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18th Ieee Vlsi Test Symposium


18th Ieee Vlsi Test Symposium
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18th Ieee Vlsi Test Symposium


18th Ieee Vlsi Test Symposium
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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2000

18th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Computers categories.


Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.



Ieee Vlsi Test Symposium


Ieee Vlsi Test Symposium
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Author :
language : en
Publisher:
Release Date : 2005

Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Application-specific integrated circuits categories.




19th Ieee Vlsi Test Symposium


19th Ieee Vlsi Test Symposium
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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2001

19th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.


Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.



Vlsi Soc Opportunities And Challenges Beyond The Internet Of Things


Vlsi Soc Opportunities And Challenges Beyond The Internet Of Things
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Author : Michail Maniatakos
language : en
Publisher: Springer
Release Date : 2019-05-16

Vlsi Soc Opportunities And Challenges Beyond The Internet Of Things written by Michail Maniatakos and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-05-16 with Computers categories.


This book contains extended and revised versions of the best papers presented at the 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, held in Abu Dhabi, United Arab Emirates, in August 2017. The 11 papers included in this book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. On the occasion of the silver jubilee of the VLSI-SoC conference series the book also includes a special chapter that presents the history of the VLSI-SoC series of conferences and its relation with VLSI-SoC evolution since the early 80s up to the present.



Asian Test Symposium


Asian Test Symposium
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Author :
language : en
Publisher:
Release Date : 2005

Asian Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Electronic circuits categories.




Dcis2002


Dcis2002
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Author : Salvador Bracho del Pino
language : en
Publisher: Ed. Universidad de Cantabria
Release Date : 2002

Dcis2002 written by Salvador Bracho del Pino and has been published by Ed. Universidad de Cantabria this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Technology & Engineering categories.


Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países



Invasive Tightly Coupled Processor Arrays


Invasive Tightly Coupled Processor Arrays
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Author : VAHID LARI
language : en
Publisher: Springer
Release Date : 2016-07-08

Invasive Tightly Coupled Processor Arrays written by VAHID LARI and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-07-08 with Technology & Engineering categories.


This book introduces new massively parallel computer (MPSoC) architectures called invasive tightly coupled processor arrays. It proposes strategies, architecture designs, and programming interfaces for invasive TCPAs that allow invading and subsequently executing loop programs with strict requirements or guarantees of non-functional execution qualities such as performance, power consumption, and reliability. For the first time, such a configurable processor array architecture consisting of locally interconnected VLIW processing elements can be claimed by programs, either in full or in part, using the principle of invasive computing. Invasive TCPAs provide unprecedented energy efficiency for the parallel execution of nested loop programs by avoiding any global memory access such as GPUs and may even support loops with complex dependencies such as loop-carried dependencies that are not amenable to parallel execution on GPUs. For this purpose, the book proposes different invasion strategies for claiming a desired number of processing elements (PEs) or region within a TCPA exclusively for an application according to performance requirements. It not only presents models for implementing invasion strategies in hardware, but also proposes two distinct design flavors for dedicated hardware components to support invasion control on TCPAs.



Design And Test Technology For Dependable Systems On Chip


Design And Test Technology For Dependable Systems On Chip
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Author : Ubar, Raimund
language : en
Publisher: IGI Global
Release Date : 2010-12-31

Design And Test Technology For Dependable Systems On Chip written by Ubar, Raimund and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-31 with Computers categories.


"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--



Proceedings Of The International Conference On Paradigms Of Computing Communication And Data Sciences


Proceedings Of The International Conference On Paradigms Of Computing Communication And Data Sciences
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Author : Rajendra Prasad Yadav
language : en
Publisher: Springer Nature
Release Date : 2023-02-23

Proceedings Of The International Conference On Paradigms Of Computing Communication And Data Sciences written by Rajendra Prasad Yadav and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-02-23 with Technology & Engineering categories.


This book gathers selected high-quality research papers presented at International Conference on Paradigms of Communication, Computing and Data Sciences (PCCDS 2022), held at Malaviya National Institute of Technology Jaipur, India, during 05 – 07 July 2022. It discusses high-quality and cutting-edge research in the areas of advanced computing, communications and data science techniques. The book is a collection of latest research articles in computation algorithm, communication and data sciences, intertwined with each other for efficiency.



Proceedings Of Cecnet 2022


Proceedings Of Cecnet 2022
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Author : A.J. Tallón-Ballesteros
language : en
Publisher: IOS Press
Release Date : 2022-12-29

Proceedings Of Cecnet 2022 written by A.J. Tallón-Ballesteros and has been published by IOS Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-12-29 with Computers categories.


Electronics, communication and networks coexist, and it is not possible to conceive of our current society without them. Within the next decade we will probably see the consolidation of 6G-based technology, accompanied by many compatible devices, and fiber-optic is already an advanced technology with many applications. This book presents the proceedings of CECNet 2022, the 12th International Conference on Electronics, Communications and Networks, held as a virtual event with no face-to-face participation in Xiamen, China, from 4 to 7 November 2022. CECNet is held annually, and covers many interrelated groups of topics such as electronics technology, communication engineering and technology, wireless communications engineering and technology and computer engineering and technology. This year the conference committee received 313 submissions. All papers were carefully reviewed by program committee members, taking into consideration the breadth and depth of research topics falling within the scope of the conference, and after further discussion, 79 papers were selected for presentation at the conference and for publication in this book. This represents an acceptance rate of about 25%. The book offers an overview of the latest research and developments in these rapidly evolving fields, and will be of interest to all those working with electronics, communication and networks.