Radiation Damage In Charge Coupled Devices
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Effects Of Radiation Damage On Scientific Charge Coupled Devices Microform
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Author : Timothy D. Hardy
language : en
Publisher: National Library of Canada = Bibliothèque nationale du Canada
Release Date : 1997
Effects Of Radiation Damage On Scientific Charge Coupled Devices Microform written by Timothy D. Hardy and has been published by National Library of Canada = Bibliothèque nationale du Canada this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Charge coupled devices categories.
Radiation Damage In Charge Coupled Devices
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Author : David Ryan Smith
language : en
Publisher:
Release Date : 2003
Radiation Damage In Charge Coupled Devices written by David Ryan Smith and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with categories.
Effects Of Radiation Damage On Scientific Charge Coupled Devices
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Author : Timothy D. Hardy
language : en
Publisher:
Release Date : 1997
Effects Of Radiation Damage On Scientific Charge Coupled Devices written by Timothy D. Hardy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Charge coupled devices categories.
Radiation Damage Effects In Charge Coupled Devices
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Author : Mark Stanford Robbins
language : en
Publisher:
Release Date : 1992
Radiation Damage Effects In Charge Coupled Devices written by Mark Stanford Robbins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.
Radiation Damage Effect In Charge Coupled Devices
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Author : Mark Stanford Robbins
language : en
Publisher:
Release Date : 1992
Radiation Damage Effect In Charge Coupled Devices written by Mark Stanford Robbins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.
Radiation Damage In Scientific Charge Coupled Devices
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Author : Niels Bassler
language : en
Publisher:
Release Date : 2002
Radiation Damage In Scientific Charge Coupled Devices written by Niels Bassler and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with categories.
Radiation Damage In Optical Charge Coupled Devices
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Author :
language : en
Publisher:
Release Date : 1996
Radiation Damage In Optical Charge Coupled Devices written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with categories.
Ccd Image Sensors In Deep Ultraviolet
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Author : Flora Li
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-05
Ccd Image Sensors In Deep Ultraviolet written by Flora Li and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-05 with Technology & Engineering categories.
As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.
Ionizing Radiation Effects In Electronics
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Author : Marta Bagatin
language : en
Publisher: CRC Press
Release Date : 2018-09-03
Ionizing Radiation Effects In Electronics written by Marta Bagatin and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-03 with Technology & Engineering categories.
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Radiation Effects On Charge Coupled Devices And Other Mos Structures
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Author : Joseph R. Srour
language : en
Publisher:
Release Date : 1978
Radiation Effects On Charge Coupled Devices And Other Mos Structures written by Joseph R. Srour and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with categories.
This report describes results of radiation effects studies on charge-coupled devices (CCDs) and other MOS structures. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of neutron damage mechanisms in CCDs was performed with emphasis placed on investigation of dark current increases.