Vlsi Design And Test For Systems Dependability
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Vlsi Design And Test For Systems Dependability
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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20
Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Design And Test Technology For Dependable Systems On Chip
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Author : Raimund Ubar
language : en
Publisher: IGI Global
Release Date : 2011-01-01
Design And Test Technology For Dependable Systems On Chip written by Raimund Ubar and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-01-01 with Computers categories.
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Atomic Switch
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Author : Masakazu Aono
language : en
Publisher: Springer Nature
Release Date : 2020-03-02
Atomic Switch written by Masakazu Aono and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-03-02 with Science categories.
Written by the inventors and leading experts of this new field, the book results from the International Symposium on “Atomic Switch: Invention, Practical use and Future Prospects” which took place in Tsukuba, Japan on March 27th - 28th, 2017. The book chapters cover the different trends from the science and technology of atomic switches to their applications like brain-type information processing, artificial intelligence (AI) and completely novel functional electronic nanodevices. The current practical uses of the atomic switch are also described. As compared with the conventional semiconductor transistor switch, the atomic switch is more compact (~1/10) with much lower power consumption (~1/10) and scarcely influenced by strong electromagnetic noise and radiation including cosmic rays in space (~1/100). As such, this book is of interest to researchers, scholars and students willing to explore new materials, to refine the nanofabrication methods and to explore new and efficient device architectures.
Verification Model Checking And Abstract Interpretation
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Author : Bernd Finkbeiner
language : en
Publisher: Springer Nature
Release Date : 2022-01-13
Verification Model Checking And Abstract Interpretation written by Bernd Finkbeiner and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-13 with Computers categories.
This book constitutes the proceedings of the 23rd International Conference on Verification, Model Checking, and Abstract Interpretation, VMCAI 2022, which took place in Philadelphia, PA, USA, in January 2022. The 22 papers presented in this volume were carefully reviewed from 48 submissions. VMCAI provides a forum for researchers working on verification, model checking, and abstract interpretation and facilitates interaction, cross-fertilization, and advancement of hybrid methods that combine these and related areas.
Soft Computing Methods For System Dependability
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Author : Mellal, Mohamed Arezki
language : en
Publisher: IGI Global
Release Date : 2019-12-27
Soft Computing Methods For System Dependability written by Mellal, Mohamed Arezki and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-12-27 with Computers categories.
Technology in today’s world has continued to develop into multifaceted structures. The performance of computers, specifically, has significantly increased leading to various and complex problems regarding the dependability of these systems. Recently, solutions for these issues have been based on soft computing methods; however, there lacks a considerable amount of research on the applications of these techniques within system dependability. Soft Computing Methods for System Dependability is a collection of innovative research on the applications of these processing techniques for solving problems within the dependability of computer system performance. This book will feature comparative experiences shared by researchers regarding the development of these technological solutions. While highlighting topics including evolutionary computing, chaos theory, and artificial neural networks, this book is ideally designed for researchers, data scientists, computing engineers, industrialists, students, and academicians in the field of computer science.
Open Systems Dependability
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Author : Mario Tokoro
language : en
Publisher: CRC Press
Release Date : 2012-10-12
Open Systems Dependability written by Mario Tokoro and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-12 with Computers categories.
This book describes how to achieve dependability in information systems. The author first proposes viewing systems as open systems instead of closed systems and presents Open Systems Dependability as a property for a system that has the ability to provide optimal services, minimize damage when stoppages occur, resume services quickly, and achieve a
Dependable Computing Edcc 2
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Author : Andrzej Hlawiczka
language : en
Publisher: Springer Science & Business Media
Release Date : 1996-09-18
Dependable Computing Edcc 2 written by Andrzej Hlawiczka and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-09-18 with Computers categories.
This book constitutes the refereed proceedings of the Second European Dependable Computing Conference, EDCC-2, held in Taormina, Italy, in October 1996. The book presents 26 revised full papers selected from a total of 66 submissions based on the reviews of 146 referees. The papers are organized in sections on distributed fault tolerance, fault injection, modelling and evaluation, fault-tolerant design, basic hardware models, testing, verification, replication and distribution, and system level diagnosis.
Dependable Multicore Architectures At Nanoscale
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Author : Marco Ottavi
language : en
Publisher: Springer
Release Date : 2017-08-28
Dependable Multicore Architectures At Nanoscale written by Marco Ottavi and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-08-28 with Technology & Engineering categories.
This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2006
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Technology & Engineering categories.
This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. VLSI Testing is very basic to the semiconductor industry and is something that almost everyone in the industry needs to have some knowledge of. It is often not sufficiently covered in undergraduate curricula; therefore this book fill the gap in this area for both students and professionals in semiconductor manufacturing, design, systems, electronic design automation (EDA), etc. As 100 million transistor designs are now common, test costs are 25-40% of the overall cost of manufacturing a chip and how a chip is designed greatly impacts the cost of test. As such, it is important for designers and managers to understand the concepts and principles of testing and design-for-test techniques. • Covers the entire spectrum of VLSI testing from digital, analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. • Discusses future test technology trends and challenges facing the nanometer design era. • Companion CD-ROM contains a version of SynTest's software for student use.