Spectroscopic Characterization Techniques For Semiconductor Technology V
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Spectroscopic Characterization Techniques For Semiconductor Technology
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Author :
language : en
Publisher:
Release Date : 1994
Spectroscopic Characterization Techniques For Semiconductor Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Semiconductors categories.
Spectroscopic Characterization Techniques For Semiconductor Technology Iii
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Author : O. J. Glembocki
language : en
Publisher:
Release Date : 1988
Spectroscopic Characterization Techniques For Semiconductor Technology Iii written by O. J. Glembocki and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Technology & Engineering categories.
Spectroscopic Analysis Of Optoelectronic Semiconductors
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Author : Juan Jimenez
language : en
Publisher: Springer
Release Date : 2016-08-16
Spectroscopic Analysis Of Optoelectronic Semiconductors written by Juan Jimenez and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-16 with Technology & Engineering categories.
This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.
Optical Characterization Techniques For Semiconductor Technology
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Author : D. E. Aspnes
language : en
Publisher:
Release Date : 1981
Optical Characterization Techniques For Semiconductor Technology written by D. E. Aspnes and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Technology & Engineering categories.
Spectroscopic Characterization Techniques For Semiconductor Technology V
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Author :
language : en
Publisher:
Release Date : 1994
Spectroscopic Characterization Techniques For Semiconductor Technology V written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Semiconductors categories.
National Semiconductor Metrology Program Semiconductor Electronics Division Nist List Of Publications Lp 103 March 1999
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Author :
language : en
Publisher:
Release Date : 1999
National Semiconductor Metrology Program Semiconductor Electronics Division Nist List Of Publications Lp 103 March 1999 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.
National Semiconductor Metrology Program
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Author : National Institute of Standards and Technology (U.S.)
language : en
Publisher:
Release Date : 2000
National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Semiconductors categories.
National Semiconductor Metrology Program Nist List Of Publications Lp 103 May 2000
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Author :
language : en
Publisher:
Release Date : 2000
National Semiconductor Metrology Program Nist List Of Publications Lp 103 May 2000 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with categories.
National Semiconductor Metrology Program
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Author : National Semiconductor Metrology Program (U.S.)
language : en
Publisher:
Release Date : 1998
National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Semiconductors categories.
Journal Of Research Of The National Institute Of Standards And Technology
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Author :
language : en
Publisher:
Release Date : 1994
Journal Of Research Of The National Institute Of Standards And Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Measurement categories.