Spectroscopic Characterization Techniques For Semiconductor Technology Ii
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Spectroscopic Characterization Techniques For Semiconductor Technology
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Author :
language : en
Publisher:
Release Date : 1994
Spectroscopic Characterization Techniques For Semiconductor Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Semiconductors categories.
Spectroscopic Characterization Techniques For Semiconductor Technology Ii
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Author : Fred H. Pollak
language : en
Publisher:
Release Date : 1985
Spectroscopic Characterization Techniques For Semiconductor Technology Ii written by Fred H. Pollak and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with categories.
Spectroscopic Characterization Techniques For Semiconductor Technology Iii
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Author : O. J. Glembocki
language : en
Publisher:
Release Date : 1988
Spectroscopic Characterization Techniques For Semiconductor Technology Iii written by O. J. Glembocki and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Technology & Engineering categories.
Journal Of Research Of The National Institute Of Standards And Technology
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Author :
language : en
Publisher:
Release Date : 1994
Journal Of Research Of The National Institute Of Standards And Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Measurement categories.
Spectroscopic Characterization Techniques For Semiconductor Technology Ii
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Author : Fred H. Pollak
language : en
Publisher:
Release Date : 1985
Spectroscopic Characterization Techniques For Semiconductor Technology Ii written by Fred H. Pollak and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Electronic books categories.
Optical Characterization Of Semiconductors
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Author : Sidney Perkowitz
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Optical Characterization Of Semiconductors written by Sidney Perkowitz and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.Discusses and compares infrared, Raman, and photoluminescence methodsEnables readers to choose the best method for a given problemIllustrates applications to help non-experts and industrial users, with answers to selected common problemsPresents fundamentals with examples from the semiconductor literature without excessive abstract discussionFeatures equipment lists and discussion of techniques to help establish characterization laboratories
Review
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Author :
language : en
Publisher:
Release Date : 1985
Review written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Naval research categories.
Spectroscopic Characterization Techniques For Semiconductor Technology Ii
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Author :
language : en
Publisher:
Release Date : 1985
Spectroscopic Characterization Techniques For Semiconductor Technology Ii written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Semiconductors categories.
Handbook Of Compound Semiconductors
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Author : Paul H. Holloway
language : en
Publisher: Cambridge University Press
Release Date : 2008-10-19
Handbook Of Compound Semiconductors written by Paul H. Holloway and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-19 with Technology & Engineering categories.
This book reviews the recent advances and current technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides a complete overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc.
Laser Processing And Diagnostics
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Author : D. Bäuerle
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Laser Processing And Diagnostics written by D. Bäuerle and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
Laser processing is now a rapidly increasing field with many real and potential applications in different areas of technology such as micromecha nics, metallurgy, integrated optics, and semiconductor device fabrication. The neces s ity for such soph i st i cated 1 i ght sources as 1 asers is based on the spatial coherence and the monochromaticity of laser light. The spatial coherence permits extreme focussing of the laser light resulting in the availability of high energy densities which can be used for strongly loca lized heat- and chemical-treatment of materials, with a resolution down to 1 ess than 1 lJIll. When us i ng pul sed or scanned cw-l asers, 1 oca 1 i zat i on in time is also possible. Additionally, the monochromaticity of laser light allows for control of the depth of heat treatment and/or selective, nonthermal bond breaking - within the surface of the material or within the molecules of the surrounding reactive atmosphere - simply by tuning the laser wavelength. These inherent advantages of laser light permit micromachining of materials (drilling, cutting, welding etc.) and also allow single-step controlled area processing of thin films and surfaces. Processes include structural transformation (removal of residual damage, grain growth in polycrystalline material, amorphization, surface hardening etc.), etching, doping, alloying, or deposition. In addition, laser processing is not 1 imited to planar substrates.