Nanometer Variation Tolerant Sram
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Nanometer Variation Tolerant Sram
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Author : Mohamed Abu Rahma
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-26
Nanometer Variation Tolerant Sram written by Mohamed Abu Rahma and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-26 with Technology & Engineering categories.
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Nanometer Variation Tolerant Sram
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Author :
language : en
Publisher: Springer
Release Date : 2012-09-28
Nanometer Variation Tolerant Sram written by and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-28 with categories.
Nanometer Variation Tolerant Sram
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Author : Mohamed Abu Rahma
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-27
Nanometer Variation Tolerant Sram written by Mohamed Abu Rahma and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-27 with Technology & Engineering categories.
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Low Power Variation Tolerant Design In Nanometer Silicon
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Author : Swarup Bhunia
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-11-10
Low Power Variation Tolerant Design In Nanometer Silicon written by Swarup Bhunia and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-10 with Technology & Engineering categories.
Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.
Data Science And Applications
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Author : Satyasai Jagannath Nanda
language : en
Publisher: Springer Nature
Release Date : 2024-02-24
Data Science And Applications written by Satyasai Jagannath Nanda and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-24 with Computers categories.
This book gathers outstanding papers presented at the International Conference on Data Science and Applications (ICDSA 2023), organized by Soft Computing Research Society (SCRS) and Malaviya National Institute of Technology Jaipur, India, from 14 to 15 July 2023. The book is divided into four volumes, and it covers theoretical and empirical developments in various areas of big data analytics, big data technologies, decision tree learning, wireless communication, wireless sensor networking, bioinformatics and systems, artificial neural networks, deep learning, genetic algorithms, data mining, fuzzy logic, optimization algorithms, image processing, computational intelligence in civil engineering, and creative computing.
Circuit Technology Co Optimization Of Sram Design In Advanced Cmos Nodes
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Author : Hsiao-Hsuan Liu
language : en
Publisher: Springer Nature
Release Date : 2024-12-20
Circuit Technology Co Optimization Of Sram Design In Advanced Cmos Nodes written by Hsiao-Hsuan Liu and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-12-20 with Computers categories.
Modern computing engines—CPUs, GPUs, and NPUs—require extensive SRAM for cache designs, driven by the increasing demand for higher density, performance, and energy efficiency. This book delves into two primary areas within ultra-scaled technology nodes: (1) advancing SRAM bitcell scaling and (2) exploring innovative subarray designs to enhance power-performance-area (PPA) metrics across technology nodes. The first part of the book utilizes a bottom-up design-technology co-optimization (DTCO) approach, employing a dedicated PPA simulation framework to evaluate and identify the most promising strategies for SRAM bitcell scaling. It offers a comprehensive examination of SRAM bitcell scaling beyond 1 nm node, outlining a structured research cycle that includes identifying scaling bottlenecks, developing cutting-edge architectures with complementary field-effect transistor (CFET) technology, and addressing challenges such as process integration and routing complexities. Additionally, this book introduces a novel write margin methodology to better address the risks of write failures in resistance-dominated nodes. This methodology accounts for time-dependent parasitic bitline effects and incorporates timing setup of write-assist techniques to prevent underestimating the yield loss. In the second part, the focus shifts to a top-down DTCO approach due to the diminishing returns of bitcell scaling beyond 5 Å node at the macro level. As technology scales, increasing resistance and capacitance (RC) lead designers to adopt smaller subarray sizes to reduce effective RC and enhance subarray-level PPA. However, this approach can result in increased inter-subarray interconnect overhead, potentially offsetting macro-level improvements. This book examines the effects of various subarray sizes on macro-level PPA and finds that larger subarrays can significantly reduce interconnect overhead and improve the energy-delay-area product (EDAP) of SRAM macro. The introduction of the active interconnect (AIC) concept enables the use of larger subarray sizes, while integrating carbon nanotube FET as back-end-of-line compatible devices results in macro-level EDAP improvements of up to 65% when transitioning from standard subarrays to AIC divided subarrays. These findings highlight the future trajectory of SRAM subarray design in deeply scaled nodes.
Microelectronics Electromagnetics And Telecommunications
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Author : Jaume Anguera
language : en
Publisher: Springer
Release Date : 2018-01-25
Microelectronics Electromagnetics And Telecommunications written by Jaume Anguera and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-01-25 with Technology & Engineering categories.
The volume contains 94 best selected research papers presented at the Third International Conference on Micro Electronics, Electromagnetics and Telecommunications (ICMEET 2017) The conference was held during 09-10, September, 2017 at Department of Electronics and Communication Engineering, BVRIT Hyderabad College of Engineering for Women, Hyderabad, Telangana, India. The volume includes original and application based research papers on microelectronics, electromagnetics, telecommunications, wireless communications, signal/speech/video processing and embedded systems.
Communication Software And Networks
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Author : Vikrant Bhateja
language : en
Publisher: Springer Nature
Release Date : 2022-10-27
Communication Software And Networks written by Vikrant Bhateja and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-10-27 with Technology & Engineering categories.
This book highlights a collection of high-quality peer-reviewed research papers presented at the 7th International Conference on Information System Design and Intelligent Applications (INDIA 2022), held at BVRIT Hyderabad College of Engineering for Women, Hyderabad, Telangana, India, from February 25–26, 2022. It covers a wide range of topics in computer science and information technology, from wireless networks, social networks, wireless sensor networks, information and network security, to web security, Internet of Things, bioinformatics, geoinformatics, and computer networks.
Vlsi Design And Test
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Author : Brajesh Kumar Kaushik
language : en
Publisher: Springer
Release Date : 2017-12-21
Vlsi Design And Test written by Brajesh Kumar Kaushik and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-21 with Computers categories.
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Energy Efficient And Reliable Embedded Nanoscale Sram Design
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Author : Bhupendra Singh Reniwal
language : en
Publisher: CRC Press
Release Date : 2023-11-29
Energy Efficient And Reliable Embedded Nanoscale Sram Design written by Bhupendra Singh Reniwal and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-11-29 with Technology & Engineering categories.
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.