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Reflection High Energy Electron Diffraction And Reflection Electron Imaging Of Surfaces


Reflection High Energy Electron Diffraction And Reflection Electron Imaging Of Surfaces
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Reflection High Energy Electron Diffraction And Reflection Electron Imaging Of Surfaces


Reflection High Energy Electron Diffraction And Reflection Electron Imaging Of Surfaces
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Author : P.K. Larsen
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Reflection High Energy Electron Diffraction And Reflection Electron Imaging Of Surfaces written by P.K. Larsen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.


This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.



Reflection High Energy Electron Diffraction


Reflection High Energy Electron Diffraction
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Author : Ayahiko Ichimiya
language : en
Publisher: Cambridge University Press
Release Date : 2004-12-13

Reflection High Energy Electron Diffraction written by Ayahiko Ichimiya and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12-13 with Science categories.


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High Energy Electron Diffraction And Microscopy


High Energy Electron Diffraction And Microscopy
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Author : L.-M. Peng
language : en
Publisher: Oxford University Press, USA
Release Date : 2004

High Energy Electron Diffraction And Microscopy written by L.-M. Peng and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Science categories.


This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.



Compendium Of Surface And Interface Analysis


Compendium Of Surface And Interface Analysis
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Author : The Surface Science Society of Japan
language : en
Publisher: Springer
Release Date : 2018-02-19

Compendium Of Surface And Interface Analysis written by The Surface Science Society of Japan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-19 with Technology & Engineering categories.


This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.



High Energy Electron Diffraction And Microscopy


High Energy Electron Diffraction And Microscopy
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Author : L. M. Peng
language : en
Publisher: Oxford University Press
Release Date : 2004-01-08

High Energy Electron Diffraction And Microscopy written by L. M. Peng and has been published by Oxford University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-08 with Science categories.


This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.



Applied Rheed


Applied Rheed
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Author : Wolfgang Braun
language : en
Publisher: Springer Science & Business Media
Release Date : 1999-04-16

Applied Rheed written by Wolfgang Braun and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-04-16 with Science categories.


The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.



Surface Microscopy With Low Energy Electrons


Surface Microscopy With Low Energy Electrons
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Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10

Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.


This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.



Characterization Of Materials


Characterization Of Materials
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Author : Elton N. Kaufmann
language : en
Publisher: John Wiley & Sons
Release Date : 2012

Characterization Of Materials written by Elton N. Kaufmann and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Materials categories.


"A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--



Modern Techniques Of Surface Science


Modern Techniques Of Surface Science
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Author : D. P. Woodruff
language : en
Publisher: Cambridge University Press
Release Date : 1994-03-03

Modern Techniques Of Surface Science written by D. P. Woodruff and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-03-03 with Science categories.


This is a fully revised and expanded edition of a very successful and widely used book. It describes the physical basis of all the principal, and most of the more specialised, techniques currently employed in the study of well-characterised solid surfaces. The coverage of each technique, illustrated with selected examples, is underpinned by discussion of the relevant physical principles, and the complementary aspects of the various methods are also described. Throughout, the emphasis is on understanding the concepts involved, rather than on an exhaustive review of applications. The book will be of great use to final year undergraduate and postgraduate students in physics, chemistry and materials science. It will also be valuable to established researchers in any area of surface science concerned with the acquisition and analysis of experimental data.



Electron Microscopy


Electron Microscopy
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Author : S. Amelinckx
language : en
Publisher: John Wiley & Sons
Release Date : 2008-09-26

Electron Microscopy written by S. Amelinckx and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-09-26 with Technology & Engineering categories.


Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.