Optical Properties Of Dielectric Films


Optical Properties Of Dielectric Films
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Optical Properties Of Dielectric Films


Optical Properties Of Dielectric Films
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Author : Norman N. Axelrod
language : en
Publisher:
Release Date : 1968

Optical Properties Of Dielectric Films written by Norman N. Axelrod and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1968 with Science categories.




Optical Properties Of Dielectric Films


Optical Properties Of Dielectric Films
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Author : Norman N. Axelrod
language : en
Publisher:
Release Date : 1970

Optical Properties Of Dielectric Films written by Norman N. Axelrod and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970 with Dielectrics categories.




Handbook Of Optical Properties


Handbook Of Optical Properties
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Author : Rolf E. Hummel
language : en
Publisher: CRC Press
Release Date : 1995-02-24

Handbook Of Optical Properties written by Rolf E. Hummel and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-02-24 with Science categories.


Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this subject, this book presents the views of many expert authors. Individual chapters span a wide arc of topics within this field of study. The book offers an introduction to usual and unusual applications of optical thin films, treating in a more qualitative way general topics such as anticounterfeiting coatings, decorative coatings, light switches, contrast enhancement coatings, multiplexers, optical memories, and more. Contributors review thin film media for optical data storage, UV broadband and narrow-band filters, and optically active thin film coatings. Ion beam sputtering and magnetron sputtering deposition methods are described in detail. Characterization techniques are provided, including Raman spectroscopy and absorption measurements. The book also offers theories on light scattering of thin dielectric films and the electromagnetic properties of nanocermet thin films. This reference incorporates recent research by the individual authors with their views of current developments in their respective fields. Of particular interest to the reader will be an assessment of the historical developments of thin film physics written by one of the fathers of thin film technology, Professor M. Auwärter.



Optical Properties Of Thin Solid Films


Optical Properties Of Thin Solid Films
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Author : O. S. Heavens
language : en
Publisher: Courier Corporation
Release Date : 1991-01-01

Optical Properties Of Thin Solid Films written by O. S. Heavens and has been published by Courier Corporation this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-01-01 with Science categories.


Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.



A Study Of The Microstructure And Optical Properties Of Thin Lead Dielectric Cermet Films


A Study Of The Microstructure And Optical Properties Of Thin Lead Dielectric Cermet Films
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Author : Robert B. Owen
language : en
Publisher:
Release Date : 1972

A Study Of The Microstructure And Optical Properties Of Thin Lead Dielectric Cermet Films written by Robert B. Owen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1972 with Ceramic metals categories.


A transmission electron microscopy study involving direct and replicating techniques is directed to a definition of the microstructure of radio frequency-sputtered, thin lead-dielectric cermet films. Once defined, this microstructure is used to obtain theoretical film refractive indices. The Maxwell Garnett theory provides a basis for the theoretical results. Measurements of film transmission and reflectivity are used to obtain rough experimental values for film refractive indices by the Tekucheva method. More exact values are obtained via ellipsometry. The rough Tekucheva values are used to determine the range over which computer calculations interpreting the ellipsometric results must be made. This technique yields accurate values for the film refractive indices. The films are radio frequency-sputtered from lead glass targets with varying amounts of lead attached to their faces. Three different targets are used, resulting in three sets of films, each containing a different percentage of lead. The lead content of the films is measured by microprobe analysis as well as visual inspection of micrographs. The lower content lead films are seen to consist of tiny balls of lead embedded in the dielectric, as are the intermediate lead content films; but the higher lead content films form metallic with the predictions of the Maxwell Garnett theory; but the higher lead content films, whose structure fails to conform to the Maxwell Garnett configuration, have indices whose values diverge from the Maxwell Garnett predictions. It is thus shown that the theory of Maxwell Garnett is valid for thin cermet films whose structure consists of tiny metal balls embedded in a dielectric medium.



Optical Properties Of Surfaces


Optical Properties Of Surfaces
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Author : Dick Bedeaux
language : en
Publisher: Imperial College Press
Release Date : 2004

Optical Properties Of Surfaces written by Dick Bedeaux and has been published by Imperial College Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Science categories.


Annotation - An extremely rigorous theoretical description- For thin films computer programs are available for obtaining the optical properties exactly- Presents optical properties of rough surfaces, including capillary waves and oxide layers- Provides a new discussion on reflection from a gyrotropic surface- Describes reflection from a self-affine rough surface.



Nonlinear Optics Of Random Media


Nonlinear Optics Of Random Media
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Author : Vladimir M. Shalaev
language : en
Publisher: Springer
Release Date : 2007-09-28

Nonlinear Optics Of Random Media written by Vladimir M. Shalaev and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-09-28 with Science categories.


Nonlinear Optics of Random Media reviews recent advances in in one of the most prominent fields of physics. It provides an outline of the basic models of irregular structures of random inhomogeneous media and the approaches used to describe their linear electromagnetic properties. Nonlinearities in random media are also discussed. The chapters can be read independently, so scientists and students interested in a specific problem can go directly to the relevant text.



Optical Properties Of Organic Semiconductors From Sub Monolayers To Crystalline Films


Optical Properties Of Organic Semiconductors From Sub Monolayers To Crystalline Films
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Author :
language : en
Publisher: Cuvillier Verlag
Release Date : 2006-05-10

Optical Properties Of Organic Semiconductors From Sub Monolayers To Crystalline Films written by and has been published by Cuvillier Verlag this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-10 with Science categories.


We have measured the optical properties of films of the organic semiconductors PTCDA and HBC, prepared by Organic Molecular Beam Expitaxy (OMBE), on different substrates by means of Differential Reflectance Spectroscopy (DRS). The optical setup used [51] allows to characterize the samples in situ and during the film growth. This enables us to directly follow the thickness dependent optical properties of the organic films, starting from submonolayer coverage up to thicker films on the order of 20 monolayers (ML) film thickness. However, due to the different optical nature of the different substrates used, i.e., mica, glass, Au(111), and HOPG, the DRS signal can not directly be interpreted in terms of the absorption of the films. Rather, the optical constants n (index of refraction) and k (absorption index) of the organic films have to be calculated to be able to discuss the spectral absorption of the films. We have proposed a method by which the calculation of the optical constants of thin films on arbitrary substrates from just one spectral measurement (in our case the DRS) becomes possible. The results fulfill a priori a Kramers-Kronig consistency, characteristic for physically meaningful values of the optical constants, and no specific model is needed to express the spectral behavior of the optical constants. Still, the requirement that the absorption index has to approach zero sufficiently at the measurement intervals restricts the application of our method to a class of materials, which exhibit distinct and well-separated absorption bands, like e.g. organic semiconductors. By means of appropriate extrapolation procedures, the method is able to account for small non-zero values of the absorption index at the boundaries of the measurement interval. Although we exclusively discussed the application of our method to differential reflectance spectra, it is anticipated that it works for all other optical quantities likewise.



The Physics Of Thin Film Optical Spectra


The Physics Of Thin Film Optical Spectra
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Author : Olaf Stenzel
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-06-13

The Physics Of Thin Film Optical Spectra written by Olaf Stenzel and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-06-13 with Science categories.


The present monograph represents itself as a tutorial to the ?eld of optical properties of thin solid ?lms. It is neither a handbook for the thin ?lm prac- tioner,noranintroductiontointerferencecoatingsdesign,norareviewonthe latest developments in the ?eld. Instead, it is a textbook which shall bridge the gap between ground level knowledge on optics, electrodynamics, qu- tummechanics,andsolidstatephysicsononehand,andthemorespecialized level of knowledge presumed in typical thin ?lm optical research papers on the other hand. In writing this preface, I feel it makes sense to comment on three points, which all seem to me equally important. They arise from the following (- tually interconnected) three questions: 1. Who can bene?t from reading this book? 2. What is the origin of the particular material selection in this book? 3. Who encouraged and supported me in writing this book? Let me start with the ?rst question, the intended readership of this book. It should be of use for anybody, who is involved into the analysis of - tical spectra of a thin ?lm sample, no matter whether the sample has been prepared for optical or other applications. Thin ?lm spectroscopy may be r- evant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few ex- ples. The book supplies the reader with the necessary theoretical apparatus for understanding and modelling the features of the recorded transmission and re?ection spectra.



Optical Characterization Of Real Surfaces And Films


Optical Characterization Of Real Surfaces And Films
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Author : K. Vedam
language : en
Publisher: Academic Press
Release Date : 2013-10-22

Optical Characterization Of Real Surfaces And Films written by K. Vedam and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.


This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.