Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : M. Bushnell
language : en
Publisher:
Release Date : 2014-01-15
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : Michael Lee Bushnell
language : en
Publisher:
Release Date : 2000
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by Michael Lee Bushnell and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Digital integrated circuits categories.
Cost Analysis Of Electronic Systems
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Author : Peter Sandborn
language : en
Publisher: World Scientific
Release Date : 2013
Cost Analysis Of Electronic Systems written by Peter Sandborn and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Business & Economics categories.
Understanding the cost ramifications of design, manufacturing and life-cycle management decisions is of central importance to businesses associated with all types of electronic systems. Cost Analysis of Electronic Systems contains carefully developed models and theory that practicing engineers can directly apply to the modeling of costs for real products and systems. In addition, this book brings to light and models many contributions to life-cycle costs that practitioners are aware of but never had the tools or techniques to address quantitatively in the past.Cost Analysis of Electronic Systems melds elements of traditional engineering economics with manufacturing process and life-cycle cost management concepts to form a practical foundation for predicting the cost of electronic products and systems. Various manufacturing cost analysis methods are addressed including: process-flow, parametric, cost of ownership, and activity-based costing. The effects of learning curves, data uncertainty, test and rework processes, and defects are considered. Aspects of system sustainment and life-cycle cost modeling including reliability (warranty, burn-in), maintenance (sparing and availability), and obsolescence are treated. Finally, total cost of ownership of systems and return on investment are addressed.Real life design scenarios from integrated circuit fabrication, electronic systems assembly, substrate fabrication, and electronic systems managementare used as examples of the application of the cost estimation methods developed within the book.
Power Constrained Testing Of Vlsi Circuits
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Author : Nicola Nicolici
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Power Constrained Testing Of Vlsi Circuits written by Nicola Nicolici and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Wafer Level Testing And Test During Burn In For Integrated Circuits
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Author : Sudarshan Bahukudumbi
language : en
Publisher: Artech House
Release Date : 2010
Wafer Level Testing And Test During Burn In For Integrated Circuits written by Sudarshan Bahukudumbi and has been published by Artech House this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Technology & Engineering categories.
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.
Micro Electrode Dot Array Digital Microfluidic Biochips
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Author : Zipeng Li
language : en
Publisher: Springer
Release Date : 2018-12-14
Micro Electrode Dot Array Digital Microfluidic Biochips written by Zipeng Li and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-12-14 with Technology & Engineering categories.
This book provides an insightful guide to the design, testing and optimization of micro-electrode-dot-array (MEDA) digital microfluidic biochips. The authors focus on the characteristics specific for MEDA biochips, e.g., real-time sensing and advanced microfluidic operations like lamination mixing and droplet shape morphing. Readers will be enabled to enhance the automated design and use of MEDA and to develop a set of solutions to facilitate the full exploitation of design complexities that are possible with standard CMOS fabrication techniques. The book provides the first set of design automation and test techniques for MEDA biochips. The methods described in this book have been validated using fabricated MEDA biochips in the laboratory. Readers will benefit from an in-depth look at the MEDA platform and how to combine microfluidics with software, e.g., applying biomolecular protocols to software-controlled and cyberphysical microfluidic biochips.
Hardware Protection Through Obfuscation
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Author : Domenic Forte
language : en
Publisher: Springer
Release Date : 2017-01-02
Hardware Protection Through Obfuscation written by Domenic Forte and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-01-02 with Technology & Engineering categories.
This book introduces readers to various threats faced during design and fabrication by today’s integrated circuits (ICs) and systems. The authors discuss key issues, including illegal manufacturing of ICs or “IC Overproduction,” insertion of malicious circuits, referred as “Hardware Trojans”, which cause in-field chip/system malfunction, and reverse engineering and piracy of hardware intellectual property (IP). The authors provide a timely discussion of these threats, along with techniques for IC protection based on hardware obfuscation, which makes reverse-engineering an IC design infeasible for adversaries and untrusted parties with any reasonable amount of resources. This exhaustive study includes a review of the hardware obfuscation methods developed at each level of abstraction (RTL, gate, and layout) for conventional IC manufacturing, new forms of obfuscation for emerging integration strategies (split manufacturing, 2.5D ICs, and 3D ICs), and on-chip infrastructure needed for secure exchange of obfuscation keys- arguably the most critical element of hardware obfuscation.
Reliability Of Nanoscale Circuits And Systems
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Author : Miloš Stanisavljević
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-10-20
Reliability Of Nanoscale Circuits And Systems written by Miloš Stanisavljević and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-10-20 with Technology & Engineering categories.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-29
High Performance Memory Testing written by R. Dean Adams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-29 with Technology & Engineering categories.
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.