Vlsi Design And Test
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Vlsi Design And Test For Systems Dependability
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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20
Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Vlsi Design And Test
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Author : Brajesh Kumar Kaushik
language : en
Publisher:
Release Date : 2017
Vlsi Design And Test written by Brajesh Kumar Kaushik and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with Computer Communication Networks categories.
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Iddq Testing Of Vlsi Circuits
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Author : Ravi K. Gulati
language : en
Publisher: Springer Science & Business Media
Release Date : 1992-12-31
Iddq Testing Of Vlsi Circuits written by Ravi K. Gulati and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-12-31 with Computers categories.
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Testing And Diagnosis Of Vlsi And Ulsi
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Author : F. Lombardi
language : en
Publisher: Springer Science & Business Media
Release Date : 1988-11-30
Testing And Diagnosis Of Vlsi And Ulsi written by F. Lombardi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988-11-30 with Computers categories.
Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987
Vlsi Design And Test
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Author : S. Rajaram
language : en
Publisher: Springer
Release Date : 2019-01-24
Vlsi Design And Test written by S. Rajaram and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-01-24 with Computers categories.
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Built In Test For Vlsi
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Author : Paul H. Bardell
language : en
Publisher: Wiley-Interscience
Release Date : 1987-10-20
Built In Test For Vlsi written by Paul H. Bardell and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-10-20 with Technology & Engineering categories.
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
Vlsi Circuit Design Methodology Demystified
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Author : Liming Xiu
language : en
Publisher: John Wiley & Sons
Release Date : 2007-12-04
Vlsi Circuit Design Methodology Demystified written by Liming Xiu and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-04 with Technology & Engineering categories.
This book was written to arm engineers qualified and knowledgeable in the area of VLSI circuits with the essential knowledge they need to get into this exciting field and to help those already in it achieve a higher level of proficiency. Few people truly understand how a large chip is developed, but an understanding of the whole process is necessary to appreciate the importance of each part of it and to understand the process from concept to silicon. It will teach readers how to become better engineers through a practical approach of diagnosing and attacking real-world problems.
Vlsi Design And Test
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Author : Brajesh Kumar Kaushik
language : en
Publisher: Springer
Release Date : 2017-12-21
Vlsi Design And Test written by Brajesh Kumar Kaushik and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-21 with Computers categories.
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.