Yield Simulation For Integrated Circuits
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Yield Simulation For Integrated Circuits
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Author : D.M. Walker
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Yield Simulation For Integrated Circuits written by D.M. Walker and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Computers categories.
In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.
A New Methodology For Yield Simulation Of Integrated Circuits
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Author : Carnegie-Mellon University. SRC-CMU Research Center for Computer-Aided Design
language : en
Publisher:
Release Date : 1989
A New Methodology For Yield Simulation Of Integrated Circuits written by Carnegie-Mellon University. SRC-CMU Research Center for Computer-Aided Design and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Vlsi Design For Manufacturing Yield Enhancement
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Author : Stephen W. Director
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Vlsi Design For Manufacturing Yield Enhancement written by Stephen W. Director and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Yield And Variability Optimization Of Integrated Circuits
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Author : Jian Cheng Zhang
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Yield And Variability Optimization Of Integrated Circuits written by Jian Cheng Zhang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
From Contamination To Defects Faults And Yield Loss
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Author : Jitendra B. Khare
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
From Contamination To Defects Faults And Yield Loss written by Jitendra B. Khare and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
A Systematic Approach To Modeling Yield For Integrated Circuits
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Author : Aparna Srinivasan
language : en
Publisher:
Release Date : 1995
A Systematic Approach To Modeling Yield For Integrated Circuits written by Aparna Srinivasan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with categories.
Yield Reliability Modeling For Integrated Circuits
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Author : Thomas S. Barnett
language : en
Publisher:
Release Date : 2002
Yield Reliability Modeling For Integrated Circuits written by Thomas S. Barnett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Integrated circuits categories.
Nanometer Variation Tolerant Sram
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Author : Mohamed Abu Rahma
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-26
Nanometer Variation Tolerant Sram written by Mohamed Abu Rahma and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-26 with Technology & Engineering categories.
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Selected Papers On Statistical Design Of Integrated Circuits
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Author : Andrzej J. Strojwas
language : en
Publisher:
Release Date : 1987
Selected Papers On Statistical Design Of Integrated Circuits written by Andrzej J. Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Technology & Engineering categories.
Introduction To Semiconductor Device Yield Modeling
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Author : Albert V. Ferris-Prabhu
language : en
Publisher: Artech House Materials Science
Release Date : 1992
Introduction To Semiconductor Device Yield Modeling written by Albert V. Ferris-Prabhu and has been published by Artech House Materials Science this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Technology & Engineering categories.
This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.