A New Methodology For Yield Simulation Of Integrated Circuits
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A New Methodology For Yield Simulation Of Integrated Circuits
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Author : Carnegie-Mellon University. SRC-CMU Research Center for Computer-Aided Design
language : en
Publisher:
Release Date : 1989
A New Methodology For Yield Simulation Of Integrated Circuits written by Carnegie-Mellon University. SRC-CMU Research Center for Computer-Aided Design and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Vlsi Design For Manufacturing Yield Enhancement
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Author : Stephen W. Director
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Vlsi Design For Manufacturing Yield Enhancement written by Stephen W. Director and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Yield Simulation For Integrated Circuits
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Author : D M Walker
language : en
Publisher: Springer
Release Date : 2014-01-15
Yield Simulation For Integrated Circuits written by D M Walker and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
The Application Of Yield Surface Modeling Methodology To Digital Cmos Integrated Circuits
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Author : David William Feldbaumer
language : en
Publisher:
Release Date : 1990
The Application Of Yield Surface Modeling Methodology To Digital Cmos Integrated Circuits written by David William Feldbaumer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Integrated circuits categories.
Computer Aided Design Of Analog Integrated Circuits And Systems
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Author : Rob A. Rutenbar
language : en
Publisher: John Wiley & Sons
Release Date : 2002-05-06
Computer Aided Design Of Analog Integrated Circuits And Systems written by Rob A. Rutenbar and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-05-06 with Technology & Engineering categories.
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Yield And Variability Optimization Of Integrated Circuits
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Author : Jian Cheng Zhang
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Yield And Variability Optimization Of Integrated Circuits written by Jian Cheng Zhang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
Selected Papers On Statistical Design Of Integrated Circuits
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Author : Andrzej J. Strojwas
language : en
Publisher:
Release Date : 1987
Selected Papers On Statistical Design Of Integrated Circuits written by Andrzej J. Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Technology & Engineering categories.
Process Variations And Probabilistic Integrated Circuit Design
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Author : Manfred Dietrich
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-11-20
Process Variations And Probabilistic Integrated Circuit Design written by Manfred Dietrich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-11-20 with Technology & Engineering categories.
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Analog Integrated Circuit Design By Simulation Techniques Tools And Methods
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Author : Ugur Cilingiroglu
language : en
Publisher: McGraw Hill Professional
Release Date : 2019-03-29
Analog Integrated Circuit Design By Simulation Techniques Tools And Methods written by Ugur Cilingiroglu and has been published by McGraw Hill Professional this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-03-29 with Technology & Engineering categories.
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. Learn the principles and practices of simulation-based analog IC design This comprehensive textbook and on-the-job reference offers clear instruction on analog integrated circuit design using the latest simulation techniques. Ideal for graduate students and professionals alike, the book shows, step by step, how to develop and deploy integrated circuits for cutting-edge Internet of Things (IoT) and other applications. Analog Integrated Circuit Design by Simulation: Techniques, Tools, and Methods lays out practical, ready-to-apply engineering strategies. Application layer, device layer, and circuit layer IC design are covered in complete detail. You will learn how to tackle real-world design problems and avoid long cycles of trial and error. Coverage includes: •First-order DC response•Unified closed-loop model•Accurate modeling of DC response•Frequency and step response•Multi-pole dynamic response and stability•Effect of external network on differential gain•Continuous-time and discrete-time amplifiers•MOSFET, NMOS, and PMOS characteristics•Small-signal modeling and circuit analysis•Resistor and capacitor design•Current sources, sinks, and mirrors•Basic, symmetrical, folded-cascode, and Miller OTAs•Opamps with source-follower and common-source output stages•Fully differential OTAs and opamps
Integrated Circuit Manufacturability
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Author : José Pineda de Gyvez
language : en
Publisher: John Wiley & Sons
Release Date : 1998-10-30
Integrated Circuit Manufacturability written by José Pineda de Gyvez and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-10-30 with Technology & Engineering categories.
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."