Xv International Conference On Electron Microscopy
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Xv International Conference On Electron Microscopy
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Author : Beata Dubiel
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2015-06-30
Xv International Conference On Electron Microscopy written by Beata Dubiel and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-30 with Technology & Engineering categories.
The papers published in this volume of Solid State Phenomena are written on the basis of selected presentations from the XV International Conference on Electron Microscopy EM2014, which took place in Kraków from the 15th to the 18th of September 2014. The papers present the recent results of the applications of electron microscopy methods for microstructural studies in materials science.
Proceedings Of The International Conference On Electron Microscopy
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Author :
language : de
Publisher:
Release Date : 1986
Proceedings Of The International Conference On Electron Microscopy written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Electron microscopes categories.
Vierter Internationaler Kongress Fur Elektronenmikroskopie
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Author :
language : de
Publisher:
Release Date : 1960
Vierter Internationaler Kongress Fur Elektronenmikroskopie written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1960 with Electron microscopy categories.
Proceedings Of The Fourth International Conference On Electron Microscopy Berlin 1958
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Author : International Conference on Electron Microscopy Staff
language : en
Publisher:
Release Date : 1960-01-01
Proceedings Of The Fourth International Conference On Electron Microscopy Berlin 1958 written by International Conference on Electron Microscopy Staff and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1960-01-01 with categories.
Microbeam Analysis
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Author : D Williams
language : en
Publisher: CRC Press
Release Date : 2000-01-01
Microbeam Analysis written by D Williams and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-01-01 with Science categories.
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volu
Electron Microscopy Xiv Selected Peer Reviewed Papers From The Xiv International Conference On Electron Microscopy Em2011 June 26 30 2011 Wisla Poland
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Author : Danuta Stróż
language : en
Publisher:
Release Date : 2012
Electron Microscopy Xiv Selected Peer Reviewed Papers From The Xiv International Conference On Electron Microscopy Em2011 June 26 30 2011 Wisla Poland written by Danuta Stróż and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with categories.
Electron Microscopy Xiv
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Author : Danuta Stró?
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2012-03-15
Electron Microscopy Xiv written by Danuta Stró? and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-15 with Technology & Engineering categories.
These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wis?a, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. Volume is indexed by Thomson Reuters CPCI-S (WoS). The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
Microscopy Of Semiconducting Materials 2007
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Author : A.G. Cullis
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-02
Microscopy Of Semiconducting Materials 2007 written by A.G. Cullis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-02 with Technology & Engineering categories.
This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.
Vierter Internationaler Kongress F R Elektronenmikroskopie Fourth International Conference On Electron Microscopy Quatri Me Congr S International De Microscopie Lectronique
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Author : W. Bargmann
language : de
Publisher: Springer-Verlag
Release Date : 2013-03-08
Vierter Internationaler Kongress F R Elektronenmikroskopie Fourth International Conference On Electron Microscopy Quatri Me Congr S International De Microscopie Lectronique written by W. Bargmann and has been published by Springer-Verlag this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-08 with Science categories.
Die vorliegenden Verhandlungen des IV. Internationalen Kongresses für Elektronenmikro· skopie, der unter den Auspizien der International Federation 0/ Electron Microscope Societies im Jahre 1958 in Berlin stattfand, veranschaulichen, in welchem Ausmaß die Elektronenmikroskopie in den letzten Jahren für viele Bereiche der Forschung an Bedeutung gewonnen hat. Etwa 400 Vorträge und einige Diskussionsbemerkungen, vor mehr als 1000 Teilnehmern aus 26 Ländern gehalten, waren zu veröffentlichen, wenn wir der Tradition der früheren Internationalen Kongresse in Delft (1949), in Paris (1950) und in London (1954) treu bleiben wollten. Zum ersten Male war es nicht möglich, alle auf einem Internationalen Kongreß für Elektronenmikroskopie gehaltenen Vorträge in einem einzigen Band zusammenzufassen. Der 1. Band dieser Verhandlungen enthält sowohl die Arbeiten zur Theorie der Elektronenmikroskopie und über die physikalische sowie technische Weiterentwicklung der Geräte, als auch Mitteilungen über die Anwendung des Elek· tronenmikroskops zur Erforschung kristallographischer und technologischer Probleme ein· schließlich der Präparationstechnik. Der 11. Band bringt die Arbeiten über die Anwendung des Elektronenmikroskops zur Lösung biologischer und medizinischer Fragestellungen und über die entsprechenden Prä parationsverfahren. In Abweichung von der Reihenfolge, in der die Vorträge auf dem Kongreß gehalten wurden, waren wir bemüht, die Mitteilungen nach ihrem Sinnzusammenhang in kleinere Sachgruppen einzuordnen, um ein leichtes und schnelles Auffinden zusammengehöriger Themen zu ermöglichen. Die Inhaltsverzeichnisse, die beiden Bänden beigefügt sind, vermitteln eine ausreichende Über. sicht. Jeder Band enthält ein alphabetisches Mitarbeiterverzeichnis. Die Deutsche Gesellschaft für Elektronenmikroskopie, die veranstaltende Organisation, begrüßte mit dankbarer Anerkennung, daß der Springer.
High Voltage Electron Microscopy
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Author : Peter Roland Swann
language : en
Publisher:
Release Date : 1974
High Voltage Electron Microscopy written by Peter Roland Swann and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974 with Science categories.