Vlsi Design For Manufacturing Yield Enhancement
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Vlsi Design For Manufacturing Yield Enhancement
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Author : Stephen W. Director
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Vlsi Design For Manufacturing Yield Enhancement written by Stephen W. Director and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Nanoscale Cmos Vlsi Circuits Design For Manufacturability
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Author : Sandip Kundu
language : en
Publisher: McGraw Hill Professional
Release Date : 2010-06-22
Nanoscale Cmos Vlsi Circuits Design For Manufacturability written by Sandip Kundu and has been published by McGraw Hill Professional this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-06-22 with Technology & Engineering categories.
Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies
Machine Learning In Vlsi Computer Aided Design
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Author : Ibrahim (Abe) M. Elfadel
language : en
Publisher: Springer
Release Date : 2019-03-15
Machine Learning In Vlsi Computer Aided Design written by Ibrahim (Abe) M. Elfadel and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-03-15 with Technology & Engineering categories.
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Design For Manufacturability And Statistical Design
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Author : Michael Orshansky
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-10-28
Design For Manufacturability And Statistical Design written by Michael Orshansky and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-10-28 with Technology & Engineering categories.
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Design For Manufacturability And Yield For Nano Scale Cmos
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Author : Charles Chiang
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-06-15
Design For Manufacturability And Yield For Nano Scale Cmos written by Charles Chiang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-06-15 with Technology & Engineering categories.
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Fault Diagnosis Of Analog Integrated Circuits
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Author : Prithviraj Kabisatpathy
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-13
Fault Diagnosis Of Analog Integrated Circuits written by Prithviraj Kabisatpathy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-13 with Technology & Engineering categories.
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Semiconductors
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Author : Artur Balasinski
language : en
Publisher: CRC Press
Release Date : 2018-09-03
Semiconductors written by Artur Balasinski and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-03 with Computers categories.
Because of the continuous evolution of integrated circuit manufacturing (ICM) and design for manufacturability (DfM), most books on the subject are obsolete before they even go to press. That’s why the field requires a reference that takes the focus off of numbers and concentrates more on larger economic concepts than on technical details. Semiconductors: Integrated Circuit Design for Manufacturability covers the gradual evolution of integrated circuit design (ICD) as a basis to propose strategies for improving return-on-investment (ROI) for ICD in manufacturing. Where most books put the spotlight on detailed engineering enhancements and their implications for device functionality, in contrast, this one offers, among other things, crucial, valuable historical background and roadmapping, all illustrated with examples. Presents actual test cases that illustrate product challenges, examine possible solution strategies, and demonstrate how to select and implement the right one This book shows that DfM is a powerful generic engineering concept with potential extending beyond its usual application in automated layout enhancements centered on proximity correction and pattern density. This material explores the concept of ICD for production by breaking down its major steps: product definition, design, layout, and manufacturing. Averting extended discussion of technology, techniques, or specific device dimensions, the author also avoids the clumsy chapter architecture that can hinder other books on this subject. The result is an extremely functional, systematic presentation that simplifies existing approaches to DfM, outlining a clear set of criteria to help readers assess reliability, functionality, and yield. With careful consideration of the economic and technical trade-offs involved in ICD for manufacturing, this reference addresses techniques for physical, electrical, and logical design, keeping coverage fresh and concise for the designers, manufacturers, and researchers defining product architecture and research programs.
Automatic Layout Modification
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Author : Michael Reinhardt
language : en
Publisher: Springer Science & Business Media
Release Date : 2002-06-30
Automatic Layout Modification written by Michael Reinhardt and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-06-30 with Computers categories.
According to the Semiconductor Industry Association's 1999 International Technology Roadmap for Semiconductors, by the year 2008 the integration of more than 500 million transistors will be possible on a single chip. Integrating transistors on silicon will depend increasingly on design reuse. Design reuse techniques have become the subject of books, conferences, and podium discussions over the last few years. However, most discussions focus on higher-level abstraction like RTL descriptions, which can be synthesized. Design reuse is often seen as an add-on to normal design activity, or a special design task that is not an integrated part of the existing design flow. This may all be true for the ASIC world, but not for high-speed, high-performance microprocessors. In the field of high-speed microprocessors, design reuse is an integrated part of the design flow. The method of choice in this demanding field was, and is always, physical design reuse at the layout level. In the past, the practical implementations of this method were linear shrinks and the lambda approach. With the scaling of process technology down to 0.18 micron and below, this approach lost steam and became inefficient. The only viable solution is a method, which is now called Automatic Layout Modification (ALM). It combines compaction, mask manipulation, and correction with powerful capabilities. Automatic Layout Modification, Including design reuse of the Alpha CPU in 0.13 micron SOI technology is a welcome effort to improving some of the practices in chip design today. It is a comprehensive reference work on Automatic Layout Modification which will be valuable to VLSI courses at universities, and to CAD and circuit engineers and engineering managers.
The Computer Engineering Handbook
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Author : Vojin G. Oklobdzija
language : en
Publisher: CRC Press
Release Date : 2001-12-26
The Computer Engineering Handbook written by Vojin G. Oklobdzija and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-12-26 with Computers categories.
There is arguably no field in greater need of a comprehensive handbook than computer engineering. The unparalleled rate of technological advancement, the explosion of computer applications, and the now-in-progress migration to a wireless world have made it difficult for engineers to keep up with all the developments in specialties outside their own
Testing Static Random Access Memories
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Author : Said Hamdioui
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Testing Static Random Access Memories written by Said Hamdioui and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.