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Tof Sims
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Author : J. C. Vickerman
language : en
Publisher: IM Publications
Release Date : 2013
Tof Sims written by J. C. Vickerman and has been published by IM Publications this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Mass spectrometry categories.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
An Introduction To Time Of Flight Secondary Ion Mass Spectrometry Tof Sims And Its Application To Materials Science
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Author : Sarah Fearn
language : en
Publisher: Morgan & Claypool Publishers
Release Date : 2015-10-16
An Introduction To Time Of Flight Secondary Ion Mass Spectrometry Tof Sims And Its Application To Materials Science written by Sarah Fearn and has been published by Morgan & Claypool Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-10-16 with Technology & Engineering categories.
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
New Trends And Potentialities Of Tof Sims In Surface Studies
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Author : Jacek Grams
language : en
Publisher: Nova Publishers
Release Date : 2007
New Trends And Potentialities Of Tof Sims In Surface Studies written by Jacek Grams and has been published by Nova Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Science categories.
This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
The Practice Of Tof Sims
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Author : Alan M. Spool
language : en
Publisher: Momentum Press
Release Date : 2016-03-24
The Practice Of Tof Sims written by Alan M. Spool and has been published by Momentum Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-03-24 with Technology & Engineering categories.
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Multivariate Data Analysis For Root Cause Analyses And Time Of Flight Secondary Ion Mass Spectrometry
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Author : Danica Heller-Krippendorf
language : en
Publisher: Springer Nature
Release Date : 2019-10-31
Multivariate Data Analysis For Root Cause Analyses And Time Of Flight Secondary Ion Mass Spectrometry written by Danica Heller-Krippendorf and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-10-31 with Science categories.
Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.
Secondary Ion Mass Spectrometry Sims Xi
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Author : G. Gillen
language : en
Publisher: Wiley
Release Date : 1998-03-06
Secondary Ion Mass Spectrometry Sims Xi written by G. Gillen and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-03-06 with Technology & Engineering categories.
This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories: * Isotopic SIMS * Biological SIMS * Semiconductor Characterization Techniques and Applications * Ultra Shallow Depth Profiling * Depth Profiling Fundamental/Modelling and Diffusion * Sputter-Induced Topography * Fundamentals of Molecular Desorption * Organic Materials * Practical TOF-SIMS * Polyatomic Primary Ions * Materials/Surface Analysis * Postionization * Instrumentation * Geological SIMS * Imaging * Fundamentals of Sputtering * Ion Formation and Cluster Formation * Quantitative Analysis Environmental/ParticleCharacterization * Related Techniques These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.
Secondary Ion Mass Spectrometry
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Author : F. A. Stevie
language : en
Publisher:
Release Date : 2016
Secondary Ion Mass Spectrometry written by F. A. Stevie and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Technology & Engineering categories.
Secondary ion mass spectroscopy is a technology used primarily to determine the surface chemistry and structure of any particular material. It is a crucial analytical tool in determining the quality and integrity of everything from semiconductor electronics materials to films and coatings used in all sorts of materials and products. It is especially useful in studying the surface characteristics of materials, as well as chemical surface adsorption and oxidative processes. This new book will bring the reader quickly up to speed on the essential principles of this technology, the latest equipment and instrumentation developments, the newest trends in measurement and analysis, and the many new applications that are being found for this type of spectrometry. Additional reading will be provided for further study.
Cluster Secondary Ion Mass Spectrometry
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Author : Christine M. Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 2013-04-17
Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Secondary Ion Mass Spectrometry
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Author : A. Benninghoven
language : en
Publisher: Elsevier Science & Technology
Release Date : 2000
Secondary Ion Mass Spectrometry written by A. Benninghoven and has been published by Elsevier Science & Technology this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Science categories.
Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
Tof Sims
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Author : John C. Vickerman
language : en
Publisher:
Release Date : 2001
Tof Sims written by John C. Vickerman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Mass spectrometry categories.
Time-of-flight secondary ion mass spectroemtry is the most versatile of surface analysis techniques that has been developed. Following an overview, this work includes sections devoted to: instrumentation and sample handling; fundamentals and molecular dynamics simulations; optimisation methods; and data interpretation, and analytical applications.