Reliability Prediction For Microelectronics
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Reliability Prediction For Microelectronics
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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-13
Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-13 with Technology & Engineering categories.
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Reliability Prediction For Microelectronics
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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-20
Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-20 with Technology & Engineering categories.
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Physics Of Failure Based Handbook Of Microelectronic Systems
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Author : Shahrzad Salemi
language : en
Publisher: RIAC
Release Date : 2008
Physics Of Failure Based Handbook Of Microelectronic Systems written by Shahrzad Salemi and has been published by RIAC this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Science categories.
Semiconductor Device Reliability
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Author : A. Christou
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Semiconductor Device Reliability written by A. Christou and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Reliability Analysis And Prediction
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Author : K.B. Misra
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Reliability Analysis And Prediction written by K.B. Misra and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
This book equips the reader with a compact information source on all the most recent methodological tools available in the area of reliability prediction and analysis. Topics covered include reliability mathematics, organisation and analysis of data, reliability modelling and system reliability evaluation techniques. Environmental factors and stresses are taken into account in computing the reliability of the involved components. The limitations of models, methods, procedures, algorithms and programmes are outlined. The treatment of maintained systems is designed to aid the worker in analysing systems with more realistic and practical assumptions. Fault tree analysis is also extensively discussed, incorporating recent developments. Examples and illustrations support the reader in the solving of problems in his own area of research. The chapters provide a logical and graded presentation of the subject matter bearing in mind the difficulties of a beginner, whilst bridging the information gap for the more experienced reader. The work will be of considerable interest to engineers working in various industries, research organizations, particularly in defence, nuclear, chemical, space or communications. It will also be an indispensable study aid for serious-minded students and teachers.
Thermal And Power Management Of Integrated Circuits
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Author : Arman Vassighi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-01
Thermal And Power Management Of Integrated Circuits written by Arman Vassighi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-01 with Technology & Engineering categories.
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Reliability Maintainability And Risk
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Author : David J. Smith
language : en
Publisher: Elsevier
Release Date : 2011-06-29
Reliability Maintainability And Risk written by David J. Smith and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-06-29 with Business & Economics categories.
Reliability, Maintainability and Risk: Practical Methods for Engineers, Eighth Edition, discusses tools and techniques for reliable and safe engineering, and for optimizing maintenance strategies. It emphasizes the importance of using reliability techniques to identify and eliminate potential failures early in the design cycle. The focus is on techniques known as RAMS (reliability, availability, maintainability, and safety-integrity). The book is organized into five parts. Part 1 on reliability parameters and costs traces the history of reliability and safety technology and presents a cost-effective approach to quality, reliability, and safety. Part 2 deals with the interpretation of failure rates, while Part 3 focuses on the prediction of reliability and risk. Part 4 discusses design and assurance techniques; review and testing techniques; reliability growth modeling; field data collection and feedback; predicting and demonstrating repair times; quantified reliability maintenance; and systematic failures. Part 5 deals with legal, management and safety issues, such as project management, product liability, and safety legislation. - 8th edition of this core reference for engineers who deal with the design or operation of any safety critical systems, processes or operations - Answers the question: how can a defect that costs less than $1000 dollars to identify at the process design stage be prevented from escalating to a $100,000 field defect, or a $1m+ catastrophe - Revised throughout, with new examples, and standards, including must have material on the new edition of global functional safety standard IEC 61508, which launches in 2010
Prediction Technologies For Improving Engineering Product Efficiency
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Author : Lev M. Klyatis
language : en
Publisher: Springer Nature
Release Date : 2023-01-03
Prediction Technologies For Improving Engineering Product Efficiency written by Lev M. Klyatis and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-01-03 with Technology & Engineering categories.
This book is aimed at readers who need to learn the latest solutions for interconnected simulation, testing, and prediction technologies that improve engineering product efficiency, including reliability, safety, quality, durability, maintainability, life-cycle costing and profit. It provides a detailed analysis of technologies now being used in industries such as electronics, automotive, aircraft, aerospace, off-highway, farm machinery, and others. It includes clear examples, charts, and illustrations. This book provides analyses of the simulation, testing, and prediction approaches and methodologies with descriptive, negative trends in their development. The author discusses why many current methods of simulation, testing, and prediction are not successful and describes novel techniques and tools developed for eliminating these problems. This book is a tool for engineers, managers, researches in industry, teachers, and students. Lev Klyatis, Hab. Dr.-Ing., ScD., PhD, Senior Advisor SoHaR, Inc., has been a professor at Moscow State Agricultural Engineering University, research leader and chairman of State Enterprise TESTMASH, and served on the US Technical Advisory Group for the International Electrotechnical Commission (IEC), the ISO/IEC Join Study Group in Safety Aspects of Risk Assessment, the United Nations European Economical Commission, and US-USSR Trade and Economic Council. He is presently a member of World Quality Council, the Elmer A. Sperry Board of Award, SAE International G-41 Reliability Committee, the Integrated Design and Manufacturing Committee and session chairman of SAE International World Congresses in Detroit since 2012. His vast experience and innovation enable him to create a new direction for the successful prediction of product efficiency during any given time, including accurate simulation of real-world conditions, accelerated reliability and durability testing technology, and reducing recalls. His approach has been verified in various industries, primarily automotive, farm machinery, aerospace, and aircraft industries. He has shared his new direction working as the seminar instructor and consultant to Ford, DaimlerChrysler, Nissan, Toyota, Jatko Ltd., Thermo King, Black an Dekker, NASA Research Centers, Karl Schenck, and many others. He holds over 30 patents worldwide and is the author of over 300 publications, including 15 books.
Prognostics And Health Management Of Electronics
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Author : Michael G. Pecht
language : en
Publisher: John Wiley & Sons
Release Date : 2018-08-15
Prognostics And Health Management Of Electronics written by Michael G. Pecht and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-08-15 with Technology & Engineering categories.
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
1983 Proceedings Annual Reliability And Maintainability Symposium
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Author :
language : en
Publisher:
Release Date : 1983
1983 Proceedings Annual Reliability And Maintainability Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983 with Maintainability (Engineering) categories.