[PDF] Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111 - eBooks Review

Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111


Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111
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Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111


Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111
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Author : Luke Andre Emmert
language : en
Publisher:
Release Date : 2000

Studies Of The Coincident Interfacial Structure And The Desorption Kinetics Of Ultrathin Films Of Aluminum Oxide On Silicon 111 written by Luke Andre Emmert and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with categories.




Dissertation Abstracts International


Dissertation Abstracts International
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Author :
language : en
Publisher:
Release Date : 2000

Dissertation Abstracts International written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Dissertations, Academic categories.




American Doctoral Dissertations


American Doctoral Dissertations
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Author :
language : en
Publisher:
Release Date : 1999

American Doctoral Dissertations written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Dissertation abstracts categories.




Auger Electron Spectroscopy


Auger Electron Spectroscopy
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Author : Donald T. Hawkins
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Auger Electron Spectroscopy written by Donald T. Hawkins and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.


Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.



Instrumentation Development For Interfacial Studies And Analysis Of Substrate Supported Molecular Thin Films By Reflection High Energy Electron Diffraction


Instrumentation Development For Interfacial Studies And Analysis Of Substrate Supported Molecular Thin Films By Reflection High Energy Electron Diffraction
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Author : Karjini Rajagopal
language : en
Publisher:
Release Date : 2015

Instrumentation Development For Interfacial Studies And Analysis Of Substrate Supported Molecular Thin Films By Reflection High Energy Electron Diffraction written by Karjini Rajagopal and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with Chemistry categories.


Chemical and physical properties at interfaces play key roles in understanding a number of diverse phenomena. A better molecular-level understanding of the interfacial interactions is needed to utilize them in the potential applications. Different surface-analysis techniques have their own distinct level of surface sensitivity and probe different surface characteristics of the system of interest. Our interest is to directly visualize the structure of atoms and molecules at interfaces of the substrate-supported molecular thin films using reflective high-energy electron diffraction (RHEED). The shorter wavelength of an electron compared to typical bond lengths and its larger scattering cross section make it ideal for surface and interfacial probing. Interfacial behaviors in structure, interactions, phase transition, and thermal evolution of 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide ([EMIM][Tf2N]) vapor deposited ionic liquid (IL) thin films on substrate surfaces such as highly oriented pyrolytic graphite (HOPG), Hydrogen terminated Si(111), mica, Cu(111) and Ni(111) were studied. By comparing the ordered structural behavior of 3 nm thick [EMIM][Tf2N] film on HOPG with other surfaces, it is found that the terrace surface morphology of HOPG plays a role as a template for vertical stacking of IL ion pairs. The phase transition of [EMIM][Tf2N] on HOPG happened at 256 K, which matches with the melting point of bulk [EMIM][Tf2N] IL. The desorption of 3 nm [EMIM][Tf2N] IL from substrate happened starting from 340 - 360 K to ~ 375 K. As a second system, the interfacial structural ordering of water molecules on cadmium telluride (CdTe(111)A) surface and oxidized CdTe(111)A surface was investigated. A molecular beam doser system was developed to deposit the water molecules in a controlled and quantitative way. On CdTe(111)A surface, the deposited water molecules became ordered ice crystallites by adopting the geometry of the underlying substrate as evidenced by the Bragg diffraction spots. On oxidized CdTe(111)A surface upon deposition, initially formed amorphous water layer turned into Debye–Scherrer diffraction rings indicating the randomly oriented ice crystallites of cubic ice form. From the studies of both systems, the main role of the supported substrate in the ordering of molecules at the interface is found.



Chemical Abstracts


Chemical Abstracts
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Author :
language : en
Publisher:
Release Date : 2002

Chemical Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Chemistry categories.




Physics Briefs


Physics Briefs
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Author :
language : en
Publisher:
Release Date : 1994

Physics Briefs written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Physics categories.




Surface Studies Of Metal Oxide Catalysts And Ultrathin Films


Surface Studies Of Metal Oxide Catalysts And Ultrathin Films
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Author : D. C. Grinter
language : en
Publisher:
Release Date : 2011

Surface Studies Of Metal Oxide Catalysts And Ultrathin Films written by D. C. Grinter and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.


This thesis examines two important metal oxide systems: ultrathin CeO2(111) films on Pt(111), and carboxylic acids on TiO2 surfaces, both of which are significant for future energy research. The structure and growth of ultrathin films of CeO2(111) supported on Pt(111) have been studied with Scanning Tunnelling Microscopy (STM), Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES). The ultrathin films were grown in a number of ways and their growth mechanism, electronic structure, and domain boundaries were investigated using STM and STS. Atomically resolved STM images (filled and empty states) have been obtained on these ultrathin films permitting the identification of many defect structures. The behaviour of individual gold atoms at room temperature on ultrathin CeO2(111) films on Pt(111) has been investigated with STM. Simultaneous atomically resolved images of a gold adatom and the filled states of the ceria permitted the identification of two adsorption sites: (i) atop an oxygen atom and (ii) in a three-fold hollow site. The adsorption and reactivity of acetic acid on anatase TiO2(101) has also been investigated. It was found that at low coverage, acetic acid is observed to have a characteristic appearance consistent with a dissociative bidentate binding geometry to two neighbouring Ti5c sites. Deposition at elevated temperatures at saturation coverage yielded a (2 x 1) superstructure. The effects of heating, UV exposure, and tip pulsing were also investigated. STM has been used to investigate the adsorption and photo-reactivity of benzoic acid on rutile TiO2(110)(1 x 1) and (1 x 2). Benzoic acid binds to both surfaces dissociatively via a bridging geometry leading to a (2 x 1) overlayer on the (1 x 1) surface at saturation. Benzoate adsorbs between the added-rows of the (1 x 2) reconstruction leading to a (2 x 2) superstructure at higher coverage and demonstrated the important role of intermolecular interactions such as hydrogen bonding.



Metals Abstracts


Metals Abstracts
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Author :
language : en
Publisher:
Release Date : 1992

Metals Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Metallurgy categories.




Aqueous Derived Thin Films And Their Interfacial Interactions With Semiconductor Surfaces


Aqueous Derived Thin Films And Their Interfacial Interactions With Semiconductor Surfaces
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Author : Milana Cherie Thomas
language : en
Publisher:
Release Date : 2018

Aqueous Derived Thin Films And Their Interfacial Interactions With Semiconductor Surfaces written by Milana Cherie Thomas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018 with Aluminum oxide categories.


Metal oxide systems are well known for their high dielectric constants, which are important for advanced microelectronics applications. The microelectronics industry currently employs vacuum-based techniques, such as chemical vapor deposition (CVD), to deposit metal oxide films. These vapor-phase deposition techniques suffer due to their slow deposition rates and their use of expensive equipment. Additionally, these processes sometimes require the use of harmful source gases and/or generate corrosive by-products. On the other hand, solution-processed thin films fabricated by spin-coating are advantageous because the process is simple, low cost, and scalable. Aqueous solution deposition is particularly attractive because it offers a green alternative to vapor-phase deposition and has been shown to produce uniform thin films by spin coating on hydrophilic silicon surfaces. However, it has been shown that silicon's native oxide can degrade device performance due to its electronic interfacial states. In addition, aqueousderived thin films suffer from poor electrical performance due to mobile water and hydroxyl protons, often requiring very high temperature anneals to mitigate. Such anneals compromise the interface between the film and the silicon substrate, hence the electrical performance. One effective method to control the interface, and thus improve device performance, is to functionalize the semiconductor surface using wet chemistry. Here, we address the concerns of aqueous thin film deposition and present a method for alleviating the issues associated with current silicon-silicon oxide devices. We use wet chemical functionalization to graft selfassembled monolayers (SAMs) onto oxide-free silicon, then spin-coat an aqueous thin film on top of the SAM layer. The chemical stability of the SAM and the changes that occur at the interfaces between the Si/SAM/film stack during film deposition and dehydration are monitored by in situ Fourier transform infrared spectroscopy (FTIR) and ex situ X-ray photoelectron spectroscopy (XPS). The modification of the Si/SAM interface is studied as a function of annealing temperature, with electrical measurements used as a metric to quantify the effectiveness of the SAM layer to alleviate issues of interfacial defects observed for films on silicon oxide. The results are presented in three parts: (1) a dehydration study of aqueous-derived thin films deposited on silicon oxide, (2) the synthesis of a novel SAM interfacial layer tailored to accommodate aqueous, Al-based precursors and (3) a study to quantify the effectiveness, if any, on the SAM interfacial layer through electrical characterization methods. In the first part, we investigate the mechanism for dehydration of aqueous thin films and present a method to enhance the removal of water from the films. Using in situ FTIR, we find that the addition of a protective capping layer can enhance the dehydration of the thin film and prevent water reabsorption for a period of up to 14 days. In the second part, we present hydrosilylation methods to graft SAMs onto oxide-free silicon surfaces. The results show that it is possible to covalently attach the SAMs to silicon, evidenced by the formation of Si-C (detected by XPS) at the interface between the Si and the SAM. Four phosphonic acid-terminated SAMs are prepared and contact angle measurements are used as a metric for evaluating which can best accommodate aqueous spin-coater solutions. To conclude, we investigate the interface between the SAM layer and an aluminum-based thin film derived from aqueous precursor solutions. Current-voltage and capacitance-voltage measurements are used to quantify the effectiveness of the SAM layer.