Scanning Probe Microscopes
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Bringing Scanning Probe Microscopy Up To Speed
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Author : Stephen C. Minne
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Bringing Scanning Probe Microscopy Up To Speed written by Stephen C. Minne and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.
Applied Scanning Probe Methods Ii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-22
Applied Scanning Probe Methods Ii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-22 with Technology & Engineering categories.
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Scanning Probe Microscopes
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Author : K. S. Birdi
language : en
Publisher: CRC Press
Release Date : 2003-02-26
Scanning Probe Microscopes written by K. S. Birdi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-02-26 with Science categories.
Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an
Scanning Probe Microscopy
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Author : Ernst Meyer
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-14
Scanning Probe Microscopy written by Ernst Meyer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-14 with Science categories.
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Scanning Probe Microscopy And Spectroscopy
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Author : Roland Wiesendanger
language : en
Publisher: Cambridge University Press
Release Date : 1994-09-29
Scanning Probe Microscopy And Spectroscopy written by Roland Wiesendanger and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-09-29 with Science categories.
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Scanning Probe Microscopy
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Author : Bert Voigtländer
language : en
Publisher: Springer
Release Date : 2015-02-24
Scanning Probe Microscopy written by Bert Voigtländer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-24 with Technology & Engineering categories.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
A Practical Guide To Scanning Probe Microscopy
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Author : Rebecca Howland
language : en
Publisher:
Release Date : 1998-06
A Practical Guide To Scanning Probe Microscopy written by Rebecca Howland and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-06 with categories.
Provides basic information about scanning probe microscopes (SPMs), which are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, & spectacular three-dimensional imaging -- from atoms of silicon to micron-sized protrusions on the surface of a living cell. Issues covered in this handbook range from fundamental physics of SPMs to their practical capabilities & instrumentation. Examples of applications are included throughout the text, & several application-specific articles are listed at the end of each chapter.
Scanning Probe Microscopy
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Author : Sergei V. Kalinin
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-04-03
Scanning Probe Microscopy written by Sergei V. Kalinin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-04-03 with Technology & Engineering categories.
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Applied Scanning Probe Methods Iii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-28
Applied Scanning Probe Methods Iii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-28 with Technology & Engineering categories.
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Applied Scanning Probe Methods Viii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-12-20
Applied Scanning Probe Methods Viii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-20 with Technology & Engineering categories.
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.