Particle Beam Microanalysis
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Particle Beam Microanalysis
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Author : Ekkehard Fuchs
language : en
Publisher: Wiley-VCH
Release Date : 1990-12-06
Particle Beam Microanalysis written by Ekkehard Fuchs and has been published by Wiley-VCH this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990-12-06 with Science categories.
Particle beam methods of microanalysis allow high lateral and vertical resolution, high sensitivity, low detection limits, and high accuracy. This book concentrates on methods which complement each other and can be routinely applied in industrial laboratories: scanning and transmission electron microscopy, electron beam X-ray microanalysis, Auger electron microanalysis, and ion beam microanalysis as well as electron beam testing. The principal aim of this book is to support the analyst in his practical work. The theoretical basis is treated only to the extent required to obtain an understanding of the physical fundamentals and to allow effective use of the analytical instruments. The mode of operation of the instruments, the preparation of specimens, the evaluation of the measured signals as well as the detection limits are described in detail. A selection of practical examples drawn mainly from the field of semiconductor technology demonstrates the range of applications and the limitations of the various particle beam methods.
Quantitative Microbeam Analysis
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Author : A.G Fitzgerald
language : en
Publisher: Routledge
Release Date : 2017-07-12
Quantitative Microbeam Analysis written by A.G Fitzgerald and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-07-12 with Science categories.
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Particle Characterization In Technology
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Author : Beddow
language : en
Publisher: CRC Press
Release Date : 2018-01-18
Particle Characterization In Technology written by Beddow and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-01-18 with Science categories.
Volume I present an important exposition of some of the most significant areas where particle characterization is applied. The technological fields include pharmaceutical materials, bulk solids, and explosions.
Particle Beam Microanalysis
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Author : Ekkehard Fuchs
language : en
Publisher:
Release Date : 1990
Particle Beam Microanalysis written by Ekkehard Fuchs and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Electron beams categories.
X Ray Optics And Microanalysis
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Author : Melissa A. Denecke
language : en
Publisher: American Institute of Physics
Release Date : 2010-05-12
X Ray Optics And Microanalysis written by Melissa A. Denecke and has been published by American Institute of Physics this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-05-12 with Science categories.
ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
Microbeam Analysis
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Author : D Williams
language : en
Publisher: CRC Press
Release Date : 2000-01-01
Microbeam Analysis written by D Williams and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-01-01 with Science categories.
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volu
Microanalysis Of Solids
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Author : B.G. Yacobi
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Microanalysis Of Solids written by B.G. Yacobi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Science categories.
The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.
Measurement And Control Of Charged Particle Beams
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Author : Michiko G. Minty
language : en
Publisher: Springer Science & Business Media
Release Date : 2003-05-21
Measurement And Control Of Charged Particle Beams written by Michiko G. Minty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-05-21 with Science categories.
From the reviews: "This book is a very welcome and valuable addition to the accelerator literature. As noted by the authors, there is relatively little material in the book specifically for low-energy machines, but industrial users may still find it useful to read." Cern Courier
Advanced Scanning Electron Microscopy And X Ray Microanalysis
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Author : Patrick Echlin
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Advanced Scanning Electron Microscopy And X Ray Microanalysis written by Patrick Echlin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Medical categories.
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Scanning Electron Microscopy And X Ray Microanalysis
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Scanning Electron Microscopy And X Ray Microanalysis written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.