Progress In Transmission Electron Microscopy
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Progress In Transmission Electron Microscopy 1
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Author : Xiao-Feng Zhang
language : en
Publisher: Springer Science & Business Media
Release Date : 2001-10-18
Progress In Transmission Electron Microscopy 1 written by Xiao-Feng Zhang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-10-18 with Medical categories.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Progress In Transmission Electron Microscopy 2
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Author : Xiao-Feng Zhang
language : en
Publisher: Springer Science & Business Media
Release Date : 2001-10-18
Progress In Transmission Electron Microscopy 2 written by Xiao-Feng Zhang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-10-18 with Medical categories.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Applications In Materials Science
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Author : Xiao-Feng Zhang
language : en
Publisher:
Release Date : 2001
Applications In Materials Science written by Xiao-Feng Zhang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.
Progress In Transmission Electron Microscopy
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Author : Xiao-Feng Zhang
language : en
Publisher:
Release Date : 1999
Progress In Transmission Electron Microscopy written by Xiao-Feng Zhang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Transmission electron microscopy categories.
Progress In Transmission Electron Microscopy
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Author : Xiao-Feng Zhang
language : en
Publisher:
Release Date : 2001
Progress In Transmission Electron Microscopy written by Xiao-Feng Zhang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Science categories.
Advances In Imaging And Electron Physics
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Author : Peter W. Hawkes
language : en
Publisher: Elsevier
Release Date : 2004-05-26
Advances In Imaging And Electron Physics written by Peter W. Hawkes and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-05-26 with Science categories.
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading. - Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics - Presents theory and it's application in a practical sense, providing long awaited solutions and new findings - Provides a comprehensive overview of international congress proceedings and associated publications, as source material
Progress In Transmission Electron Microscopy 1
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Author : Xiao-Feng Zhang
language : en
Publisher: Springer
Release Date : 2001
Progress In Transmission Electron Microscopy 1 written by Xiao-Feng Zhang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Technology & Engineering categories.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2011-03-29
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-29 with Technology & Engineering categories.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
The Transmission Electron Microscope
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Author : Khan Maaz
language : en
Publisher: BoD – Books on Demand
Release Date : 2015-09-02
The Transmission Electron Microscope written by Khan Maaz and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-09-02 with Science categories.
This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
Progress In Transmission Electron Microscopy 2
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Author : Xiao-Feng Zhang
language : en
Publisher: Springer
Release Date : 2001-10-18
Progress In Transmission Electron Microscopy 2 written by Xiao-Feng Zhang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-10-18 with Technology & Engineering categories.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.