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Nanoscale Calibration Standards And Methods

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Nanoscale Calibration Standards And Methods

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Author : Günter Wilkening
language : en
Publisher: John Wiley & Sons
Release Date : 2006-05-12

Nanoscale Calibration Standards And Methods written by Günter Wilkening and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-12 with Technology & Engineering categories.

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Nanoscale Calibration Standards And Methods

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Author : Günter Wilkening
language : en
Publisher: John Wiley & Sons
Release Date : 2005-07-01

Nanoscale 2004

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Author :
language : en
Publisher:
Release Date : 2004

Nanoscale 2004 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with categories.

Handbook Of Surface And Nanometrology

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Author : David J. Whitehouse
language : en
Publisher: CRC Press
Release Date : 2002-12-01

Handbook Of Surface And Nanometrology written by David J. Whitehouse and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-12-01 with Science categories.

The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained wit

Metrology And Standardization For Nanotechnology

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Author : Elisabeth Mansfield
language : en
Publisher: John Wiley & Sons
Release Date : 2017-01-20

Metrology And Standardization For Nanotechnology written by Elisabeth Mansfield and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-01-20 with Technology & Engineering categories.

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Fundamental Principles Of Engineering Nanometrology

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Author : Richard Leach
language : en
Publisher: Elsevier
Release Date : 2014-05-17

Fundamental Principles Of Engineering Nanometrology written by Richard Leach and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-05-17 with Science categories.

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations

Quantitative Data Processing In Scanning Probe Microscopy

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Author : Petr Klapetek
language : en
Publisher: Elsevier
Release Date : 2018-02-03

Quantitative Data Processing In Scanning Probe Microscopy written by Petr Klapetek and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-03 with Science categories.

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ - Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques - Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy - Worked examples show quantitative data processing for different SPM analytical techniques

Proceedings Of The 2nd International Conference On Surface Metrology

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Author :
language : en
Publisher: WPI Surface Metrology Lab
Release Date : 2010

Proceedings Of The 2nd International Conference On Surface Metrology written by and has been published by WPI Surface Metrology Lab this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Surfaces (Technology) categories.

Nanotechnology Standards

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Author : Vladimir Murashov
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-02-01

Nanotechnology Standards written by Vladimir Murashov and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-02-01 with Technology & Engineering categories.

Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Functional Nanomaterials And Devices For Electronics Sensors And Energy Harvesting

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Author : Alexei Nazarov
language : en
Publisher: Springer
Release Date : 2014-08-28

Functional Nanomaterials And Devices For Electronics Sensors And Energy Harvesting written by Alexei Nazarov and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-28 with Technology & Engineering categories.

This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between “More Moore” and “More than Moore” are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.

Nanoscale Calibration Standards And Methods

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