X Rays And Materials

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Auger And X Ray Photoelectron Spectroscopy In Materials Science

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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25

Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

X Rays Electrons And Crystalline Materials

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Author : Terence Frederick James Quinn
language : en
Publisher:
Release Date : 1970

X Rays Electrons And Crystalline Materials written by Terence Frederick James Quinn and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970 with categories.

X Rays And Materials

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Author : Philippe Goudeau
language : en
Publisher: John Wiley & Sons
Release Date : 2013-05-06

X Rays And Materials written by Philippe Goudeau and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-05-06 with Technology & Engineering categories.

This book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the “RX2009 – X-rays and Materials” colloquium that took place in December 2009 at Orsay in France. The book consists of five chapters on the subject of X-ray diffraction, scattering and absorption. Chapter 1 gives a detailed presentation of the capabilities and potential of beam lines dedicated to condensed matter studies at the SOLEIL synchrotron radiation source. Chapter 2 focuses on the study of nanoparticles using small-angle X-ray scattering. Chapter 3 discusses the quantitative studies of this scattering signal used to analyze these characteristics in detail. Chapter 4 discusses relaxor materials, which are ceramics with a particularly complex microstructure. Chapter 5 discusses an approach enabling the in situ analysis of these phase transitions and their associated microstructural changes.

X Ray Line Profile Analysis In Materials Science

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Author : Gubicza, Jen?
language : en
Publisher: IGI Global
Release Date : 2014-03-31

X Ray Line Profile Analysis In Materials Science written by Gubicza, Jen? and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-03-31 with Technology & Engineering categories.

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Current Material Research Using X Rays Related Techniques

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Author : Hasan Zuhudi Abdullah
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2015-02-10

Current Material Research Using X Rays Related Techniques written by Hasan Zuhudi Abdullah and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-10 with Technology & Engineering categories.

As we have known, X-ray and related techniques are mainly used for quality control and materials characterization study. Most of the equipment used in these activities has contributed a lot to the advancement of materials science, solid state physics, chemistry, medical and other fields. In recent years, there have been a lot of improvements that includes the introduction of an array of software including instrument control, data interpretation and standard data that may provide quick results with enhanced efficiency. IXCRI 2014 aims to exchange and share experiences and research findings in all aspects of X-rays and related techniques among academics, researchers and the industry. Not only that, ICXRI 2014 includes a workshop session, which allows participants to gain a hands-on experience in learning fundamental understanding on X-ray applications. Due to this unique conference-workshop combination, I strongly believe that this conference will have a huge impact and will lead to future innovations and strong linkages among the participants. This is reflected in the number of participants, which amounts to a total of nearly 100 papers being presented here in this conference.

X Ray Characterization Of Materials

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Author : Eric Lifshin
language : en
Publisher: John Wiley & Sons
Release Date : 2008-07-11

X Ray Characterization Of Materials written by Eric Lifshin and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-07-11 with Technology & Engineering categories.

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Current Materials Research Using X Rays And Related Techniques Iii

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Author : Muhamad Faiz Md Din
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2022-01-28

Current Materials Research Using X Rays And Related Techniques Iii written by Muhamad Faiz Md Din and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-28 with Science categories.

Selected peer-reviewed full text papers from the 10th International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2021)

X Rays In Materials Analysis Novel Applications And Recent Developments

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Author : Thomas William Rusch
language : en
Publisher:
Release Date :

X Rays In Materials Analysis Novel Applications And Recent Developments written by Thomas William Rusch and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.

X Ray Diffraction For Materials Research

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Author : Myeongkyu Lee
language : en
Publisher: Apple Academic Press
Release Date : 2021-03-31

X Ray Diffraction For Materials Research written by Myeongkyu Lee and has been published by Apple Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-31 with Materials categories.

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

Polymer Composites And Nanocomposites For X Rays Shielding

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Author : It Meng Low
language : en
Publisher: Springer Nature
Release Date : 2020-01-03

Polymer Composites And Nanocomposites For X Rays Shielding written by It Meng Low and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-01-03 with Technology & Engineering categories.

This book focuses on the processing, materials design, characterisation, and properties of polymer composites and nanocomposites for use as electromagnetic radiation shielding materials and to enhance radiation shielding capacity in order to meet the safety requirements for use in medical X-ray imaging facilities. It presents an in-depth analysis of materials synthesis methods such as melt-mixing, ion-implantation, solution casting and electrospinning. In addition, it measures the X-ray attenuation behaviour of fabricated composites and nanocomposites in four major types of X-ray equipment, namely general radiography, mammography, X-ray absorption spectroscopy and X-ray fluorescence spectroscopy units. Given its scope, the book will benefit researchers, engineers, scientists and practitioners in the fields of medical imaging, diagnostic radiology and radiation therapy.