Vlsi Test Symposium Vts 2001

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Vlsi Test Symposium Vts 2001

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Author : IEEE Computer Society
language : en
Publisher:
Release Date : 2001-05

Vlsi Test Symposium Vts 2001 written by IEEE Computer Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-05 with categories.

Ieee Vlsi Test Symposium

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Author :
language : en
Publisher:
Release Date : 2005

Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Application-specific integrated circuits categories.

19th Ieee Vlsi Test Symposium Vts 2001

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Author :
language : en
Publisher:
Release Date : 2001

19th Ieee Vlsi Test Symposium Vts 2001 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Integrated circuits categories.

19th Ieee Vlsi Test Symposium

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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2001

19th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.

Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.

International Conference On Intelligent Computing And Applications

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Author : Subhransu Sekhar Dash
language : en
Publisher: Springer
Release Date : 2017-12-28

International Conference On Intelligent Computing And Applications written by Subhransu Sekhar Dash and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-28 with Technology & Engineering categories.

The book is a collection of best papers presented in International Conference on Intelligent Computing and Applications (ICICA 2016) organized by Department of Computer Engineering, D.Y. Patil College of Engineering, Pune, India during 20-22 December 2016. The book presents original work, information, techniques and applications in the field of computational intelligence, power and computing technology. This volume also talks about image language processing, computer vision and pattern recognition, machine learning, data mining and computational life sciences, management of data including Big Data and analytics, distributed and mobile systems including grid and cloud infrastructure.

Soc System On A Chip Testing For Plug And Play Test Automation

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Author : Krishnendu Chakrabarty
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Soc System On A Chip Testing For Plug And Play Test Automation written by Krishnendu Chakrabarty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Technology & Engineering categories.

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Introduction To Advanced System On Chip Test Design And Optimization

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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30

Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Embedded Processor Based Self Test

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Author : Dimitris Gizopoulos
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09

Embedded Processor Based Self Test written by Dimitris Gizopoulos and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Computers categories.

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

Industrial Engineering And Applications

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Author : L.-C. Tang
language : en
Publisher: IOS Press
Release Date : 2023-08-09

Industrial Engineering And Applications written by L.-C. Tang and has been published by IOS Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-08-09 with Technology & Engineering categories.

The field of industrial engineering (IE) has a very wide scope, from production processes and automation to supply chain management, but the scope of IE techniques has expanded beyond the traditional domains of application, and is now relevant to areas that matter most to society at large. This book presents the proceedings of ICIEA 2023, the 10th International Conference on Industrial Engineering and Applications, held in Phuket, Thailand, from 4 to 6 April 2023. The conference was conducted in hybrid mode, with close to 100 delegates attending in person and about 50 participants attending online. A total of 272 submissions were received for the conference, of which 120 were accepted for presentation with 83 of those published here as full papers. These papers cover a wide range of topics within the scope of industrial and systems engineering, including but not limited to: supply chain and logistics; quality and reliability; advanced manufacturing; and production scheduling to ergonomics and man-machine systems interfaces. In particular, a significant number of papers are devoted to machine learning techniques and applications beyond the traditional manufacturing sector, to include healthcare, sustainability assessment, and other social issues. Offering an overview of recent research and novel applications, the book will be of interest to all those whose work involves the application of industrial engineering techniques.

The Vlsi Handbook

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Author : Wai-Kai Chen
language : en
Publisher: CRC Press
Release Date : 2018-10-03

The Vlsi Handbook written by Wai-Kai Chen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.

For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.