Protecting Electronic Equipment From Electrostatic Discharge
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Protecting Electronic Equipment From Electrostatic Discharge
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Author : Edward A. Lacy
language : en
Publisher:
Release Date : 1984
Protecting Electronic Equipment From Electrostatic Discharge written by Edward A. Lacy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Electric discharges categories.
Electrostatic Discharge Control Handbook For Protection Of Electrical And Electronic Parts Assemblies And Equipment Excluding Electrically Initiated Explosive Devices Metric
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Author : United States. Department of Defense
language : en
Publisher:
Release Date : 1991
Electrostatic Discharge Control Handbook For Protection Of Electrical And Electronic Parts Assemblies And Equipment Excluding Electrically Initiated Explosive Devices Metric written by United States. Department of Defense and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Electric discharges categories.
Electrostatic Discharge Protection
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Author : Juin J. Liou
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Electrostatic Discharge Protection written by Juin J. Liou and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.
Esd The Scourge Of Electronics
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Author : Sten Hellström
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Esd The Scourge Of Electronics written by Sten Hellström and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This book on electrostatic discharge phenomena is essentially a translation and update ofa Swedish edition from 1992. The book is intended for people working with electronic circuits and equipments, in application and development. All personnel should be aware of the ESD-hazards, especially those responsible for quality. ESD-prevention is a part of TQM (Total Quality Management). The book is also usable for courses on the subject. Background It was soon realised that the MOS-circuits (MOS=Metal Oxide Semiconductor), which appeared in the beginning of the 1960-ties were sensitive to electrostatic discharges. But a severe accident accelerated the search for materials that do not generate electric charges. In April 1964 three people were working inside a satellite at Cape Kennedy Space Center. They suddenly screamed "we are burning". They died. The satellite incapsulation was covered with untreated plastics to protect against dust. When the plastics was pulled off both this and the metal incapsulating got charged. A discharge from the metal ignited inflammable parts of the satellite. Eleven more people were injured and the cost of the accident amounted to about 55 billions USD.
Electrostatic Discharge Protection For Electronics
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Author : Neil Sclater
language : en
Publisher: Tab Books
Release Date : 1990
Electrostatic Discharge Protection For Electronics written by Neil Sclater and has been published by Tab Books this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Technology & Engineering categories.
Neil Sclater offers practical advice on selecting test and control equipment, handling and storing semiconductors and other components, building static-free workstations, creating a protective environment for electronics, and much more. A complete listing of manufacturers and suppliers in included. Prior to founding his own electronics marketing research firm, Neil Sclater worked as an engineer for several leading corporations and as editor for Electronic Design and Product Engineering. He is the author of TPR's Gallium Arsenide IC Technology (No 3089).
Electrical Overstress Protection For Electronic Devices
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Author : Robert J. Antinone
language : en
Publisher: William Andrew
Release Date : 1986
Electrical Overstress Protection For Electronic Devices written by Robert J. Antinone and has been published by William Andrew this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Electric action of points categories.
Esd From A To Z
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Author : John M. Kolyer
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Esd From A To Z written by John M. Kolyer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Existing sections in ESD Frim A to Z have been thoroughly revised and updated. New examples have been added to the troubleshooting chapter; and new versions of model specifications for ESD-safe handling and packaging can be found in the specifications chapter. The Appendix now includes ten recently published papers (making a total of 20) whose topics span the field of ESD control.
Esd Protection Device And Circuit Design For Advanced Cmos Technologies
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Author : Oleg Semenov
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-04-26
Esd Protection Device And Circuit Design For Advanced Cmos Technologies written by Oleg Semenov and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-04-26 with Technology & Engineering categories.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.
On Chip Esd Protection For Integrated Circuits
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Author : Albert Z.H. Wang
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-03
On Chip Esd Protection For Integrated Circuits written by Albert Z.H. Wang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-03 with Technology & Engineering categories.
This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. ESD failure analysis, protection devices, and protection of sub-circuits Whole-chip ESD protection and ESD-to-circuit interactions Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field.
Electrical Overstress Eos
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Author : Steven H. Voldman
language : en
Publisher: John Wiley & Sons
Release Date : 2013-10-28
Electrical Overstress Eos written by Steven H. Voldman and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-28 with Technology & Engineering categories.
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.