An Implementation Of 1 5 Bits Stage Low Power Successive Approximation Register Analog To Digital Converter By Using On Chip Calibration
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An Implementation Of 1 5 Bits Stage Low Power Successive Approximation Register Analog To Digital Converter By Using On Chip Calibration
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Author :
language : en
Publisher:
Release Date : 2015
An Implementation Of 1 5 Bits Stage Low Power Successive Approximation Register Analog To Digital Converter By Using On Chip Calibration written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with categories.
A Self Calibrating Low Power 16 Bit 500ksps Charge Redistribution Sar Analog To Digital Converter
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Author : Prasanna Upadhyaya
language : en
Publisher:
Release Date : 2008
A Self Calibrating Low Power 16 Bit 500ksps Charge Redistribution Sar Analog To Digital Converter written by Prasanna Upadhyaya and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Analog-to-digital converters categories.
Low Power High Resolution Analog To Digital Converters
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Author : Amir Zjajo
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-10-29
Low Power High Resolution Analog To Digital Converters written by Amir Zjajo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-10-29 with Technology & Engineering categories.
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
Low Power Successive Approximation Analog To Digital Converter With Digital Calibration
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Author : Wei Li
language : en
Publisher:
Release Date : 2014
Low Power Successive Approximation Analog To Digital Converter With Digital Calibration written by Wei Li and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014 with Successive approximation analog-to-digital converters categories.
IC designers are continuously facing the challenges from reduced CMOS feature sizes and supply voltages. ADCs that deliver satisfactory resolutions/speeds while utilizing the state-of-the-art technologies to save power are in high demand. The analog circuits are more and more assisted by various digital calibration techniques to get boosted performances. This dissertation is focused on a low-power 12-bit 12.5-MS/s successive approximation (SAR) ADC with a couple of calibration schemes. The performances of the proposed SAR ADC are enhanced in two directions. To reduce the power dissipation, a power saving strategy has been proposed. Also, several foreground calibration methods for SAR ADCs have been proposed to reduce power dissipation and enhance conversion accuracy. The design was fabricated in 40nm CMOS technology. Measurement results after calibration showed a SFDR of 82.2 dB, and a THD improvement of 22.5 dB. Finally, two new schemes to realize teraohm on-chip resistance are presented. One of the schemes utilizes a switched-capacitor array, and the other utilizes a switch-capacitor ladder. Using these schemes, large resistances can be fabricated with standard CMOS process in an affordable chip area.
Circuit Design For Realization Of A 16 Bit 1ms S Successive Approximation Register Analog To Digital Converter
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Author : Cody R. Brenneman
language : en
Publisher:
Release Date : 2010
Circuit Design For Realization Of A 16 Bit 1ms S Successive Approximation Register Analog To Digital Converter written by Cody R. Brenneman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
Abstract: As the use of digital systems continues to grow, there is an increasing need to convert analog information into the digital domain. Successive Approximation Register (SAR) analog-to-digital converters are used extensively in this regard due to their high resolution, small die area, and moderate conversion speeds. However, capacitor mismatch within the SAR converter is a limiting factor in its accuracy and resolution. Without some form of calibration, a SAR converter can only reasonably achieve an accuracy of 10 bits. The Split-ADC technique is a digital, deterministic, background self-calibration algorithm that can be applied to the SAR converter. This thesis describes the circuit design and physical implementation of a novel 16-bit 1MS/s SAR analog-to-digital converter for use with the Split-ADC calibration algorithm. The system was designed using the Jazz 0.18um CMOS process, successfully operates at 1MS/s, and consumes a die area of 1.2mm2. The calibration algorithm was applied, showing an improvement in the overall accuracy of the converter.
A 16 Bit 500ksps Low Power Successive Approximation Analog To Digital Converter
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Author : Kun Yang
language : en
Publisher:
Release Date : 2009
A 16 Bit 500ksps Low Power Successive Approximation Analog To Digital Converter written by Kun Yang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Analog-to-digital converters categories.
Self Calibration And Digital Trimming Of Successive Approximation Analog To Digital Converters
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Author : Shankar Thirunakkarasu
language : en
Publisher:
Release Date : 2014
Self Calibration And Digital Trimming Of Successive Approximation Analog To Digital Converters written by Shankar Thirunakkarasu and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014 with Successive approximation analog-to-digital converters categories.
Several state of the art, monitoring and control systems, such as DC motorcontrollers, power line monitoring and protection systems, instrumentation systems and battery monitors require direct digitization of a high voltage input signals. Analog-to-Digital Converters (ADCs) that can digitize high voltage signals require high linearity and low voltage coefficient capacitors. A built in self-calibration and digital-trim algorithm correcting static mismatches in Capacitive Digital-to-Analog Converter (CDAC) used in Successive Approximation Register Analog to Digital Converters (SARADCs) is proposed. The algorithm uses a dynamic error correction (DEC) capacitor to cancel the static errors occurring in each capacitor of the array as the first step upon power-up and eliminates the need for an extra calibration DAC. Self-trimming is performed digitally during normal ADC operation. The algorithm is implemented on a 14-bit high-voltage input range SAR ADC with integrated dynamic error correction capacitors. The IC is fabricated in 0.6-um high voltage compliant CMOS process, accepting up to 24Vpp differential input signal. The proposed approach achieves 73.32 dB Signal to Noise and Distortion Ratio (SNDR) which is an improvement of 12.03 dB after self-calibration at 400 kS/s sampling rate, consuming 90-mW from a +/-15V supply. The calibration circuitry occupies 28% of the capacitor DAC, and consumes less than 15mW during operation. Measurement results shows that this algorithm reduces INL from as high as 7 LSBs down to 1 LSB and it works even in the presence of larger mismatches exceeding 260 LSBs. Similarly, it reduces DNL errors from 10 LSBs down to 1 LSB. The ADC occupies an active area of 9.76 mm2.
Methodology For The Digital Calibration Of Analog Circuits And Systems
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Author : Marc Pastre
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-17
Methodology For The Digital Calibration Of Analog Circuits And Systems written by Marc Pastre and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-17 with Technology & Engineering categories.
Methodology for the Digital Calibration of Analog Circuits and Systems shows how to relax the extreme design constraints in analog circuits, allowing the realization of high-precision systems even with low-performance components. A complete methodology is proposed, and three applications are detailed. To start with, an in-depth analysis of existing compensation techniques for analog circuit imperfections is carried out. The M/2+M sub-binary digital-to-analog converter is thoroughly studied, and the use of this very low-area circuit in conjunction with a successive approximations algorithm for digital compensation is described. A complete methodology based on this compensation circuit and algorithm is then proposed. The detection and correction of analog circuit imperfections is studied, and a simulation tool allowing the transparent simulation of analog circuits with automatic compensation blocks is introduced. The first application shows how the sub-binary M/2+M structure can be employed as a conventional digital-to-analog converter if two calibration and radix conversion algorithms are implemented. The second application, a SOI 1T DRAM, is then presented. A digital algorithm chooses a suitable reference value that compensates several circuit imperfections together, from the sense amplifier offset to the dispersion of the memory read currents. The third application is the calibration of the sensitivity of a current measurement microsystem based on a Hall magnetic field sensor. Using a variant of the chopper modulation, the spinning current technique, combined with a second modulation of a reference signal, the sensitivity of the complete system is continuously measured without interrupting normal operation. A thermal drift lower than 50 ppm/°C is achieved, which is 6 to 10 times less than in state-of-the-art implementations. Furthermore, the calibration technique also compensates drifts due to mechanical stresses and ageing.
Analog And Mixed Signal Circuits In Nanoscale Cmos
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Author : Rui Paulo da Silva Martins
language : en
Publisher: Springer Nature
Release Date : 2023-01-05
Analog And Mixed Signal Circuits In Nanoscale Cmos written by Rui Paulo da Silva Martins and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-01-05 with Technology & Engineering categories.
This book provides readers with a single-source reference to the state-of-the-art in analog and mixed-signal circuit design in nanoscale CMOS. Renowned authors from academia describe creative circuit solutions and techniques, in state-of-the-art designs, enabling readers to deal with today’s technology demands for high integration levels with a strong miniaturization capability.
A Study Of Capacitor Array Calibration For A Successive Approximation Analog To Digital Converter
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Author : Ji Ma
language : en
Publisher:
Release Date : 2013
A Study Of Capacitor Array Calibration For A Successive Approximation Analog To Digital Converter written by Ji Ma and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Analog-to-digital converters (ADCs) are driven by rapid development of mobile communication systems to have higher speed, higher resolution and lower power consumption. Among multiple ADC architectures, successive approximation (SAR) ADCs attract great attention in mixed-signal design community recently. It is due to the fact that they do not contain amplification components and the digital logics are scaling friendly. Therefore, it is easier to design a SAR ADC with smaller component size in advanced technology than other ADC architectures, which decreases the power consumption and increases the speed of the circuit. However, capacitor mismatch limits the minimum size of unit capacitors which could be used for a SAR ADC with more than 10 bit resolution. Large capacitor both limits conversion speed and increases switching power. In this design project, a novel switching scheme and a novel calibration method are adopted to overcome the capacitor mismatch constraint. The switching scheme uses monotonic switching in a SAR ADC to gain one extra bit, and switches a dummy capacitor between the common mode voltage level (Vcm) and the ground (gnd) to obtain another extra bit. To keep the resolution constant, the capacitor number is reduced by two. The calibration method extracts missing code width to estimate the actual value of capacitors. The missing code extraction is accomplished by detecting metastable state of a comparator, forcing the current bit value and using less significant bits to measure the actual capacitor value. Dither method is adopted to improve calibration accuracy. Behavior model simulation is provided to verify the effectiveness of the calibration method. A circuit design of a 12 bit ADC and the simulation for schematic design is presented in this report.