Testing And Diagnosis Of Vlsi And Ulsi
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Testing And Diagnosis Of Vlsi And Ulsi
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Author : F. Lombardi
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Testing And Diagnosis Of Vlsi And Ulsi written by F. Lombardi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Defect Oriented Testing For Cmos Analog And Digital Circuits
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Author : Manoj Sachdev
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Defect Oriented Testing For Cmos Analog And Digital Circuits written by Manoj Sachdev and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Principles Of Testing Electronic Systems
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Author : Samiha Mourad
language : en
Publisher: John Wiley & Sons
Release Date : 2000-07-25
Principles Of Testing Electronic Systems written by Samiha Mourad and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-07-25 with Technology & Engineering categories.
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Integrated Circuit Manufacturability
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Author : José Pineda de Gyvez
language : en
Publisher: John Wiley & Sons
Release Date : 1998-10-30
Integrated Circuit Manufacturability written by José Pineda de Gyvez and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-10-30 with Technology & Engineering categories.
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Dependable Computing Edcc 1
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Author : Klaus Echtle
language : en
Publisher: Springer Science & Business Media
Release Date : 1994-09-21
Dependable Computing Edcc 1 written by Klaus Echtle and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-09-21 with Computers categories.
This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger of two former European events on dependable computing. The volume comprises 34 refereed full papers selected from 106 submissions. The contributions address all current aspects of dependable computing and reflect the state of the art in dependable systems research and advanced applications; among the topics covered are hardware and software reliability, safety-critical and secure systems, fault-tolerance and detection, verification and validation, formal methods, hardware and software testing, and parallel and distributed systems.
Formal Equivalence Checking And Design Debugging
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Author : Shi-Yu Huang
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Formal Equivalence Checking And Design Debugging written by Shi-Yu Huang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail. The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error correction. This part also provides an in-depth analysis of the algorithms used in two logic debugging software programs, ErrorTracer and AutoFix, developed by the authors. From the Foreword: `With the adoption of the static sign-off approach to verifying circuit implementations the application-specific integrated circuit (ASIC) industry will experience the first radical methodological revolution since the adoption of logic synthesis. Equivalence checking is one of the two critical elements of this methodological revolution. This book is timely for either the designer seeking to better understand the mechanics of equivalence checking or for the CAD researcher who wishes to investigate well-motivated research problems such as equivalence checking of retimed designs or error diagnosis in sequential circuits.' Kurt Keutzer, University of California, Berkeley
Knowledge Based Systems For Test And Diagnosis
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Author : Gabrièle Saucier
language : en
Publisher: North Holland
Release Date : 1989
Knowledge Based Systems For Test And Diagnosis written by Gabrièle Saucier and has been published by North Holland this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Computers categories.
The introductory paper in this book gives an overview of the most significant attempts to use knowledge based systems for test and diagnosis. The overview includes: - systems which employ knowledge engineering - systems which employ frames and/or slots - systems which represent knowledge using some form of calculus - systems which attempt to imitate human expertise. Chapter I deals with test planning and text expertise, including AI aspects of designing testable chips, economic problems and the HITEST experience. Chapter II covers the most obvious application of AI techniques: knowledge based diagnosis. A survey paper looks at various systems, while the other papers report on practical experiences. Chapter III reports on rule based design verification and maintenance, the papers dealing with electrical verification of integrated circuits, board verification with an application in an industrial environment, and rule based maintenance.
Electronic Materials Handbook
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Author :
language : en
Publisher: ASM International
Release Date : 1989-11-01
Electronic Materials Handbook written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-11-01 with Technology & Engineering categories.
Volume 1: Packaging is an authoritative reference source of practical information for the design or process engineer who must make informed day-to-day decisions about the materials and processes of microelectronic packaging. Its 117 articles offer the collective knowledge, wisdom, and judgement of 407 microelectronics packaging experts-authors, co-authors, and reviewers-representing 192 companies, universities, laboratories, and other organizations. This is the inaugural volume of ASMAs all-new ElectronicMaterials Handbook series, designed to be the Metals Handbook of electronics technology. In over 65 years of publishing the Metals Handbook, ASM has developed a unique editorial method of compiling large technical reference books. ASMAs access to leading materials technology experts enables to organize these books on an industry consensus basis. Behind every article. Is an author who is a top expert in its specific subject area. This multi-author approach ensures the best, most timely information throughout. Individually selected panels of 5 and 6 peers review each article for technical accuracy, generic point of view, and completeness.Volumes in the Electronic Materials Handbook series are multidisciplinary, to reflect industry practice applied in integrating multiple technology disciplines necessary to any program in advanced electronics. Volume 1: Packaging focusing on the middle level of the electronics technology size spectrum, offers the greatest practical value to the largest and broadest group of users. Future volumes in the series will address topics on larger (integrated electronic assemblies) and smaller (semiconductor materials and devices) size levels.
Bibliographic Guide To Technology
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Author : New York Public Library. Research Libraries
language : en
Publisher:
Release Date : 1989
Bibliographic Guide To Technology written by New York Public Library. Research Libraries and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Classified catalogs (Universal decimal) categories.
Multi Chip Module Test Strategies
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Author : Yervant Zorian
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Multi Chip Module Test Strategies written by Yervant Zorian and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).