Auger And X Ray Photoelectron Spectroscopy In Materials Science
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Auger And X Ray Photoelectron Spectroscopy In Materials Science
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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25
Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Auger And X Ray Photoelectron Spectroscopy In Materials Science
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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25
Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
An Introduction To Surface Analysis By Xps And Aes
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Author : John F. Watts
language : en
Publisher: John Wiley & Sons
Release Date : 2019-11-04
An Introduction To Surface Analysis By Xps And Aes written by John F. Watts and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-04 with Technology & Engineering categories.
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Modern Techniques Of Surface Science
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Author : D. P. Woodruff
language : en
Publisher: Cambridge University Press
Release Date : 1994-03-03
Modern Techniques Of Surface Science written by D. P. Woodruff and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-03-03 with Science categories.
This is a fully revised and expanded edition of a very successful and widely used book. It describes the physical basis of all the principal, and most of the more specialised, techniques currently employed in the study of well-characterised solid surfaces. The coverage of each technique, illustrated with selected examples, is underpinned by discussion of the relevant physical principles, and the complementary aspects of the various methods are also described. Throughout, the emphasis is on understanding the concepts involved, rather than on an exhaustive review of applications. The book will be of great use to final year undergraduate and postgraduate students in physics, chemistry and materials science. It will also be valuable to established researchers in any area of surface science concerned with the acquisition and analysis of experimental data.
Data Driven Guide To The Analysis Of X Ray Photoelectron Spectra Using Rxpsg
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Author : Giorgio Speranza
language : en
Publisher: CRC Press
Release Date : 2023-11-23
Data Driven Guide To The Analysis Of X Ray Photoelectron Spectra Using Rxpsg written by Giorgio Speranza and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-11-23 with Science categories.
Key Features: Simplifies the use of RxpsG, how it works, and its applications. Demonstrates RxpsG using a reproduction of the graphical interface of RxpsG, showing the steps needed to perform a specific task and the effect on the XPS spectra. Accessible to readers without any prior experience using the RxpsG software.
Understanding Surface And Thin Film Science
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Author : Thomas M. Christensen
language : en
Publisher: CRC Press
Release Date : 2022-12-08
Understanding Surface And Thin Film Science written by Thomas M. Christensen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-12-08 with Science categories.
This book is a conceptual overview of surface and thin film science, providing a basic and straightforward understanding of the most common ideas and methods used in these fields. Fundamental scientific ideas, deposition methods, and characterization methods are all examined. Relying on simple, conceptual models and figures, fundamental scientific ideas are introduced and then applied to surfaces and thin films in the first half of the book. Topics include vacuum and plasma environments, crystal structure, atomic motion, thermodynamics, electrical and magnetic properties, optical and thermal properties, and adsorbed atoms on surfaces. Common methods of gas-phase thin film deposition are then introduced, starting with an overview of the film growth process and then a discussion of both physical and chemical vapor deposition methods. This is followed by an overview of a wide range of characterization techniques including imaging, structural, chemical, electrical, magnetic, optical, thermal, and mechanical techniques. Thin film science is a natural extension of surface science, especially as applications involve thinner and thinner films; distinct from other literature in the field, this book combines the two topics in a single volume. Simple, conceptual models and figures are used, supported by some mathematical expressions, to convey key ideas to students as well as practicing engineers, scientists, and technicians.
Spectroscopy For Materials Characterization
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Author : Simonpietro Agnello
language : en
Publisher: John Wiley & Sons
Release Date : 2021-09-08
Spectroscopy For Materials Characterization written by Simonpietro Agnello and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-09-08 with Technology & Engineering categories.
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Derivative Spectroscopy
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Author : Joseph Dubrovkin
language : en
Publisher: Cambridge Scholars Publishing
Release Date : 2020-12-23
Derivative Spectroscopy written by Joseph Dubrovkin and has been published by Cambridge Scholars Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-23 with Science categories.
This book will appeal to both practitioners and researchers in both industrial and university chemical, bio-pharmaceutical, and physical, analytical laboratories, and students specializing in analytical spectroscopy, bio-pharmaceutical analysis, chemometrics, and laser physics. It sums up the results of more than half a century of research in derivative spectroscopy, including numerical differentiation and optical modulation techniques. The bibliography also briefly describes hundreds of derivative spectroscopic (classic optical and laser) and non-spectroscopic (chromatography, electrochemistry, and other) methods in industrial and research laboratories. This book differs from existing studies on the subject in that it offers, for the first time, the big picture of all kinds of spectroscopic and non-spectroscopic derivative methods. Also, the book provides quickly reproducible computer calculations illustrating its significant theoretical statements. As such, it can also serve as a practical guide to lecturers in analytical chemistry, chemometrics, and spectroscopy.
Characterization Techniques For Nanomaterials
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Author : Imalka Munaweera
language : en
Publisher: CRC Press
Release Date : 2023-03-01
Characterization Techniques For Nanomaterials written by Imalka Munaweera and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-03-01 with Science categories.
Manipulation of matter at the nanoscale level is the key factor in nanotechnology, and it is considered as a great driving force behind the current industrial revolution since it offers facile and feasible remedies for many problems. Because of the unique characteristic properties of nanomaterials, they can be employed in a wide variety of fields such as agriculture and food technology, catalysis, biomedical applications, tissue culture engineering, and fertilizers. In this regard, characterization of nanomaterials plays a significant role in determining their optical, thermal, and physicochemical properties. Many techniques have been used in nanomaterial characterization, and the most important techniques are discussed in detail in this book with their principles, basic operation procedures, and applications with suitable examples. In summary, this book offers broad content on the most important chemical and structural characterization techniques of nanomaterials. The book offers comprehensive coverage of the most essential topics, including the following: Provides a comprehensive understanding of physical and chemical characterization techniques of nanomaterials Includes details about basic principles of each characterization technique with appropriate examples Covers most of the important characterization techniques that should be known to undergraduate/early career scientists/beginners in materials chemistry Provides all the basic knowledge to understand and carry out the respective analysis of nanomaterials Fulfills the timely need of a book that covers the most important and useful characterization techniques in nanomaterial characterization Up to date, there are no other books/book chapters which discuss most of these nanocharacterization techniques in one segment with all the basic instrumentation details and narrated examples of nanomaterial characterization. In a nutshell, this book will be a great asset to undergraduates/early career scientists/beginners of material science as it provides a comprehensive and complete understanding of most of the techniques used in nanocharacterization tools in a short time. Intended audience is based on science education while specifically focusing on undergraduates/graduate students/early scientists and beginners of chemistry, materials chemistry, and nanotechnology and nanoscience.
Characterization Of Nanomaterials In Complex Environmental And Biological Media
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Author :
language : en
Publisher: Elsevier
Release Date : 2015-06-01
Characterization Of Nanomaterials In Complex Environmental And Biological Media written by and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-01 with Technology & Engineering categories.
Characterization of Nanomaterials in Complex Environmental and Biological Media covers the novel properties of nanomaterials and their applications to consumer products and industrial processes. The book fills the growing gap in this challenging area, bringing together disparate strands in chemistry, physics, biology, and other relevant disciplines. It provides an overview on nanotechnology, nanomaterials, nano(eco)toxicology, and nanomaterial characterization, focusing on the characterization of a range of nanomaterial physicochemical properties of relevance to environmental and toxicological studies and their available analytical techniques. Readers will find a multidisciplinary approach that provides highly skilled scientists, engineers, and technicians with the tools they need to understand and interpret complicated sets of data obtained through sophisticated analytical techniques. - Addresses the requirements, challenges, and solutions for nanomaterial characterization in environmentally complex media - Focuses on technique limitations, appropriate data collection, data interpretation, and analysis - Aids in understanding and comparing nanomaterial characterization data reported in the literature using different analytical tools - Includes case studies of characterization relevant complex media to enhance understanding