network on Chip (NoC) and Kahn Process Network (KPN) based connectivity among processing elements. A special emphasis is placed on implementing streaming applications like a digital communication system in HW. Several novel architectures for implementing commonly used algorithms in signal processing are also revealed. With a comprehensive coverage of topics the book provides an appropriate mix of examples to illustrate the design methodology. Key Features: A practical guide to designing efficient digital systems, covering the complete spectrum of digital design from a digital signal processing perspective Provides a full account of HW building blocks and their architectures, while also elaborating effective use of embedded computational resources such as multipliers, adders and memories in FPGAs Covers a system level architecture using NoC and KPN for streaming applications, giving examples of structuring MATLAB code and its easy mapping in HW for these applications Explains state machine based and Micro-Program architectures with comprehensive case studies for mapping complex applications The techniques and examples discussed in this book are used in the award winning products from the Center for Advanced Research in Engineering (CARE). Software Defined Radio, 10 Gigabit VoIP monitoring system and Digital Surveillance equipment has respectively won APICTA (Asia Pacific Information and Communication Alliance) awards in 2010 for their unique and effective designs.

Dsp Software Development Techniques For Embedded And Real Time Systems

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Author : Robert Oshana
language : en
Publisher: Elsevier
Release Date : 2006-01-09

Dsp Software Development Techniques For Embedded And Real Time Systems written by Robert Oshana and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-09 with Technology & Engineering categories.

Today's embedded and real-time systems contain a mix of processor types: off-the-shelf microcontrollers, digital signal processors (DSPs), and custom processors. The decreasing cost of DSPs has made these sophisticated chips very attractive for a number of embedded and real-time applications, including automotive, telecommunications, medical imaging, and many others—including even some games and home appliances. However, developing embedded and real-time DSP applications is a complex task influenced by many parameters and issues. DSP Software Development Techniques for Embedded and Real-Time Systems is an introduction to DSP software development for embedded and real-time developers giving details on how to use digital signal processors efficiently in embedded and real-time systems. The book covers software and firmware design principles, from processor architectures and basic theory to the selection of appropriate languages and basic algorithms. The reader will find practical guidelines, diagrammed techniques, tool descriptions, and code templates for developing and optimizing DSP software and firmware. The book also covers integrating and testing DSP systems as well as managing the DSP development effort. - Digital signal processors (DSPs) are the future of microchips! - Includes practical guidelines, diagrammed techniques, tool descriptions, and code templates to aid in the development and optimization of DSP software and firmware

Mixed Signal Methodology Guide

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Author : Jess Chen
language : en
Publisher: Lulu.com
Release Date : 2012

Mixed Signal Methodology Guide written by Jess Chen and has been published by Lulu.com this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Technology & Engineering categories.

This book, the Mixed-signal Methodology Guide: Advanced Methodology for AMS IP and SoC Design, Verification, and Implementation provides a broad overview of the design, verification and implementation methodologies required for today's mixed-signal designs. The book covers mixed-signal design trends and challenges, abstraction of analog using behavioral models, assertion-based metric-driven verification methodology applied on analog and mixed-signal and verification of low power intent in mixed-signal design. It also describes methodology for physical implementation in context of concurrent mixed-signal design and for handling advanced node physical effects. The book contains many practical examples of models and techniques. The authors believe it should serve as a reference to many analog, digital and mixed-signal designers, verification, physical implementation engineers and managers in their pursuit of information for a better methodology required to address the challenges of modern mixed-signal design.

Cmos Mixed Signal Circuit Design

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Author : R. Jacob Baker
language : en
Publisher: John Wiley & Sons
Release Date : 2008-06

Cmos Mixed Signal Circuit Design written by R. Jacob Baker and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-06 with categories.

Special Features: · Written by the author of the best-seller, CMOS: Circuit Design, Layout, and Simulation· Fills a hole in the technical literature for an advanced-tutorial book on mixed-signal circuit design from a circuit designer's point of view· Presents more advance topics, and will be an excellent companion to the first volume About The Book: This book will fill a hole in the technical literature for an advanced-tutorial book on mixed-signal circuit design. There are no competitors in this area. Mixed-signal design is performed in industry by a select few gurus . The techniques can be found in hard-to-digest technical papers.

An Introduction To Mixed Signal Ic Test And Measurement

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Author : Mark Burns
language : en
Publisher: Oxford University Press, USA
Release Date : 2001

An Introduction To Mixed Signal Ic Test And Measurement written by Mark Burns and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Technology & Engineering categories.

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.