Auger Electron Spectroscopy
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Auger Electron Spectroscopy Reference Manual
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Author : G. McGuire
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Auger Electron Spectroscopy Reference Manual written by G. McGuire and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole. The excess energy is transferred to the need for an ultrahigh-vacuum system is due to the limited and causes the ejection of another electron, which is by definition mean free path of electrons in the 0-3000 e V kinetic energy an Auger electron. The Auger electron transition, denoted by range. The Auger peaks decay exponentially with overlayer cov the electron levels involved, is independent of the excitation erage, which is consistent with an exponential dependence of source and leaves the atom with a constant kinetic energy. The escape probability on the depth of the parent atom. A compila kinetic energy is given by the differences in binding energies for tion of data from a variety of sources has been used to generate the three levels (for example, EK-E L, - EL ) minus a correction 2 an escape depth curve which falls in the range of 5-30 A in the term for the work function and electron wave function relaxation. energy range from 0 to 3000 eV. The observed escape depth does When the Auger transition occurs within a few angstroms of the not show a strong dependence on the matrix.
Photoelectron And Auger Spectroscopy
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Author : Thomas Carlson
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Photoelectron And Auger Spectroscopy written by Thomas Carlson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
In 1970 when I first seriously contemplated writing a book on electron spectroscopy, I recognized the impossibility of completely reaching my desired goals. First, the field was expanding (and still is) at such a rate that a definitive statement of the subject is not possible. The act of following the literature comprehensively and summarizing its essential content proved to be a diver gent series. On the other hand, the field has increased to such a size that violent changes in its basic makeup no longer occur with the frequency that was present in its early days. Furthermore, the excitement of electron spectro scopy lies in its many-faceted interrelationships. In the era of specialization, electron spectroscopy is an open-ended subject continually bringing together new aspects of science. I wished to discuss not just one type of electron spectro scopy, but as many as would be possible. The book as it stands concentrates its attention on x-ray photoelectron spectroscopy, but also presents the basis of Auger electron spectroscopy and uv photoelectron spectroscopy, as well as mentioning many of the other branches of the field. A large, many-author volume might be an answer to some of these problems. However, though anyone person possesses only a limited amount of expertise, I have always enjoyed books by a single author since what they lack in detailed knowledge they gain in a unified viewpoint. I hope the final product, though limited in its attainment of these goals, will still be of some merit.
Auger Electron Spectroscopy
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Author : C.L. Briant
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Auger Electron Spectroscopy written by C.L. Briant and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Treatise on Materials Science and Technology, Volume 30: Auger Electron Spectroscopy examines Auger electron spectroscopy and its various uses, emphasizing both theoretical and experimental studies. This book discusses the historical development of auger electron spectroscopy, studies of surface segregation kinetics by auger electron spectroscopy, and local electronic structure information in auger electron spectroscopy. The metallurgical applications of auger electron spectroscopy and auger photoelectron coincidence spectroscopy are also elaborated. Other topics include the measurement of surface segregation kinetics by Auger electron spectroscopy, tempered martensite embrittlement, embrittlement of nonferrous alloys, and analysis of particle-matrix interfaces. The high-resolution scanning Auger electron spectroscopy, corrosion and stress corrosion cracking, and APECS instrumentation are likewise covered in this publication. This volume is suitable for researchers and electrical engineering students conducting work on Auger electron spectroscopy.
Auger Electron Spectroscopy
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Author : Donald T. Hawkins
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Auger Electron Spectroscopy written by Donald T. Hawkins and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.
Auger Electron Spectroscopy
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Author : Donald T. Hawkins
language : en
Publisher:
Release Date : 1977-02
Auger Electron Spectroscopy written by Donald T. Hawkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977-02 with categories.
Auger Electron Spectroscopy
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Author : Michael Thompson
language : en
Publisher: Wiley-Interscience
Release Date : 1985
Auger Electron Spectroscopy written by Michael Thompson and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Science categories.
Auger And X Ray Photoelectron Spectroscopy In Materials Science
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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25
Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Ultraviolet Photoelectron And Photoion Spectroscopy Auger Electron Spectroscopy Plasma Excitation In Spectrochemical Analysis
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Author : G. Svehla
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Ultraviolet Photoelectron And Photoion Spectroscopy Auger Electron Spectroscopy Plasma Excitation In Spectrochemical Analysis written by G. Svehla and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Ultraviolet Photoelectron and Photoion Spectroscopy, Auger Electron Spectroscopy, Plasma Excitation in Spectrochemical Analysis
An Introduction To Surface Analysis By Electron Spectroscopy
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Author : John F. Watts
language : en
Publisher: Oxford University Press, USA
Release Date : 1990
An Introduction To Surface Analysis By Electron Spectroscopy written by John F. Watts and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Science categories.
Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.
Scanning Auger Electron Microscopy
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Author : Martin Prutton
language : en
Publisher: John Wiley & Sons
Release Date : 2006-05-01
Scanning Auger Electron Microscopy written by Martin Prutton and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-01 with Technology & Engineering categories.
This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.