Synchrotron X Ray Diffraction Imaging Of Photorefractive Crystals
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Synchrotron X Ray Diffraction Imaging Of Photorefractive Crystals
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Author : Gerard Fogarty
language : en
Publisher:
Release Date : 1992
Synchrotron X Ray Diffraction Imaging Of Photorefractive Crystals written by Gerard Fogarty and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.
Signal processing in photorefractive crystals is complicated by photorefractive amplified scattering (fanning). The scattering centers responsible for seeding the fanning noise may be presumed to be traceable to crystal lattice irregularities. These defects have not yet been examined in any great detail, and the relative importance of various specific imperfections and the role they play in the crystal optics are not known. An understanding of these defects should lead to improvement in signal processing through growth of more satisfactory photorefractive crystals. We have set out to address these problems through direct, in situ observation of -photorefractive crystals and their gratings in barium titanate by high resolution monochromatic synchrotron x-ray diffraction imaging. The results that we report here indicate the nature of the principal limiting imperfections and demonstrate the feasibility of direct observation of photorefractive gratings and scattering centers.
Synchrotron X Ray Diffraction Analysis Of Photorefractive Crystals And Their Gratings
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Author :
language : en
Publisher:
Release Date : 1993
Synchrotron X Ray Diffraction Analysis Of Photorefractive Crystals And Their Gratings written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with categories.
High-resolution synchrotron x-ray diffraction imaging was used to examine the state of crystal perfection in the photorefractive ferroelectric materials barium titanate and strontium barium niobate. Ferroelectric 180 degree domains, dislocations, striations, faceted growth remnants, and other lattice features were identified. The technique was also used to image the photorefractive space charge field profile in-situ. Measurements of the field were compared with numerical simulations of the standard model of the photorefractive effect, and simulations of the x-ray image formation process.
High Resolution X Ray Diffraction Imaging Of Photorefractive Crystals And Gratings
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Author : Gerard D. Fogarty
language : en
Publisher:
Release Date : 1994
High Resolution X Ray Diffraction Imaging Of Photorefractive Crystals And Gratings written by Gerard D. Fogarty and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Crystals categories.
X Ray Diffraction Imaging Of Biological Cells
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Author : Masayoshi Nakasako
language : en
Publisher: Springer
Release Date : 2018-03-29
X Ray Diffraction Imaging Of Biological Cells written by Masayoshi Nakasako and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-03-29 with Science categories.
In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
X Ray Diffraction Imaging
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Author : Joel Greenberg
language : en
Publisher: CRC Press
Release Date : 2018-11-02
X Ray Diffraction Imaging written by Joel Greenberg and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-11-02 with Technology & Engineering categories.
This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. Teaches novel methods for X-ray diffraction imaging Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms Features state-of-the-art work of international authors from both academia and industry. Includes practical applications in the medical, industrial, and security sectors
Applications Of Synchrotron Light To Scattering And Diffraction In Materials And Life Sciences
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Author : T.A. Ezquerra
language : en
Publisher: Springer
Release Date : 2009-06-12
Applications Of Synchrotron Light To Scattering And Diffraction In Materials And Life Sciences written by T.A. Ezquerra and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-06-12 with Technology & Engineering categories.
In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
X Ray And Neutron Dynamical Diffraction
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Author : André Authier
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
X Ray And Neutron Dynamical Diffraction written by André Authier and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
Research In Progress
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Author :
language : en
Publisher:
Release Date : 1991
Research In Progress written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Military research categories.
High Resolution Diffraction Imaging Of Crystals Grown In Microgravity And Closely Related Terrestrial Crystals
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Author : B. Steiner
language : en
Publisher:
Release Date : 1991
High Resolution Diffraction Imaging Of Crystals Grown In Microgravity And Closely Related Terrestrial Crystals written by B. Steiner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Crystal growth categories.
Diffraction Imaging For In Situ Characterization Of Double Crystal X Ray Monochromators
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Author :
language : en
Publisher:
Release Date : 2015
Diffraction Imaging For In Situ Characterization Of Double Crystal X Ray Monochromators written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with categories.
In this paper, imaging of the Bragg-reflected X-ray beam is proposed and validated as an in situ method for characterization of the performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is collected at different angular positions on the reflectivity curve of the second crystal and analyzed. The method provides rapid evaluation of the wavefront of the exit beam, which relates to local misorientation of the crystal planes along the beam footprint on the thermally distorted first crystal. The measured misorientation can be directly compared with the results of finite element analysis. Finally, the imaging method offers an additional insight into the local intrinsic crystal quality over the footprint of the incident X-ray beam.