Multi Run Memory Tests For Pattern Sensitive Faults
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Multi Run Memory Tests For Pattern Sensitive Faults
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Author : Ireneusz Mrozek
language : en
Publisher:
Release Date : 2019
Multi Run Memory Tests For Pattern Sensitive Faults written by Ireneusz Mrozek and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019 with Computer storage devices categories.
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Multi Run Memory Tests For Pattern Sensitive Faults
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Author : Ireneusz Mrozek
language : en
Publisher: Springer
Release Date : 2018-07-06
Multi Run Memory Tests For Pattern Sensitive Faults written by Ireneusz Mrozek and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-06 with Technology & Engineering categories.
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
High Performance Memory Testing written by R. Dean Adams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Testing Static Random Access Memories
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Author : Said Hamdioui
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Testing Static Random Access Memories written by Said Hamdioui and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Parallel Computational Fluid Dynamics
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Author : Kenli Li
language : en
Publisher: Springer
Release Date : 2014-03-08
Parallel Computational Fluid Dynamics written by Kenli Li and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-03-08 with Computers categories.
This book constitutes the refereed proceedings of the 25th International Conference on Parallel Computational Fluid Dynamics, ParCFD 2013, held in Changsha, China, in May 2013. The 35 revised full papers presented were carefully reviewed and selected from more than 240 submissions. The papers address issues such as parallel algorithms, developments in software tools and environments, unstructured adaptive mesh applications, industrial applications, atmospheric and oceanic global simulation, interdisciplinary applications and evaluation of computer architectures and software environments.
Row Column Pattern Sensitive Faults In Random Access Memories
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Author : Manoj Franklin
language : en
Publisher:
Release Date : 1990
Row Column Pattern Sensitive Faults In Random Access Memories written by Manoj Franklin and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.
Program Management For System On Chip Platforms
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Author : Whitson G. Waldo
language : en
Publisher: First Books
Release Date : 2010-09
Program Management For System On Chip Platforms written by Whitson G. Waldo and has been published by First Books this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09 with Business & Economics categories.
A Fully Integrated Presentation of New Hardware and Software Product Introductions Using Program Management Methodologies for System on Chip Platforms If you're an executive, manager, or engineer in the semiconductor, software, or systems industries, this book provides conceptual views ranging from the design of integrated circuits or systems on a chip, through fabrication, to integration of chips onto boards, and through development of enablement and runtime software for system and platform deliveries. Special features included this book are: - Program management methodologies - General management fundamentals - An overview of leadership principles - Basic discrete device technology - Internal structure and operation of some common logic gates - Basic integrated circuit design concepts, building blocks, and flow - Chip packaging technologies - Details of the fabrication process for integrated circuits - Printed circuit board design, manufacture, and test - Software design, development, and test - Integrated circuit test, silicon validation, and device qualification - Program management applications bringing it all together The book explores interactions and dependencies of technologies that impact systems and platforms. This is a valuable resource to learn these technologies or to use as a reference.
Reliable Computer Systems
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Author : Daniel Siewiorek
language : en
Publisher: Digital Press
Release Date : 2014-06-28
Reliable Computer Systems written by Daniel Siewiorek and has been published by Digital Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-06-28 with Computers categories.
Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Reliable Computer Systems
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Author : Daniel P. Siewiorek
language : en
Publisher: CRC Press
Release Date : 1998-12-15
Reliable Computer Systems written by Daniel P. Siewiorek and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-12-15 with Computers categories.
This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2019-12-01
Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-12-01 with Technology & Engineering categories.
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.