Introduction To Advanced System On Chip Test Design And Optimization
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Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer
Release Date : 2008-11-01
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Reliability Availability And Serviceability Of Networks On Chip
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Author : Érika Cota
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-23
Reliability Availability And Serviceability Of Networks On Chip written by Érika Cota and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-23 with Technology & Engineering categories.
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Ubiquitous Communications And Network Computing
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Author : Navin Kumar
language : en
Publisher: Springer
Release Date : 2017-12-22
Ubiquitous Communications And Network Computing written by Navin Kumar and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-22 with Computers categories.
This book constitutes the refereed proceedings of the First International Conference on Ubiquitous Communications and Network Computing, UBICNET 2017, held in Bangalore, India, in August 2017. The 23 full papers were selected from 71 submissions and are grouped in topical sections on safety and energy efficient computing, cloud computing and mobile commerce, advanced and software defined networks, and advanced communication systems and networks.
Sensors Circuits And Systems For Scientific Instruments
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Author : Soumyajit Mandal
language : en
Publisher: Academic Press
Release Date : 2025-07-11
Sensors Circuits And Systems For Scientific Instruments written by Soumyajit Mandal and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-11 with Technology & Engineering categories.
Sensors, Circuits, and Systems for Scientific Instruments: Back-Ends and Applications delves into the advanced world of sensors and circuits tailored for precision measurements. This text builds on foundational concepts from prior studies and focuses on the sophisticated processes in the later stages of measurement. From data converters to digital signal processing, and parameter estimation to machine learning, this volume provides students with critical insights into testing, verification, and system integration through practical case studies involving various scientific instruments.Designed for senior undergraduates and entry-level graduate students in electrical and computer engineering, applied physics, and biomedical engineering, this book bridges a gap between component-focused texts and broad surveys, offering a thorough understanding of back-end systems and applications. - Develops a unified treatment of modern scientific instruments by combining knowledge of high-performance sensors, semiconductor devices, circuits, signal processing, and embedded computing - Focuses on fundamental concepts in precision sensing and interface circuitry (accuracy, precision, linearity, noise, etc.) and their impact on system-level performance - Introduces readers to the indispensable role of signal detection theory, pattern recognition, and machine learning for modern scientific instrumentation - Presents multiple case studies and examples to demonstrate how theoretical concepts are translated into real-life measurement systems
Advancing Vlsi Through Machine Learning
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Author : Abhishek Narayan Tripathi
language : en
Publisher: CRC Press
Release Date : 2025-03-31
Advancing Vlsi Through Machine Learning written by Abhishek Narayan Tripathi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-03-31 with Technology & Engineering categories.
This book explores the synergy between very large-scale integration (VLSI) and machine learning (ML) and its applications across various domains. It investigates how ML techniques can enhance the design and testing of VLSI circuits, improve power efficiency, optimize layouts, and enable novel architectures. This book bridges the gap between VLSI and ML, showcasing the potential of this integration in creating innovative electronic systems, advancing computing capabilities, and paving the way for a new era of intelligent devices and technologies. Additionally, it covers how VLSI technologies can accelerate ML algorithms, enabling more efficient and powerful data processing and inference engines. It explores both hardware and software aspects, covering topics like hardware accelerators, custom hardware for specific ML tasks, and ML-driven optimization techniques for chip design and testing. This book will be helpful for academicians, researchers, postgraduate students, and those working in ML-driven VLSI.
Emerging Nanotechnologies
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Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-12-08
Emerging Nanotechnologies written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-08 with Technology & Engineering categories.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Handbook Of Emerging Materials For Semiconductor Industry
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Author : Young Suh Song
language : en
Publisher: Springer Nature
Release Date : 2024-05-31
Handbook Of Emerging Materials For Semiconductor Industry written by Young Suh Song and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-05-31 with Technology & Engineering categories.
The proposed book will be a “one-stop” place for all the young material researchers to understand the recent and reliable material making process, characterization, and reliability test tools. The proposed book is designed to provide basic knowledge to understand and analyse structure-property relationship for reliable emerging material systems for next generation of semiconductor technologies. The book is suggested to engineers and scientists across the world working on various new and novel materials for reliable semiconductor device applications. The book is expected to serve as a reference guide for young scientists and engineers in the field of material science and electronic engineers to acquire latest state-of-art experimental and computational tools to encourage their research activities. Since the scope of the book is generic, the book can be referred by all the students of science and engineering students to create a common awareness about the latest material systems and state-of-art characterization tools that have been broadly utilized to study the physical and chemical properties of different material systems. It introduces the readers to a wide variety of new emerging materials systems including their synthesis, fabrication, measurement, reliability test, modelling and simulations with in-depth analysis of selective applications. This book contains the state-of-art research updates in the various fields of semiconductor, artificial intelligence (AI), bio-sensor, biotechnology, with respect to reliable material research. Therefore, various students who are eager to get a job in semiconductor/AI/Autonomous car/biotechnology are strongly recommended to read this book and learn about related state-of-art knowledge.
Innovations And Advanced Techniques In Computer And Information Sciences And Engineering
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Author : Tarek Sobh
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-09-04
Innovations And Advanced Techniques In Computer And Information Sciences And Engineering written by Tarek Sobh and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-09-04 with Technology & Engineering categories.
This book includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Computer Science, Computer Engineering and Information Sciences. The book presents selected papers from the conference proceedings of the International Conference on Systems, Computing Sciences and Software Engineering (SCSS 2006). All aspects of the conference were managed on-line.
Thermal Issues In Testing Of Advanced Systems On Chip
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Author : Nima Aghaee Ghaleshahi
language : en
Publisher: Linköping University Electronic Press
Release Date : 2015-09-23
Thermal Issues In Testing Of Advanced Systems On Chip written by Nima Aghaee Ghaleshahi and has been published by Linköping University Electronic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-09-23 with categories.
Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. Such very large scale integration is enabled by a core-based design paradigm as well as deep-submicron and 3D-stacked-IC technologies. These technologies are susceptible to reliability and testing complications caused by thermal issues. Three crucial thermal issues related to temperature variations, temperature gradients, and temperature cycling are addressed in this thesis. Existing test scheduling techniques rely on temperature simulations to generate schedules that meet thermal constraints such as overheating prevention. The difference between the simulated temperatures and the actual temperatures is called temperature error. This error, for past technologies, is negligible. However, advanced SoCs experience large errors due to large process variations. Such large errors have costly consequences, such as overheating, and must be taken care of. This thesis presents an adaptive approach to generate test schedules that handle such temperature errors. Advanced SoCs manufactured as 3D stacked ICs experience large temperature gradients. Temperature gradients accelerate certain early-life defect mechanisms. These mechanisms can be artificially accelerated using gradient-based, burn-in like, operations so that the defects are detected before shipping. Moreover, temperature gradients exacerbate some delay-related defects. In order to detect such defects, testing must be performed when appropriate temperature-gradients are enforced. A schedule-based technique that enforces the temperature-gradients for burn-in like operations is proposed in this thesis. This technique is further developed to support testing for delay-related defects while appropriate gradients are enforced. The last thermal issue addressed by this thesis is related to temperature cycling. Temperature cycling test procedures are usually applied to safety-critical applications to detect cycling-related early-life failures. Such failures affect advanced SoCs, particularly through-silicon-via structures in 3D-stacked-ICs. An efficient schedule-based cycling-test technique that combines cycling acceleration with testing is proposed in this thesis. The proposed technique fits into existing 3D testing procedures and does not require temperature chambers. Therefore, the overall cycling acceleration and testing cost can be drastically reduced. All the proposed techniques have been implemented and evaluated with extensive experiments based on ITC’02 benchmarks as well as a number of 3D stacked ICs. Experiments show that the proposed techniques work effectively and reduce the costs, in particular the costs related to addressing thermal issues and early-life failures. We have also developed a fast temperature simulation technique based on a closed-form solution for the temperature equations. Experiments demonstrate that the proposed simulation technique reduces the schedule generation time by more than half.