Phase Change Memory
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Phase Change Memory
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Author : Andrea Redaelli
language : en
Publisher: Springer
Release Date : 2017-11-18
Phase Change Memory written by Andrea Redaelli and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-18 with Technology & Engineering categories.
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
Phase Change Memory
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Author : Andrea Redaelli
language : en
Publisher: Springer
Release Date : 2017-11-28
Phase Change Memory written by Andrea Redaelli and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-28 with Technology & Engineering categories.
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
Phase Change Memory
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Author : Naveen Muralimanohar
language : en
Publisher: Springer Nature
Release Date : 2022-05-31
Phase Change Memory written by Naveen Muralimanohar and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-05-31 with Technology & Engineering categories.
As conventional memory technologies such as DRAM and Flash run into scaling challenges, architects and system designers are forced to look at alternative technologies for building future computer systems. This synthesis lecture begins by listing the requirements for a next generation memory technology and briefly surveys the landscape of novel non-volatile memories. Among these, Phase Change Memory (PCM) is emerging as a leading contender, and the authors discuss the material, device, and circuit advances underlying this exciting technology. The lecture then describes architectural solutions to enable PCM for main memories. Finally, the authors explore the impact of such byte-addressable non-volatile memories on future storage and system designs. Table of Contents: Next Generation Memory Technologies / Architecting PCM for Main Memories / Tolerating Slow Writes in PCM / Wear Leveling for Durability / Wear Leveling Under Adversarial Settings / Error Resilience in Phase Change Memories / Storage and System Design With Emerging Non-Volatile Memories
Durable Phase Change Memory Architectures
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Author :
language : en
Publisher: Academic Press
Release Date : 2020-02-21
Durable Phase Change Memory Architectures written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-02-21 with Computers categories.
Advances in Computers, Volume 118, the latest volume in this innovative series published since 1960, presents detailed coverage of new advancements in computer hardware, software, theory, design and applications. Chapters in this updated release include Introduction to non-volatile memory technologies, The emerging phase-change memory, Phase-change memory architectures, Inter-line level schemes for handling hard errors in PCMs, Handling hard errors in PCMs by using intra-line level schemes, and Addressing issues with MLC Phase-change Memory. Gives a comprehensive overlook of new memory technologies, including PCM Provides reliability features with an in-depth discussion of physical mechanisms that are currently limiting PCM capabilities Covers the work of well-known authors and researchers in the field Includes volumes that are devoted to single themes or subfields of computer science
Scalability And Reliability Of Phase Change Memory
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Author : SangBum Kim
language : en
Publisher: Stanford University
Release Date : 2010
Scalability And Reliability Of Phase Change Memory written by SangBum Kim and has been published by Stanford University this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
Various memory devices are being widely used for a wide range of applications. There has not been any universal memory device so far because each memory device has a unique set of features. Large performance gaps in various dimensions of features between memory devices and a new set of features required by new electronic systems such as portable electronics open up new opportunities for new memory devices to emerge as mainstream memory devices. Besides, the imminent scaling limit for existing mainstream memory devices also motivates development and research of new memory devices which can meet the increasing demand for large memory capacity. Phase change memory (PCM) is one of the most promising emerging memory devices. It has the potential to combine DRAM-like features such as bit alteration, fast read and write, and good endurance and Flash-like features such as non-volatility and a simple structure. PCM is expected to be a highly scalable technology extending beyond scaling limit of existing memory devices. Prototypical PCM chips have been developed and are being tested for targeted memory applications. However, understanding of fundament physics behind PCM operation is still lacking because the key material in PCM devices, the chalcogenide, is relatively new for use in solid state devices. Evaluation and development of PCM technology as successful mainstream memory devices require more study on PCM devices. This thesis focuses on issues relevant to scalability and reliability of PCM which are two of the most important qualities that new emerging memory devices should demonstrate. We first study basic scaling rule based on thermoelectric analysis on the maximum temperature in a PCM cell and show that both isotropic and non-isotropic scaling result in constant programming voltage. The minimum programming voltage is determined by material properties such as electrical resistivity and thermal conductivity regardless of the device size. These results highlight first-order principles governing scaling rules. In the first-order scaling rule analysis, we assume that material properties are constant regardless of its physical size. However, when materials are scaled down to the nanometer regime, material properties can change because the relative contribution from the surface property to the overall system property increases compared to that from the bulk property. We study scaling effect on material property and device characteristics using a novel device structure -- a PCM cell with a pseudo electrode. With the pseudo electrode PCM cell, we can accurately relate the observed properties to the amorphous region size. We show that threshold switching voltage scales linearly with thickness of the amorphous region and threshold switching field drifts in time after programming. We also show that the drift coefficient for resistance drift stays the same for scaled devices. These property scaling results provide not only estimates for scaled device characteristics but also clues for modeling and understanding mechanisms for threshold switching and drift. To make scaled memory cells in an array form, not only memory device elements but also selection devices need to be scaled. PCM requires relatively large programming current, which makes it challenging to scale down selection devices. We integrate Ge nanowire diodes as selection devices in search for new candidates for high density PCM. Ge nanowire diode provides on/off ratio of ~100 and small contact area of 40 nm in diameter which results in programming current below 200 [mu]A. The processing temperature for Ge nanowire diode is below 400°C, which makes Ge nanowire diode a potential enabler for 3D integration. As memory devices are scaled down, more serious reliability issues arise. We study the reliability of PCM using a novel structure -- micro-thermal stage (MTS). The high-resistance-state (RESET) resistance and threshold switching voltage are important device characteristics for reliable operation of PCM devices. We study the drift behavior of RESET resistance and threshold switching voltage and its temperature dependence using the MTS. Results show that the drift coefficient increases proportionally to annealing temperature until it saturates. The analytical drift model for time-varying annealing temperature that we derive from existing phenomenological drift models agrees well with the measurement results. The analytical drift model can be used to estimate the impact of thermal disturbance (program disturbance) on RESET resistance and threshold switching voltage. Thermal disturbance is a unique disturbance mechanism in PCM which is caused by thermal diffusion from a cell being programmed. The MTS can effectively emulate the short heat pulse, enabling detailed study on thermal disturbance impact on cell characteristics. We show that random thermal disturbance can result in at least 25 and 100 % variations in RESET resistance and threshold switching voltage. The existing model on how to add up the impact of thermal disturbance on crystallization is experimentally verified using the MTS. Based on measurement and modeling results, we propose a new programming scheme to improve stability of PCM with a short-time annealing pulse.
Nonvolatile Memory Design
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Author : Hai Li
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Nonvolatile Memory Design written by Hai Li and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Computers categories.
The manufacture of flash memory, which is the dominant nonvolatile memory technology, is facing severe technical barriers. So much so, that some emerging technologies have been proposed as alternatives to flash memory in the nano-regime. Nonvolatile Memory Design: Magnetic, Resistive, and Phase Changing introduces three promising candidates: phase-change memory, magnetic random access memory, and resistive random access memory. The text illustrates the fundamental storage mechanism of these technologies and examines their differences from flash memory techniques. Based on the latest advances, the authors discuss key design methodologies as well as the various functions and capabilities of the three nonvolatile memory technologies.
Phase Change Materials
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Author : Simone Raoux
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-06-10
Phase Change Materials written by Simone Raoux and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-06-10 with Technology & Engineering categories.
"Phase Change Materials: Science and Applications" provides a unique introduction of this rapidly developing field. Clearly written and well-structured, this volume describes the material science of these fascinating materials from a theoretical and experimental perspective. Readers will find an in-depth description of their existing and potential applications in optical and solid state storage devices as well as reconfigurable logic applications. Researchers, graduate students and scientists with an interest in this field will find "Phase Change Materials" to be a valuable reference.
Phase Change Memory
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Author : Andrea Redaelli
language : en
Publisher: Springer
Release Date : 2018-09-09
Phase Change Memory written by Andrea Redaelli and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-09 with Technology & Engineering categories.
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
Scalability And Reliability Of Phase Change Memory
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Author : SangBum Kim
language : en
Publisher:
Release Date : 2010
Scalability And Reliability Of Phase Change Memory written by SangBum Kim and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
Various memory devices are being widely used for a wide range of applications. There has not been any universal memory device so far because each memory device has a unique set of features. Large performance gaps in various dimensions of features between memory devices and a new set of features required by new electronic systems such as portable electronics open up new opportunities for new memory devices to emerge as mainstream memory devices. Besides, the imminent scaling limit for existing mainstream memory devices also motivates development and research of new memory devices which can meet the increasing demand for large memory capacity. Phase change memory (PCM) is one of the most promising emerging memory devices. It has the potential to combine DRAM-like features such as bit alteration, fast read and write, and good endurance and Flash-like features such as non-volatility and a simple structure. PCM is expected to be a highly scalable technology extending beyond scaling limit of existing memory devices. Prototypical PCM chips have been developed and are being tested for targeted memory applications. However, understanding of fundament physics behind PCM operation is still lacking because the key material in PCM devices, the chalcogenide, is relatively new for use in solid state devices. Evaluation and development of PCM technology as successful mainstream memory devices require more study on PCM devices. This thesis focuses on issues relevant to scalability and reliability of PCM which are two of the most important qualities that new emerging memory devices should demonstrate. We first study basic scaling rule based on thermoelectric analysis on the maximum temperature in a PCM cell and show that both isotropic and non-isotropic scaling result in constant programming voltage. The minimum programming voltage is determined by material properties such as electrical resistivity and thermal conductivity regardless of the device size. These results highlight first-order principles governing scaling rules. In the first-order scaling rule analysis, we assume that material properties are constant regardless of its physical size. However, when materials are scaled down to the nanometer regime, material properties can change because the relative contribution from the surface property to the overall system property increases compared to that from the bulk property. We study scaling effect on material property and device characteristics using a novel device structure -- a PCM cell with a pseudo electrode. With the pseudo electrode PCM cell, we can accurately relate the observed properties to the amorphous region size. We show that threshold switching voltage scales linearly with thickness of the amorphous region and threshold switching field drifts in time after programming. We also show that the drift coefficient for resistance drift stays the same for scaled devices. These property scaling results provide not only estimates for scaled device characteristics but also clues for modeling and understanding mechanisms for threshold switching and drift. To make scaled memory cells in an array form, not only memory device elements but also selection devices need to be scaled. PCM requires relatively large programming current, which makes it challenging to scale down selection devices. We integrate Ge nanowire diodes as selection devices in search for new candidates for high density PCM. Ge nanowire diode provides on/off ratio of ~100 and small contact area of 40 nm in diameter which results in programming current below 200 [mu]A. The processing temperature for Ge nanowire diode is below 400°C, which makes Ge nanowire diode a potential enabler for 3D integration. As memory devices are scaled down, more serious reliability issues arise. We study the reliability of PCM using a novel structure -- micro-thermal stage (MTS). The high-resistance-state (RESET) resistance and threshold switching voltage are important device characteristics for reliable operation of PCM devices. We study the drift behavior of RESET resistance and threshold switching voltage and its temperature dependence using the MTS. Results show that the drift coefficient increases proportionally to annealing temperature until it saturates. The analytical drift model for time-varying annealing temperature that we derive from existing phenomenological drift models agrees well with the measurement results. The analytical drift model can be used to estimate the impact of thermal disturbance (program disturbance) on RESET resistance and threshold switching voltage. Thermal disturbance is a unique disturbance mechanism in PCM which is caused by thermal diffusion from a cell being programmed. The MTS can effectively emulate the short heat pulse, enabling detailed study on thermal disturbance impact on cell characteristics. We show that random thermal disturbance can result in at least 25 and 100 % variations in RESET resistance and threshold switching voltage. The existing model on how to add up the impact of thermal disturbance on crystallization is experimentally verified using the MTS. Based on measurement and modeling results, we propose a new programming scheme to improve stability of PCM with a short-time annealing pulse.
Durable Phase Change Memory Architectures
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Author :
language : en
Publisher: Academic Press
Release Date : 2020-03-09
Durable Phase Change Memory Architectures written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-03-09 with Computers categories.
Advances in Computers, Volume 118, the latest volume in this innovative series published since 1960, presents detailed coverage of new advancements in computer hardware, software, theory, design and applications. Chapters in this updated release include Introduction to non-volatile memory technologies, The emerging phase-change memory, Phase-change memory architectures, Inter-line level schemes for handling hard errors in PCMs, Handling hard errors in PCMs by using intra-line level schemes, and Addressing issues with MLC Phase-change Memory. Gives a comprehensive overlook of new memory technologies, including PCM Provides reliability features with an in-depth discussion of physical mechanisms that are currently limiting PCM capabilities Covers the work of well-known authors and researchers in the field Includes volumes that are devoted to single themes or subfields of computer science