Rapid Reliability Assessment Of Vlsics

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Rapid Reliability Assessment Of Vlsics

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Author : A.P. Dorey
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Rapid Reliability Assessment Of Vlsics written by A.P. Dorey and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measurements that may reveal those devices more likely to fail. The measurements assessed are of analog circuit parameters which, based on a knowledge of failure mechanisms, may indicate a future failure. . To incorporate these tests into the functional listing of very large scale integrated circuits consideration has to be given to the sensitivity of the tests where small numbers of devices may be defective in a complex circuit. In addition the tests ideally should require minimal extra test time. A range of tests has been evaluated and compared with simulation used to assess the sensitivity of the measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently retired from the British Telecom Research Laboratories, for his cheerful and enthusiastic encouragement. Trevor Ingham, now in New Zealand, is thanked for his early work on the project.

Advances In Electronics And Electron Physics

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Author :
language : en
Publisher: Academic Press
Release Date : 1993-11-17

Advances In Electronics And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-11-17 with Computers categories.

Advances in Electronics and Electron Physics

The Physical Properties Of Thin Metal Films

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Author : G.P. Zhigal'skii
language : en
Publisher: CRC Press
Release Date : 2003-07-10

The Physical Properties Of Thin Metal Films written by G.P. Zhigal'skii and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-07-10 with Technology & Engineering categories.

Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.

Reliability Of Electronic Components

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Author : Titu I. Bajenescu
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Reliability Of Electronic Components written by Titu I. Bajenescu and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

The Cumulative Book Index

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Author :
language : en
Publisher:
Release Date : 1991

The Cumulative Book Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with American literature categories.

A world list of books in the English language.

Proceedings Of The Midwest Symposium On Circuits And Systems

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Author :
language : en
Publisher:
Release Date : 1995

Proceedings Of The Midwest Symposium On Circuits And Systems written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Electric circuits categories.

International Test Conference 1993

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Author :
language : en
Publisher: Conference
Release Date : 1993

International Test Conference 1993 written by and has been published by Conference this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Technology & Engineering categories.

Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.

Proceedings

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Author :
language : en
Publisher:
Release Date : 1994

Proceedings written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Computer storage devices categories.

Proceedings International Test Conference 1996

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Author :
language : en
Publisher: Conference
Release Date : 1996

Proceedings International Test Conference 1996 written by and has been published by Conference this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Computers categories.

ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.

Who S Who In Science In Europe

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Author :
language : en
Publisher:
Release Date : 1967

Who S Who In Science In Europe written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1967 with Scientists categories.

Volumes for 1972- include also scientists from the East European countries.