19th Ieee Vlsi Test Symposium
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19th Ieee Vlsi Test Symposium
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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2001
19th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Ieee Vlsi Test Symposium
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Author :
language : en
Publisher:
Release Date : 2005
Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Application-specific integrated circuits categories.
Vlsi Test Symposium Vts 2001
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Author : IEEE Computer Society
language : en
Publisher:
Release Date : 2001-05
Vlsi Test Symposium Vts 2001 written by IEEE Computer Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-05 with categories.
Vlsi Design And Test
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Author : Brajesh Kumar Kaushik
language : en
Publisher: Springer
Release Date : 2017-12-21
Vlsi Design And Test written by Brajesh Kumar Kaushik and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-21 with Computers categories.
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Advances In Vlsi And Embedded Systems
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Author : Zuber Patel
language : en
Publisher: Springer Nature
Release Date : 2020-08-28
Advances In Vlsi And Embedded Systems written by Zuber Patel and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-08-28 with Technology & Engineering categories.
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Design And Test Technology For Dependable Systems On Chip
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Author : Ubar, Raimund
language : en
Publisher: IGI Global
Release Date : 2010-12-31
Design And Test Technology For Dependable Systems On Chip written by Ubar, Raimund and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-31 with Computers categories.
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Progress In Vlsi Design And Test
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Author : Hafizur Rahaman
language : en
Publisher: Springer
Release Date : 2012-06-26
Progress In Vlsi Design And Test written by Hafizur Rahaman and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-06-26 with Computers categories.
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Vlsi Soc At The Crossroads Of Emerging Trends
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Author : Alex Orailoglu
language : en
Publisher: Springer
Release Date : 2015-09-25
Vlsi Soc At The Crossroads Of Emerging Trends written by Alex Orailoglu and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-09-25 with Computers categories.
This book contains extended and revised versions of the best papers presented at the 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, held in Istanbul, Turkey, in October 2013. The 11 papers included in the book were carefully reviewed and selected from the 48 full papers presented at the conference. An extended version of a previously unpublished high-quality paper from VLSI-SoC 2012 is also included. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Industrial Engineering And Applications
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Author : L.-C. Tang
language : en
Publisher: IOS Press
Release Date : 2023-08-09
Industrial Engineering And Applications written by L.-C. Tang and has been published by IOS Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-08-09 with Technology & Engineering categories.
The field of industrial engineering (IE) has a very wide scope, from production processes and automation to supply chain management, but the scope of IE techniques has expanded beyond the traditional domains of application, and is now relevant to areas that matter most to society at large. This book presents the proceedings of ICIEA 2023, the 10th International Conference on Industrial Engineering and Applications, held in Phuket, Thailand, from 4 to 6 April 2023. The conference was conducted in hybrid mode, with close to 100 delegates attending in person and about 50 participants attending online. A total of 272 submissions were received for the conference, of which 120 were accepted for presentation with 83 of those published here as full papers. These papers cover a wide range of topics within the scope of industrial and systems engineering, including but not limited to: supply chain and logistics; quality and reliability; advanced manufacturing; and production scheduling to ergonomics and man-machine systems interfaces. In particular, a significant number of papers are devoted to machine learning techniques and applications beyond the traditional manufacturing sector, to include healthcare, sustainability assessment, and other social issues. Offering an overview of recent research and novel applications, the book will be of interest to all those whose work involves the application of industrial engineering techniques.
Vlsi Testing
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Author : Stanley Leonard Hurst
language : en
Publisher: IET
Release Date : 1998
Vlsi Testing written by Stanley Leonard Hurst and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Computers categories.
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR