Noncontact Atomic Force Microscopy
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Noncontact Atomic Force Microscopy
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Author : S. Morita
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Noncontact Atomic Force Microscopy written by S. Morita and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Noncontact Atomic Force Microscopy
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Author : Seizo Morita
language : en
Publisher: Springer
Release Date : 2015-05-18
Noncontact Atomic Force Microscopy written by Seizo Morita and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-05-18 with Science categories.
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Noncontact Atomic Force Microscopy
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Author : Seizo Morita
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-09-18
Noncontact Atomic Force Microscopy written by Seizo Morita and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-09-18 with Technology & Engineering categories.
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Atomic Force Microscopy
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Author : Bert Voigtländer
language : en
Publisher: Springer
Release Date : 2019-05-23
Atomic Force Microscopy written by Bert Voigtländer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-05-23 with Science categories.
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Compendium Of Surface And Interface Analysis
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Author : The Surface Science Society of Japan
language : en
Publisher: Springer
Release Date : 2018-02-19
Compendium Of Surface And Interface Analysis written by The Surface Science Society of Japan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-19 with Technology & Engineering categories.
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Amplitude Modulation Atomic Force Microscopy
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Author : Ricardo García
language : en
Publisher: John Wiley & Sons
Release Date : 2011-08-24
Amplitude Modulation Atomic Force Microscopy written by Ricardo García and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-24 with Technology & Engineering categories.
Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.
Noncontact Atomic Force Microscopy
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Author : Seizo Morita
language : en
Publisher:
Release Date : 1999
Noncontact Atomic Force Microscopy written by Seizo Morita and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.
Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials
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Author : Paula M. Vilarinho
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-15
Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials written by Paula M. Vilarinho and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-15 with Science categories.
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Nanotribology And Nanomechanics
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-07-12
Nanotribology And Nanomechanics written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-07-12 with Technology & Engineering categories.
This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems and MEMS/NEMS.
Fundamentals Of Tribology And Bridging The Gap Between The Macro And Micro Nanoscales
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Fundamentals Of Tribology And Bridging The Gap Between The Macro And Micro Nanoscales written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
The word tribology was fIrst reported in a landmark report by P. Jost in 1966 (Lubrication (Tribology)--A Report on the Present Position and Industry's Needs, Department of Education and Science, HMSO, London). Tribology is the science and technology of two interacting surfaces in relative motion and of related subjects and practices. The popular equivalent is friction, wear and lubrication. The economic impact of the better understanding of tribology of two interacting surfaces in relative motion is known to be immense. Losses resulting from ignorance of tribology amount in the United States alone to about 6 percent of its GNP or about $200 billion dollars per year (1966), and approximately one-third of the world's energy resources in present' use, appear as friction in one form or another. A fundamental understanding of the tribology of the head-medium interface in magnetic recording is crucial to the future growth of the $100 billion per year information storage industry. In the emerging microelectromechanical systems (MEMS) industry, tribology is also recognized as a limiting technology. The advent of new scanning probe microscopy (SPM) techniques (starting with the invention of the scanning tunneling microscope in 1981) to measure surface topography, adhesion, friction, wear, lubricant-fIlm thickness, mechanical properties all on a micro to nanometer scale, and to image lubricant molecules and the availability of supercomputers to conduct atomic-scale simulations has led to the development of a new fIeld referred to as Microtribology, Nanotribology, or Molecular Tribology (see B. Bhushan, J. N. Israelachvili and U.