High Performance Memory Testing
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High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher: Springer Science & Business Media
Release Date : 2002-09-30
High Performance Memory Testing written by R. Dean Adams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-09-30 with Technology & Engineering categories.
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-29
High Performance Memory Testing written by R. Dean Adams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-29 with Technology & Engineering categories.
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher:
Release Date : 2014-01-15
High Performance Memory Testing written by R. Dean Adams and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
Advanced Test Methods For Srams
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Author : Alberto Bosio
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-10-08
Advanced Test Methods For Srams written by Alberto Bosio and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-08 with Technology & Engineering categories.
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Design And Test Technology For Dependable Systems On Chip
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Author : Ubar, Raimund
language : en
Publisher: IGI Global
Release Date : 2010-12-31
Design And Test Technology For Dependable Systems On Chip written by Ubar, Raimund and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-31 with Computers categories.
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Woodcock Johnson Iv
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Author : Nancy Mather
language : en
Publisher: John Wiley & Sons
Release Date : 2016-01-22
Woodcock Johnson Iv written by Nancy Mather and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-01-22 with Psychology categories.
Includes online access to new, customizable WJ IV score tables, graphs, and forms for clinicians Woodcock-Johnson IV: Reports, Recommendations, and Strategies offers psychologists, clinicians, and educators an essential resource for preparing and writing psychological and educational reports after administering the Woodcock-Johnson IV. Written by Drs. Nancy Mather and Lynne E. Jaffe, this text enhances comprehension and use of this instrument and its many interpretive features. This book offers helpful information for understanding and using the WJ IV scores, provides tips to facilitate interpretation of test results, and includes sample diagnostic reports of students with various educational needs from kindergarten to the postsecondary level. The book also provides a wide variety of recommendations for cognitive abilities; oral language; and the achievement areas of reading, written language, and mathematics. It also provides guidelines for evaluators and recommendations focused on special populations, such as sensory impairments, autism, English Language Learners, and gifted and twice exceptional students, as well as recommendations for the use of assistive technology. The final section provides descriptions of the academic and behavioral strategies mentioned in the reports and recommendations. The unique access code included with each book allows access to downloadable, easy-to-customize score tables, graphs, and forms. This essential guide Facilitates the use and interpretation of the WJ IV Tests of Cognitive Abilities, Tests of Oral Language, and Tests of Achievement Explains scores and various interpretive features Offers a variety of types of diagnostic reports Provides a wide variety of educational recommendations and evidence-based strategies
High Performance And Hardware Aware Computing
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Author : Rainer Buchty
language : en
Publisher: KIT Scientific Publishing
Release Date : 2008
High Performance And Hardware Aware Computing written by Rainer Buchty and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Computer architecture categories.
Power Constrained Testing Of Vlsi Circuits
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Author : Nicola Nicolici
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Power Constrained Testing Of Vlsi Circuits written by Nicola Nicolici and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
The Core Test Wrapper Handbook
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Author : Francisco da Silva
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-09-15
The Core Test Wrapper Handbook written by Francisco da Silva and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-09-15 with Technology & Engineering categories.
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion – a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
Testing Static Random Access Memories
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Author : Said Hamdioui
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Testing Static Random Access Memories written by Said Hamdioui and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.