Introduction To Advanced System On Chip Test Design And Optimization
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Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer
Release Date : 2008-11-01
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Reliability Availability And Serviceability Of Networks On Chip
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Author : Érika Cota
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-23
Reliability Availability And Serviceability Of Networks On Chip written by Érika Cota and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-23 with Technology & Engineering categories.
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Ubiquitous Communications And Network Computing
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Author : Navin Kumar
language : en
Publisher: Springer
Release Date : 2017-12-22
Ubiquitous Communications And Network Computing written by Navin Kumar and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-22 with Computers categories.
This book constitutes the refereed proceedings of the First International Conference on Ubiquitous Communications and Network Computing, UBICNET 2017, held in Bangalore, India, in August 2017. The 23 full papers were selected from 71 submissions and are grouped in topical sections on safety and energy efficient computing, cloud computing and mobile commerce, advanced and software defined networks, and advanced communication systems and networks.
System On Chip For Real Time Applications
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Author : Wael Badawy
language : en
Publisher: Springer Science & Business Media
Release Date : 2002-10-31
System On Chip For Real Time Applications written by Wael Badawy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-10-31 with Technology & Engineering categories.
System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.
System On Chip Test Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28
System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.
Design Of Systems On A Chip Design And Test
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Author : Ricardo Reis
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-06
Design Of Systems On A Chip Design And Test written by Ricardo Reis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-06 with Technology & Engineering categories.
This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
Design And Test Technology For Dependable Systems On Chip
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Author : Raimund Ubar
language : en
Publisher: IGI Global
Release Date : 2011-01-01
Design And Test Technology For Dependable Systems On Chip written by Raimund Ubar and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-01-01 with Computers categories.
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Soc System On A Chip Testing For Plug And Play Test Automation
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Author : Krishnendu Chakrabarty
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Soc System On A Chip Testing For Plug And Play Test Automation written by Krishnendu Chakrabarty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Technology & Engineering categories.
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Essential Issues In Soc Design
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Author : Youn-Long Steve Lin
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-31
Essential Issues In Soc Design written by Youn-Long Steve Lin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-31 with Technology & Engineering categories.
This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.