Special Section On The 12th Ieee Vlsi Test Symposium

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Special Section On The 12th Ieee Vlsi Test Symposium

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Author :
language : en
Publisher:
Release Date : 1995

Special Section On The 12th Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with categories.

Special Section On The 12th Ieee Vlsi Test Symposium

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Author : W. Maly
language : en
Publisher:
Release Date : 1995

Special Section On The 12th Ieee Vlsi Test Symposium written by W. Maly and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Application-specific integrated circuits categories.

Index To Ieee Publications

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Author : Institute of Electrical and Electronics Engineers
language : en
Publisher:
Release Date : 1998

Index To Ieee Publications written by Institute of Electrical and Electronics Engineers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Electric engineering categories.

Issues for 1973- cover the entire IEEE technical literature.

On Line Testing For Vlsi

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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09

On Line Testing For Vlsi written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Constructive Side Channel Analysis And Secure Design

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Author : Werner Schindler
language : en
Publisher: Springer
Release Date : 2012-04-23

Constructive Side Channel Analysis And Secure Design written by Werner Schindler and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-23 with Computers categories.

This book constitutes the refereed proceedings of the Third International Workshop on Constructive Side-Channel Analysis and Secure Design, COSADE 2012, held in Darmstadt, Germany, May 2012. The 16 revised full papers presented together with two invited talks were carefully reviewed and selected from 49 submissions. The papers are organized in topical sections on practical side-channel analysis; secure design; side-channel attacks on RSA; fault attacks; side-channel attacks on ECC; different methods in side-channel analysis.

Proceedings Of The 3rd International Conference On Signal And Data Processing

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Author : Raghunath K. Shevgaonkar
language : en
Publisher: Springer Nature
Release Date : 2025-05-02

Proceedings Of The 3rd International Conference On Signal And Data Processing written by Raghunath K. Shevgaonkar and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-05-02 with Technology & Engineering categories.

This volume comprises the select proceedings of the 3rd International Conference on Signal & Data Processing - ICSDP 2023. The contents focus on the latest research and developments in the field of artificial intelligence & machine learning, Internet of Things (IoT), cybernetics, advanced communication systems, VLSI embedded systems, power electronics and automation, MEMS/ nanotechnology, renewable energy, bioinformatics, data acquisition and mining, antenna & RF systems, power systems, biomedical engineering, aerospace & navigation. This volume will prove to be a valuable resource for those in academia and industry.

Integrated Circuit Manufacturability

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Author : José Pineda de Gyvez
language : en
Publisher: John Wiley & Sons
Release Date : 1998-10-30

Integrated Circuit Manufacturability written by José Pineda de Gyvez and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-10-30 with Technology & Engineering categories.

"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."

Advances In Electronic Testing

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Author : Dimitris Gizopoulos
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-22

Advances In Electronic Testing written by Dimitris Gizopoulos and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-22 with Technology & Engineering categories.

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Advances In Vlsi And Embedded Systems

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Author : Zuber Patel
language : en
Publisher: Springer Nature
Release Date : 2020-08-28

Advances In Vlsi And Embedded Systems written by Zuber Patel and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-08-28 with Technology & Engineering categories.

This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.

Hybrid Fault Tolerance Techniques To Detect Transient Faults In Embedded Processors

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Author : José Rodrigo Azambuja
language : en
Publisher: Springer
Release Date : 2014-07-07

Hybrid Fault Tolerance Techniques To Detect Transient Faults In Embedded Processors written by José Rodrigo Azambuja and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-07 with Technology & Engineering categories.

This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. They are able to reduce overall performance degradation and increase error detection when associated with applications implemented in embedded processors. Coverage begins with an extensive discussion of the current state-of-the-art in fault tolerance techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques. Proposed techniques increase existing fault detection rates up to 100%, while maintaining low performance overheads in area and application execution time.