A Statistical Look At Device Reliability
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A Statistical Look At Device Reliability
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Author : Pasquale De Marco
language : en
Publisher: Pasquale De Marco
Release Date : 2025-07-12
A Statistical Look At Device Reliability written by Pasquale De Marco and has been published by Pasquale De Marco this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-12 with Technology & Engineering categories.
**A Statistical Look at Device Reliability** offers a comprehensive exploration of the statistical underpinnings of device reliability, providing a roadmap for engineers, researchers, and students to navigate the complexities of statistical modeling and credibility assessment. Delving into the fundamental concepts of statistical tools and techniques, the book provides a solid foundation for understanding the intricacies of reliability analysis. It examines various types of reliability models, guiding readers through the processes of model selection, parameter estimation, and validation. Moving beyond theoretical frameworks, the book delves into the practical applications of reliability modeling and analysis. It illustrates how these methods can be applied to optimize design, improve manufacturing processes, and ensure the long-term performance of devices and systems. Case studies drawn from diverse industries, including electronics, automotive, aerospace, and medical devices, offer valuable insights into the challenges and successes of implementing reliability engineering principles. Recognizing the rapidly evolving landscape of technology, the book also explores emerging trends and technologies that are shaping the future of reliability engineering. It examines the potential of artificial intelligence, machine learning, and the Internet of Things (IoT) to revolutionize the way we assess and manage device reliability. Written in an accessible and engaging style, **A Statistical Look at Device Reliability** is an essential resource for anyone seeking a deeper understanding of device reliability. Its comprehensive coverage, practical examples, and forward-looking perspective make it an indispensable guide for navigating the complexities of statistical modeling and credibility assessment in this critical field. If you like this book, write a review!
Reliable Machine Learning
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Author : Cathy Chen
language : en
Publisher: "O'Reilly Media, Inc."
Release Date : 2021-10-12
Reliable Machine Learning written by Cathy Chen and has been published by "O'Reilly Media, Inc." this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-10-12 with Computers categories.
Whether you're part of a small startup or a multinational corporation, this practical book shows data scientists, software and site reliability engineers, product managers, and business owners how to run and establish ML reliably, effectively, and accountably within your organization. You'll gain insight into everything from how to do model monitoring in production to how to run a well-tuned model development team in a product organization. By applying an SRE mindset to machine learning, authors and engineering professionals Cathy Chen, Kranti Parisa, Niall Richard Murphy, D. Sculley, Todd Underwood, and featured guest authors show you how to run an efficient and reliable ML system. Whether you want to increase revenue, optimize decision making, solve problems, or understand and influence customer behavior, you'll learn how to perform day-to-day ML tasks while keeping the bigger picture in mind. You'll examine: What ML is: how it functions and what it relies on Conceptual frameworks for understanding how ML "loops" work How effective productionization can make your ML systems easily monitorable, deployable, and operable Why ML systems make production troubleshooting more difficult, and how to compensate accordingly How ML, product, and production teams can communicate effectively
De Bow S Review And Industrial Resources Statistics Etc
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Author :
language : en
Publisher:
Release Date : 1857
De Bow S Review And Industrial Resources Statistics Etc written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1857 with Industries categories.
Reliability Prediction For Microelectronics
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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-13
Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-13 with Technology & Engineering categories.
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Statistical Modeling And Robust Inference For One Shot Devices
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Author : Narayanaswamy Balakrishnan
language : en
Publisher: Academic Press
Release Date : 2025-04-08
Statistical Modeling And Robust Inference For One Shot Devices written by Narayanaswamy Balakrishnan and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-04-08 with Computers categories.
The study of one-shot devices such as automobile airbags, fire extinguishers, or antigen tests, is rapidly becoming an important problem in the area of reliability engineering. These devices, which are destroyed or must be rebuilt after use, are a particular case of extreme censoring, which makes the problem of estimating their reliability and lifetime challenging. However, classical statistical and inferential methods do not consider the issue of robustness.Statistical Modeling and Robust Interference for One-shot Devices offers a comprehensive investigation of robust techniques of one-shot devices under accelerated-life tests. With numerous examples and case studies in which the proposed methods are applied, this book includes detailed R codes in selected chapters to help readers implement their own codes and use them in the proposed examples and in their own research on one-shot devicetesting data. Researchers, mathematicians, engineers, and students working on acceleratedlife testing data analysis and robust methodologies will find this to be a welcome resource. - Offers an indepth review of statistical methods for the testing and analysis of one-shot devices - Includes numerous examples and case studies in which the proposed methods are applied - Introduces detailed R codes in selected chapters to help readers implement their own codes, use them in the proposed examples and in their own research on one-shot device-testing data
Reliability And Statistics In Transportation And Communication
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Author : Igor Kabashkin
language : en
Publisher: Springer Nature
Release Date : 2021-02-06
Reliability And Statistics In Transportation And Communication written by Igor Kabashkin and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-06 with Technology & Engineering categories.
This book reports on cutting-edge theories and methods for analyzing complex systems, such as transportation and communication networks and discusses multi-disciplinary approaches to dependability problems encountered when dealing with complex systems in practice. The book presents the most noteworthy methods and results discussed at the International Conference on Reliability and Statistics in Transportation and Communication (RelStat), which took place remotely from Riga, Latvia, on October 14 – 17, 2020. It spans a broad spectrum of topics, from mathematical models and design methodologies, to software engineering, data security and financial issues, as well as practical problems in technical systems, such as transportation and telecommunications, and in engineering education.
Symposia
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Author : Defense Documentation Center (U.S.)
language : en
Publisher:
Release Date : 1963
Symposia written by Defense Documentation Center (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1963 with Congresses and conventions categories.
The Statistical Exorcist
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Author : Hollander
language : en
Publisher: CRC Press
Release Date : 1984-11-30
The Statistical Exorcist written by Hollander and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984-11-30 with Mathematics categories.
For most people, algebra is what makes statistics the devil's work- putting fear and loathing into what otherwise would be an exciting, profitable way to use data to make wise decisions. But all you need is The Statistical Exorcist, plus just enough arithmetic to add, subtract, multiply and divide. This book provides you with a clear, easily understandable and down-to-earth approaches to making decisions, sampling, learning with data and estimating probabilities; presented through the perspective of 26 vignettes written in everyday language.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1991
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Aeronautics categories.
Technical Abstract Bulletin
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Author :
language : en
Publisher:
Release Date :
Technical Abstract Bulletin written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with Science categories.