Vlsi Design And Test
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Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Vlsi Design And Test
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Author : Brajesh Kumar Kaushik
language : en
Publisher: Springer
Release Date : 2017-12-21
Vlsi Design And Test written by Brajesh Kumar Kaushik and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-21 with Computers categories.
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Vlsi Design And Test For Systems Dependability
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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20
Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Vlsi Design And Test
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Author : Manoj Singh Gaur
language : en
Publisher: Springer
Release Date : 2013-12-13
Vlsi Design And Test written by Manoj Singh Gaur and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-12-13 with Computers categories.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Vlsi Design And Test
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Author : S. Rajaram
language : en
Publisher: Springer
Release Date : 2019-01-24
Vlsi Design And Test written by S. Rajaram and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-01-24 with Computers categories.
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Progress In Vlsi Design And Test
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Author : Hafizur Rahaman
language : en
Publisher: Springer
Release Date : 2012-06-26
Progress In Vlsi Design And Test written by Hafizur Rahaman and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-06-26 with Computers categories.
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Vlsi Design And Test
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Author : Anirban Sengupta
language : en
Publisher: Springer
Release Date : 2019-08-17
Vlsi Design And Test written by Anirban Sengupta and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-17 with Computers categories.
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
2020 24th International Symposium On Vlsi Design And Test Vdat
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Author :
language : en
Publisher:
Release Date : 2020
2020 24th International Symposium On Vlsi Design And Test Vdat written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020 with categories.
Vlsi Design And Test
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Author : Ambika Prasad Shah
language : en
Publisher: Springer Nature
Release Date : 2022-12-16
Vlsi Design And Test written by Ambika Prasad Shah and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-12-16 with Computers categories.
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
Vlsi Testing
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Author : Stanley Leonard Hurst
language : en
Publisher: IET
Release Date : 1998
Vlsi Testing written by Stanley Leonard Hurst and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Computers categories.
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR